{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T21:38:46Z","timestamp":1761514726910,"version":"build-2065373602"},"reference-count":38,"publisher":"MDPI AG","issue":"5","license":[{"start":{"date-parts":[[2021,2,28]],"date-time":"2021-02-28T00:00:00Z","timestamp":1614470400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["11972235","11890683","11732009"],"award-info":[{"award-number":["11972235","11890683","11732009"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shenzhen Key Laboratory of Intelligent Optical Measurement and Detection","award":["ZDSYS20200107103001793"],"award-info":[{"award-number":["ZDSYS20200107103001793"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>In optical metrology, the output is usually in the form of a fringe pattern, from which a phase map can be generated and phase information can be converted into the desired parameters. This paper proposes an end-to-end method of fringe phase extraction based on the neural network. This method uses the U-net neural network to directly learn the correspondence between the gray level of a fringe pattern and the wrapped phase map, which is simpler than the exist deep learning methods. The results of simulation and experimental fringe patterns verify the accuracy and the robustness of this method. While it yields the same accuracy, the proposed method features easier operation and a simpler principle than the traditional phase-shifting method and has a faster speed than wavelet transform method.<\/jats:p>","DOI":"10.3390\/s21051664","type":"journal-article","created":{"date-parts":[[2021,2,28]],"date-time":"2021-02-28T20:43:32Z","timestamp":1614545012000},"page":"1664","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":12,"title":["A Fringe Phase Extraction Method Based on Neural Network"],"prefix":"10.3390","volume":"21","author":[{"given":"Wenxin","family":"Hu","sequence":"first","affiliation":[{"name":"Shenzhen Key Laboratory of Intelligent Optical Measurement and Detection, College of Physics and Optoelectronic Engineering, Shenzhen University, 3688 Nanhai Avenue, Shenzhen 518060, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hong","family":"Miao","sequence":"additional","affiliation":[{"name":"CAS Key Laboratory of Mechanical Behavior and Design of Materials, Department of Modern Mechanics, University of Science and Technology of China, Hefei 230027, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7766-5201","authenticated-orcid":false,"given":"Keyu","family":"Yan","sequence":"additional","affiliation":[{"name":"Shenzhen Key Laboratory of Intelligent Optical Measurement and Detection, College of Physics and Optoelectronic Engineering, Shenzhen University, 3688 Nanhai Avenue, Shenzhen 518060, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8022-9002","authenticated-orcid":false,"given":"Yu","family":"Fu","sequence":"additional","affiliation":[{"name":"Shenzhen Key Laboratory of Intelligent Optical Measurement and Detection, College of Physics and Optoelectronic Engineering, Shenzhen University, 3688 Nanhai Avenue, Shenzhen 518060, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,2,28]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"1065","DOI":"10.1117\/1.602151","article-title":"Color-encoded digital fringe projection technique for high-speed 3-D surface contouring","volume":"38","author":"Huang","year":"1999","journal-title":"Opt. 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