{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T19:56:18Z","timestamp":1772826978794,"version":"3.50.1"},"reference-count":35,"publisher":"MDPI AG","issue":"5","license":[{"start":{"date-parts":[[2021,3,2]],"date-time":"2021-03-02T00:00:00Z","timestamp":1614643200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>An EEPROM (electrically erasable programmable read-only memory) reprogrammable fuse for trimming a digital temperature sensor is designed in a 0.18-\u00b5m CMOS EEPROM. The fuse uses EEPROM memory cells, which allow multiple programming cycles by modifying the stored data on the digital trim codes applied to the thermal sensor. By reprogramming the fuse, the temperature sensor can be adjusted with an increased trim variation in order to achieve higher accuracy. Experimental results for the trimmed digital sensor showed a +1.5\/\u22121.0 \u2103 inaccuracy in the temperature range of \u221220 to 125 \u2103 for 25 trimmed DTS samples at 1.8 V by one-point calibration. Furthermore, an average mean of 0.40 \u2103 and a standard deviation of 0.70 \u2103 temperature error were obtained in the same temperature range for power supply voltages from 1.7 to 1.9 V. Thus, the digital sensor exhibits similar performances for the entire power supply range of 1.7 to 3.6 V.<\/jats:p>","DOI":"10.3390\/s21051700","type":"journal-article","created":{"date-parts":[[2021,3,2]],"date-time":"2021-03-02T04:42:46Z","timestamp":1614660166000},"page":"1700","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["A Digital Improvement\u2014Trimming a Digital Temperature Sensor with EEPROM Reprogrammable Fuses"],"prefix":"10.3390","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5907-0044","authenticated-orcid":false,"given":"Anca Mihaela","family":"Vasile (Dragan)","sequence":"first","affiliation":[{"name":"ON Semiconductor Romania, 020983 Bucharest, Romania"},{"name":"Faculty of Electronics, Politehnica University of Bucharest, Telecommunications and Information Technology, 999032 Bucharest, Romania"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alina","family":"Negut","sequence":"additional","affiliation":[{"name":"ON Semiconductor Romania, 020983 Bucharest, Romania"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adrian","family":"Tache","sequence":"additional","affiliation":[{"name":"ON Semiconductor Romania, 020983 Bucharest, Romania"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gheorghe","family":"Brezeanu","sequence":"additional","affiliation":[{"name":"Faculty of Electronics, Politehnica University of Bucharest, Telecommunications and Information Technology, 999032 Bucharest, Romania"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,3,2]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Dragan, A., Negut, A., Tache, A.M., and Brezeanu, G. (2020, January 7\u20139). A Reprogrammable Fuse with EEcells for trimming a Temperature Sensor. Proceedings of the 2020 International Semiconductor Conference (CAS), Sinaia, Romania.","DOI":"10.1109\/CAS50358.2020.9268008"},{"key":"ref_2","unstructured":"(2021, February 25). Datasheet of N34TS04 Circuit. Available online: https:\/\/www.onsemi.com\/pub\/Collateral\/N34TS04-D.PDF."},{"key":"ref_3","unstructured":"(2021, February 25). Datasheet of N34TS108 Circuit. Available online: https:\/\/www.onsemi.com\/pub\/Collateral\/N34TS108-D.PDF."},{"key":"ref_4","doi-asserted-by":"crossref","first-page":"781","DOI":"10.1109\/JSSC.2019.2952855","article-title":"A 1770-\u03bcm2 Leakage-Based Digital Temperature Sensor with Supply Sensitivity Suppression in 55-nm CMOS","volume":"55","author":"Tang","year":"2019","journal-title":"IEEE J. Solid-State Circuits"},{"key":"ref_5","first-page":"255","article-title":"A CMOS-Imager-Pixel-Based Temperature Sensor for Dark Current Compensation","volume":"67","author":"Xie","year":"2019","journal-title":"IEEE Trans. Circuits Syst. II Express Briefs"},{"key":"ref_6","doi-asserted-by":"crossref","first-page":"2398","DOI":"10.1109\/JSEN.2019.2954082","article-title":"A CMOS Image Sensor With Thermal Sensing Capability and Column Zoom ADCs","volume":"20","author":"Xie","year":"2019","journal-title":"IEEE Sens. J."},{"key":"ref_7","doi-asserted-by":"crossref","unstructured":"Ballo, A., Bruno, G., Grasso, A.D., and Vaiana, M. (2020, January 12\u201313). A Compact CMOS Temperature Sensor for On-Chip Thermal Monitoring. Proceedings of the 2020 International Conference on Electrical, Communication, and Computer Engineering (ICECCE), Istanbul, Turkey.","DOI":"10.1109\/ICECCE49384.2020.9179402"},{"key":"ref_8","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1109\/TIM.2020.2992839","article-title":"A Compact Temperature Sensor with a Resolution FoM of 1.82 pJ\u00b7K2","volume":"69","author":"Ballo","year":"2020","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"ref_9","first-page":"946","article-title":"CMOS Temperature Sensor with Programmable Temperature Range for Biomedical Applications","volume":"8","author":"Setiabudi","year":"2018","journal-title":"Int. J. Electr. Comput. Eng."},{"key":"ref_10","doi-asserted-by":"crossref","first-page":"369","DOI":"10.1109\/JSSC.2019.2953834","article-title":"A BJT-Based Temperature-to-Digital Converter With a \u00b10.25 \u00b0C 3\u03c3 -Inaccuracy From \u221240 \u00b0C to +180 \u00b0C Using Heater-Assisted Voltage Calibration","volume":"55","author":"Yousefzadeh","year":"2019","journal-title":"IEEE J. Solid-State Circuits"},{"key":"ref_11","doi-asserted-by":"crossref","first-page":"2079","DOI":"10.1109\/TVLSI.2020.3007587","article-title":"All-Digital CMOS Time-to-Digital Converter with Temperature-Measuring Capability","volume":"28","author":"Chen","year":"2020","journal-title":"IEEE Trans. Very Large Scale Integr. (VLSI) Syst."},{"key":"ref_12","doi-asserted-by":"crossref","unstructured":"Deotti, D., Ramirez, J.L., and Fruett, F. (2020, January 25\u201328). Design and Characterization of a Smart Temperature Sensor. Proceedings of the 2020 IEEE 11th Latin American Symposium on Circuits & Systems (LASCAS), San Jose, Costa Rica.","DOI":"10.1109\/LASCAS45839.2020.9068962"},{"key":"ref_13","doi-asserted-by":"crossref","first-page":"82","DOI":"10.1109\/LSSC.2020.3005784","article-title":"A 2.18-pJ\/conversion, 1656-\u03bcm\u00b2 Temperature Sensor With a 0.61-pJ\u00b7K\u00b2 FoM and 52-pW Stand-By Power","volume":"3","author":"Pelzers","year":"2020","journal-title":"IEEE Solid-State Circuits Lett."},{"key":"ref_14","doi-asserted-by":"crossref","first-page":"906","DOI":"10.1109\/JSSC.2017.2788878","article-title":"A 0.8-V Resistor-Based Temperature Sensor in 65-nm CMOS With Supply Sensitivity of 0.28 \u00b0C\/V","volume":"53","author":"Park","year":"2018","journal-title":"IEEE J. Solid-State Circuits"},{"key":"ref_15","doi-asserted-by":"crossref","first-page":"70","DOI":"10.1109\/LSSC.2018.2827883","article-title":"A 174 pW\u2013488.3 nW 1 S\/s\u2013100 kS\/s All-Dynamic Resistive Temperature Sensor With Speed\/Resolution\/Resistance Adaptability","volume":"1","author":"Xin","year":"2018","journal-title":"IEEE Solid-State Circuits Lett."},{"key":"ref_16","doi-asserted-by":"crossref","unstructured":"Lu, C.-Y., Ravikumar, S., Sali, A.D., Eberlein, M., and Lee, H.-J. (2018, January 11\u201315). An 8b subthreshold hybrid thermal sensor with \u00b11.07 \u00b0C inaccuracy and single-element remote-sensing technique in 22nm FinFET. Proceedings of the 2018 IEEE International Solid\u2014State Circuits Conference (ISSCC), San Francisco, CA, USA.","DOI":"10.1109\/ISSCC.2018.8310312"},{"key":"ref_17","doi-asserted-by":"crossref","first-page":"2565","DOI":"10.1109\/TIM.2015.2408804","article-title":"1.2 V\u20130.18-\u03bcm CMOS Temperature Sensors With Quasi-Digital Output for Portable Systems","volume":"64","author":"Azcona","year":"2015","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"ref_18","doi-asserted-by":"crossref","first-page":"799","DOI":"10.1109\/JSSC.2015.2396522","article-title":"Compact BJT-Based Thermal Sensor for Processor Applications in a 14 nm tri-Gate CMOS Process","volume":"50","author":"Oshita","year":"2015","journal-title":"IEEE J. Solid-State Circuits"},{"key":"ref_19","doi-asserted-by":"crossref","unstructured":"Xie, S., and Ng, W.T. (2014, January 28\u201331). Digital integrated temperature sensors for VLSI thermal management. Proceedings of the 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), Guilin, China.","DOI":"10.1109\/ICSICT.2014.7021346"},{"key":"ref_20","doi-asserted-by":"crossref","unstructured":"Lewis, G.D., Merken, P., and Vandewal, M. (2018). Enhanced Accuracy of CMOS Smart Temperature Sensors by Nonlinear Curvature Correction. Sensors, 18.","DOI":"10.3390\/s18124087"},{"key":"ref_21","doi-asserted-by":"crossref","first-page":"613","DOI":"10.1109\/JSSC.2019.2891718","article-title":"An 11-nW CMOS Temperature-to-Digital Converter Utilizing Sub-Threshold Current at Sub-Thermal Drain Voltage","volume":"54","author":"Someya","year":"2019","journal-title":"IEEE J. Solid-State Circuits"},{"key":"ref_22","doi-asserted-by":"crossref","unstructured":"Yousefzadeh, B., and Makinwa, K.A.A. (2017, January 5\u20139). 9.3 A BJT-based temperature sensor with a packaging-robust inaccuracy of \u00b10.3 \u00b0C (3\u03c3) from \u221255 \u00b0C to +125 \u00b0C after heater-assisted voltage calibration. Proceedings of the 2017 IEEE International Solid-State Circuits Conference (ISSCC), San Francisco, CA, USA.","DOI":"10.1109\/ISSCC.2017.7870311"},{"key":"ref_23","first-page":"136","article-title":"A CMOS Smart Temperature Sensor With Single-Point Calibration Method for Clinical Use","volume":"63","author":"Deng","year":"2015","journal-title":"IEEE Trans. Circuits Syst. II Express Briefs"},{"key":"ref_24","doi-asserted-by":"crossref","first-page":"1682","DOI":"10.1109\/JSSC.2014.2325574","article-title":"A Fully-Integrated 71 nW CMOS Temperature Sensor for Low Power Wireless Sensor Nodes","volume":"49","author":"Jeong","year":"2014","journal-title":"IEEE J. Solid-State Circuits"},{"key":"ref_25","doi-asserted-by":"crossref","unstructured":"Lee, Y., Choi, W., Kim, T., Song, S., Makinwa, K.A.A., and Chae, Y. (2019, January 23\u201326). A 5800-\u03bcm2 Resistor-Based Temperature Sensor with a One-Point Trimmed Inaccuracy of \u00b11.2 \u00b0C (3\u03c3) From \u221250 \u00b0C to 105 \u00b0C in 65-nm CMOS. Proceedings of the ESSCIRC 2019\u2014IEEE 45th European Solid State Circuits Conference (ESSCIRC), Cracow, Poland.","DOI":"10.1109\/ESSCIRC.2019.8902650"},{"key":"ref_26","doi-asserted-by":"crossref","unstructured":"Meijer, G., Pertijs, M., and Makinwa, K. (2014). 2\u2014Calibration and Self-Calibration of Smart Sensors. Smart Sensor Systems: Emerging Technologies and Applications, John Wiley & Sons, Ltd.","DOI":"10.1002\/9781118701508"},{"key":"ref_27","doi-asserted-by":"crossref","unstructured":"Meijer, G.C., Wang, G., and Heidary, A. (2018). Smart Temperature Sensors and Temperature Sensor Systems, Elsevier BV.","DOI":"10.1016\/B978-0-08-102055-5.00003-6"},{"key":"ref_28","doi-asserted-by":"crossref","unstructured":"Sabate, A.C., Nordin, N., and Jimenez, B. (2016, January 18\u201321). Fuse trim links physical analysis methodology. Proceedings of the 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore.","DOI":"10.1109\/IPFA.2016.7564256"},{"key":"ref_29","doi-asserted-by":"crossref","first-page":"Q109","DOI":"10.1149\/2.0131806jss","article-title":"Communication\u2014Diffusion Break-Assisted Programming Mode for Active Electrically Programmable Fuse","volume":"7","author":"Wong","year":"2018","journal-title":"ECS J. Solid State Sci. Technol."},{"key":"ref_30","doi-asserted-by":"crossref","first-page":"147","DOI":"10.1016\/j.ssel.2020.01.003","article-title":"An improved digital output buffer for a digital temperature sensor with an I2C high speed interface","volume":"1","author":"Dragan","year":"2019","journal-title":"Solid State Electron. Lett."},{"key":"ref_31","doi-asserted-by":"crossref","unstructured":"Chen, Y., Tan, X., Yu, B., Li, C., and Guo, Y. (2017, January 25\u201328). A new all-in-one bandgap reference and robust zero temperature coefficient (TC) point current reference circuit. Proceedings of the 2017 IEEE 12th International Conference on ASIC (ASICON), Guiyang, China.","DOI":"10.1109\/ASICON.2017.8252532"},{"key":"ref_32","doi-asserted-by":"crossref","unstructured":"Ramirez, J.L., Tiol, J.P., Deotti, D., and Fruett, F. (2019, January 24\u201327). Delta-Sigma modulated output temperature sensor for 1V voltage supply. Proceedings of the 2019 IEEE 10th Latin American Symposium on Circuits & Systems (LASCAS), Armenia, Colombia.","DOI":"10.1109\/LASCAS.2019.8667536"},{"key":"ref_33","doi-asserted-by":"crossref","unstructured":"Mankani, S.K., Sajjanar, S., and Aradhya, H.R. (2016, January 4\u20136). Power and area optimization of decimation filter for application in Sigma Delta ADC. Proceedings of the 2016 International Conference on Circuits, Controls, Communications and Computing (I4C), Bangalore, India.","DOI":"10.1109\/CIMCA.2016.8053268"},{"key":"ref_34","doi-asserted-by":"crossref","unstructured":"Caldwell, T., and Shibata, H. (2017, January 6\u20139). High-speed oversampled continuous-time analog-to-digital converters. Proceedings of the 2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS), Boston, MA, USA.","DOI":"10.1109\/MWSCAS.2017.8053095"},{"key":"ref_35","unstructured":"(2021, February 25). Datasheet of Fluke7103 Calibrator. Available online: https:\/\/instrumentation.com\/PDFs\/fluke%207103%20user%20guide.pdf."}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/21\/5\/1700\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T05:31:12Z","timestamp":1760160672000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/21\/5\/1700"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,3,2]]},"references-count":35,"journal-issue":{"issue":"5","published-online":{"date-parts":[[2021,3]]}},"alternative-id":["s21051700"],"URL":"https:\/\/doi.org\/10.3390\/s21051700","relation":{},"ISSN":["1424-8220"],"issn-type":[{"value":"1424-8220","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,3,2]]}}}