{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T01:54:24Z","timestamp":1760234064279,"version":"build-2065373602"},"reference-count":68,"publisher":"MDPI AG","issue":"6","license":[{"start":{"date-parts":[[2021,3,20]],"date-time":"2021-03-20T00:00:00Z","timestamp":1616198400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003032","name":"Association Nationale de la Recherche et de la Technologie","doi-asserted-by":"publisher","award":["2017\/0167"],"award-info":[{"award-number":["2017\/0167"]}],"id":[{"id":"10.13039\/501100003032","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>In this paper, we present an infrared microscopy based approach for structures\u2019 location in integrated circuits, to automate their secure characterization. The use of an infrared sensor is the key device for internal integrated circuit inspection. Two main issues are addressed. The first concerns the scan of integrated circuits using a motorized optical system composed of an infrared uncooled camera combined with an optical microscope. An automated system is required to focus the conductive tracks under the silicon layer. It is solved by an autofocus system analyzing the infrared images through a discrete polynomial image transform which allows an accurate features detection to build a focus metric robust against specific image degradation inherent to the acquisition context. The second issue concerns the location of structures to be characterized on the conductive tracks. Dealing with a large amount of redundancy and noise, a graph-matching method is presented\u2014discriminating graph labels are developed to overcome the redundancy, while a flexible assignment optimizer solves the inexact matching arising from noises on graphs. The resulting automated location system brings reproducibility for secure characterization of integrated systems, besides accuracy and time speed increase.<\/jats:p>","DOI":"10.3390\/s21062175","type":"journal-article","created":{"date-parts":[[2021,3,21]],"date-time":"2021-03-21T23:47:41Z","timestamp":1616370461000},"page":"2175","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Spatial Location in Integrated Circuits through Infrared Microscopy"],"prefix":"10.3390","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3941-2638","authenticated-orcid":false,"given":"Rapha\u00ebl","family":"Abel\u00e9","sequence":"first","affiliation":[{"name":"Laboratoire d\u2019Informatique et Systemes, Aix-Marseille University, 163 Avenue de Luminy, 13288 CEDEX 09 Marseille, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1875-7111","authenticated-orcid":false,"given":"Jean-Luc","family":"Damoiseaux","sequence":"additional","affiliation":[{"name":"Laboratoire d\u2019Informatique et Systemes, Aix-Marseille University, 163 Avenue de Luminy, 13288 CEDEX 09 Marseille, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3985-8613","authenticated-orcid":false,"given":"Redouane El","family":"Moubtahij","sequence":"additional","affiliation":[{"name":"Laboratoire d\u2019Informatique et Systemes, Aix-Marseille University, 163 Avenue de Luminy, 13288 CEDEX 09 Marseille, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jean-Marc","family":"Boi","sequence":"additional","affiliation":[{"name":"Laboratoire d\u2019Informatique et Systemes, Aix-Marseille University, 163 Avenue de Luminy, 13288 CEDEX 09 Marseille, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniele","family":"Fronte","sequence":"additional","affiliation":[{"name":"STMicroelectronics, 190 Avenue Coq, 13106 Rousset, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pierre-Yvan","family":"Liardet","sequence":"additional","affiliation":[{"name":"eShard, B\u00e2timent GIENAH, 11 Avenue de Canteranne, 33600 Pessace, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9233-0020","authenticated-orcid":false,"given":"Djamal","family":"Merad","sequence":"additional","affiliation":[{"name":"Laboratoire d\u2019Informatique et Systemes, Aix-Marseille University, 163 Avenue de Luminy, 13288 CEDEX 09 Marseille, France"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,3,20]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Rahaman, H., and Champion, E. 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