{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T01:45:09Z","timestamp":1760233509587,"version":"build-2065373602"},"reference-count":52,"publisher":"MDPI AG","issue":"3","license":[{"start":{"date-parts":[[2021,1,26]],"date-time":"2021-01-26T00:00:00Z","timestamp":1611619200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100011033","name":"Agencia Estatal de Investigaci\u00f3n","doi-asserted-by":"publisher","award":["PID2019-103869RB-C33"],"award-info":[{"award-number":["PID2019-103869RB-C33"]}],"id":[{"id":"10.13039\/501100011033","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>A new sensor topology meant to extract figures of merit of radio-frequency analog integrated circuits (RF-ICs) was experimentally validated. Implemented in a standard 0.35 \u03bcm complementary metal-oxide-semiconductor (CMOS) technology, it comprised two blocks: a single metal-oxide-semiconductor (MOS) transistor acting as temperature transducer, which was placed near the circuit to monitor, and an active band-pass filter amplifier. For validation purposes, the temperature sensor was integrated with a tuned radio-frequency power amplifier (420 MHz) and MOS transistors acting as controllable dissipating devices. First, using the MOS dissipating devices, the performance and limitations of the different blocks that constitute the temperature sensor were characterized. Second, by using the heterodyne technique (applying two nearby tones) to the power amplifier (PA) and connecting the sensor output voltage to a low-cost AC voltmeter, the PA\u2019s output power and its central frequency were monitored. As a result, this topology resulted in a low-cost approach, with high linearity and sensitivity, for RF-IC testing and variability monitoring.<\/jats:p>","DOI":"10.3390\/s21030805","type":"journal-article","created":{"date-parts":[[2021,1,26]],"date-time":"2021-01-26T08:29:16Z","timestamp":1611649756000},"page":"805","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits"],"prefix":"10.3390","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6939-6475","authenticated-orcid":false,"given":"Josep","family":"Altet","sequence":"first","affiliation":[{"name":"Electronic Engineering Department, Universitat Polit\u00e8cnica de Catalunya\u2013BarcelonaTech, 08034 Barcelona, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2072-2268","authenticated-orcid":false,"given":"Enrique","family":"Barajas","sequence":"additional","affiliation":[{"name":"Electronic Engineering Department, Universitat Polit\u00e8cnica de Catalunya\u2013BarcelonaTech, 08034 Barcelona, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Diego","family":"Mateo","sequence":"additional","affiliation":[{"name":"Electronic Engineering Department, Universitat Polit\u00e8cnica de Catalunya\u2013BarcelonaTech, 08034 Barcelona, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexandre","family":"Billong","sequence":"additional","affiliation":[{"name":"Electronic Engineering Department, Universitat Polit\u00e8cnica de Catalunya\u2013BarcelonaTech, 08034 Barcelona, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1352-8675","authenticated-orcid":false,"given":"Xavier","family":"Aragones","sequence":"additional","affiliation":[{"name":"Electronic Engineering Department, Universitat Polit\u00e8cnica de Catalunya\u2013BarcelonaTech, 08034 Barcelona, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xavier","family":"Perpi\u00f1\u00e0","sequence":"additional","affiliation":[{"name":"Institute of Microelectronics of Barcelona (IMB-CNM)\u2014CSIC, 08193 Cerdanyola del Vall\u00e9s, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1653-0519","authenticated-orcid":false,"given":"Ferran","family":"Reverter","sequence":"additional","affiliation":[{"name":"Electronic Engineering Department, Universitat Polit\u00e8cnica de Catalunya\u2013BarcelonaTech, 08034 Barcelona, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,1,26]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"1519","DOI":"10.1109\/JPROC.2006.879793","article-title":"Dynamic surface temperature measurements in ICs","volume":"94","author":"Altet","year":"2006","journal-title":"Proc. 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