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The sensor is a cost-effective solution for punctual measurement of the surface reflection at different distances. To enhance the interference immunity, an algorithm based on a double-side digital baseline restorer is proposed and implemented to accurately detect the amplitude of the reflected light. As results show, the sensor is robust against ambient light and shows a strong sensitivity on a wide reflection range. The capability of the proposed sensor was evaluated experimentally for object detection and recognition, in addition to dedicated measurement systems, like remote encoders or keyphasors, realized far from the object to be measured.<\/jats:p>","DOI":"10.3390\/s21041301","type":"journal-article","created":{"date-parts":[[2021,2,12]],"date-time":"2021-02-12T18:45:00Z","timestamp":1613155500000},"page":"1301","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["Remote Reflectivity Sensor for Industrial Applications"],"prefix":"10.3390","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5639-3825","authenticated-orcid":false,"given":"Federico","family":"Cavedo","sequence":"first","affiliation":[{"name":"Department of Electronics, Information and Bioengineering Politecnico di Milano, 20133 Milan, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4101-4981","authenticated-orcid":false,"given":"Parisa","family":"Esmaili","sequence":"additional","affiliation":[{"name":"Department of Electronics, Information and Bioengineering Politecnico di Milano, 20133 Milan, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8571-1527","authenticated-orcid":false,"given":"Michele","family":"Norgia","sequence":"additional","affiliation":[{"name":"Department of Electronics, Information and Bioengineering Politecnico di Milano, 20133 Milan, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,2,11]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"270","DOI":"10.1016\/j.ijmachtools.2009.11.010","article-title":"Development of a multi-step measuring method for motion accuracy of NC machine tools based on cross grid encoder","volume":"50","author":"Du","year":"2010","journal-title":"Int. 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