{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,20]],"date-time":"2026-01-20T11:18:45Z","timestamp":1768907925050,"version":"3.49.0"},"reference-count":26,"publisher":"MDPI AG","issue":"4","license":[{"start":{"date-parts":[[2021,2,23]],"date-time":"2021-02-23T00:00:00Z","timestamp":1614038400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Chromium compensated GaAs or GaAs:Cr sensors provided by the Tomsk State University (Russia) were characterized using the low noise, charge integrating readout chip JUNGFRAU with a pixel pitch of 75 \u00d7 75 \u00b5m2 regarding its application as an X-ray detector at synchrotrons sources or FELs. Sensor properties such as dark current, resistivity, noise performance, spectral resolution capability and charge transport properties were measured and compared with results from a previous batch of GaAs:Cr sensors which were produced from wafers obtained from a different supplier. The properties of the sample from the later batch of sensors from 2017 show a resistivity of 1.69 \u00d7 109 \u03a9\/cm, which is 47% higher compared to the previous batch from 2016. Moreover, its noise performance is 14% lower with a value of (101.65 \u00b1 0.04) e\u2212 ENC and the resolution of a monochromatic 60 keV photo peak is significantly improved by 38% to a FWHM of 4.3%. Likely, this is due to improvements in charge collection, lower noise, and more homogeneous effective pixel size. In a previous work, a hole lifetime of 1.4 ns for GaAs:Cr sensors was determined for the sensors of the 2016 sensor batch, explaining the so-called \u201ccrater effect\u201d which describes the occurrence of negative signals in the pixels around a pixel with a photon hit due to the missing hole contribution to the overall signal causing an incomplete signal induction. In this publication, the \u201ccrater effect\u201d is further elaborated by measuring GaAs:Cr sensors using the sensors from 2017. The hole lifetime of these sensors was 2.5 ns. A focused photon beam was used to illuminate well defined positions along the pixels in order to corroborate the findings from the previous work and to further characterize the consequences of the \u201ccrater effect\u201d on the detector operation.<\/jats:p>","DOI":"10.3390\/s21041550","type":"journal-article","created":{"date-parts":[[2021,2,23]],"date-time":"2021-02-23T20:19:36Z","timestamp":1614111576000},"page":"1550","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":26,"title":["Characterization of Chromium Compensated GaAs Sensors with the Charge-Integrating JUNGFRAU Readout Chip by Means of a Highly Collimated Pencil Beam"],"prefix":"10.3390","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5723-1825","authenticated-orcid":false,"given":"Dominic","family":"Greiffenberg","sequence":"first","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Marie","family":"Andr\u00e4","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Rebecca","family":"Barten","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7817-6493","authenticated-orcid":false,"given":"Anna","family":"Bergamaschi","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Martin","family":"Br\u00fcckner","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Paolo","family":"Busca","sequence":"additional","affiliation":[{"name":"European Synchrotron Radiation Facility (ESRF), 71 Avenue des Martyrs, F-38043 Grenoble, France"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3867-0347","authenticated-orcid":false,"given":"Sabina","family":"Chiriotti","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Ivan","family":"Chsherbakov","sequence":"additional","affiliation":[{"name":"R&amp;D Center \u201cAdvanced Electronic Technologies\u201d, Tomsk State University (TSU), Lenin Ave 36, RUS-634050 Tomsk, Russia"}]},{"given":"Roberto","family":"Dinapoli","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5031-6941","authenticated-orcid":false,"given":"Pablo","family":"Fajardo","sequence":"additional","affiliation":[{"name":"European Synchrotron Radiation Facility (ESRF), 71 Avenue des Martyrs, F-38043 Grenoble, France"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3142-643X","authenticated-orcid":false,"given":"Erik","family":"Fr\u00f6jdh","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Shqipe","family":"Hasanaj","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Pawel","family":"Kozlowski","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Carlos","family":"Lopez Cuenca","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Anastassiya","family":"Lozinskaya","sequence":"additional","affiliation":[{"name":"R&amp;D Center \u201cAdvanced Electronic Technologies\u201d, Tomsk State University (TSU), Lenin Ave 36, RUS-634050 Tomsk, Russia"}]},{"given":"Markus","family":"Meyer","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Davide","family":"Mezza","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Aldo","family":"Mozzanica","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Sophie","family":"Redford","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Marie","family":"Ruat","sequence":"additional","affiliation":[{"name":"European Synchrotron Radiation Facility (ESRF), 71 Avenue des Martyrs, F-38043 Grenoble, France"}]},{"given":"Christian","family":"Ruder","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Bernd","family":"Schmitt","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"given":"Dhanya","family":"Thattil","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer Institut (PSI), Forschungsstrasse 111, CH-5232 Villigen PSI, Switzerland"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1364-844X","authenticated-orcid":false,"given":"Gemma","family":"Tinti","sequence":"additional","affiliation":[{"name":"PSD Detector Group, Paul Scherrer 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