{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,4]],"date-time":"2026-05-04T10:42:14Z","timestamp":1777891334094,"version":"3.51.4"},"reference-count":42,"publisher":"MDPI AG","issue":"5","license":[{"start":{"date-parts":[[2021,2,26]],"date-time":"2021-02-26T00:00:00Z","timestamp":1614297600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>This paper proposes a new Image-to-Image Translation (Pix2Pix) enabled deep learning method for traveling wave-based fault location. Unlike the previous methods that require a high sampling frequency of the PMU, the proposed method can translate the scale 1 detail component image provided by the low frequency PMU data to higher frequency ones via the Pix2Pix. This allows us to significantly improve the fault location accuracy. Test results via the YOLO v3 object recognition algorithm show that the images generated by pix2pix can be accurately identified. This enables to improve the estimation accuracy of the arrival time of the traveling wave head, leading to better fault location outcomes.<\/jats:p>","DOI":"10.3390\/s21051633","type":"journal-article","created":{"date-parts":[[2021,2,26]],"date-time":"2021-02-26T04:36:24Z","timestamp":1614314184000},"page":"1633","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["A Novel Pix2Pix Enabled Traveling Wave-Based Fault Location Method"],"prefix":"10.3390","volume":"21","author":[{"given":"Jinxian","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan 430072, Hubei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qingwu","family":"Gong","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan 430072, Hubei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haojie","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan 430072, Hubei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yubo","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan 430072, Hubei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yilin","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan 430072, Hubei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,2,26]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"23","DOI":"10.1109\/MPER.1983.5519136","article-title":"A New Measurement Technique for Tracking Voltage Phasors, Local System Frequency, and Rate of Change of Frequency","volume":"PER-3","author":"Phadke","year":"1983","journal-title":"IEEE Power Eng. 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