{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,3]],"date-time":"2026-03-03T23:36:31Z","timestamp":1772580991833,"version":"3.50.1"},"reference-count":33,"publisher":"MDPI AG","issue":"8","license":[{"start":{"date-parts":[[2021,4,12]],"date-time":"2021-04-12T00:00:00Z","timestamp":1618185600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>This work illustrates the analysis of Film Bulk Acoustic Resonators (FBAR) using 3D Finite Element (FEM) simulations with the software OnScale in order to predict and improve resonator performance and quality before manufacturing. This kind of analysis minimizes manufacturing cycles by reducing design time with 3D simulations running on High-Performance Computing (HPC) cloud services. It also enables the identification of manufacturing effects on device performance. The simulation results are compared and validated with a manufactured FBAR device, previously reported, to further highlight the usefulness and advantages of the 3D simulations-based design process. In the 3D simulation results, some analysis challenges, like boundary condition definitions, mesh tuning, loss source tracing, and device quality estimations, were studied. Hence, it is possible to highlight that modern FEM solvers, like OnScale enable unprecedented FBAR analysis and design optimization.<\/jats:p>","DOI":"10.3390\/s21082715","type":"journal-article","created":{"date-parts":[[2021,4,12]],"date-time":"2021-04-12T11:05:06Z","timestamp":1618225506000},"page":"2715","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["3D Simulation-Based Acoustic Wave Resonator Analysis and Validation Using Novel Finite Element Method Software"],"prefix":"10.3390","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4412-6831","authenticated-orcid":false,"given":"Ruth Yadira","family":"Vidana Morales","sequence":"first","affiliation":[{"name":"CINVESTAV-IPN Unidad Guadalajara, Av. del Bosque 1145, El Baj\u00edo, Zapopan 45017, Mexico"},{"name":"Intel Corporation, Av. del Bosque 1001, El Baj\u00edo, Zapopan 45017, Mexico"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6646-1529","authenticated-orcid":false,"given":"Susana","family":"Ortega Cisneros","sequence":"additional","affiliation":[{"name":"CINVESTAV-IPN Unidad Guadalajara, Av. del Bosque 1145, El Baj\u00edo, Zapopan 45017, Mexico"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0061-8858","authenticated-orcid":false,"given":"Jose Rodrigo","family":"Camacho Perez","sequence":"additional","affiliation":[{"name":"Intel Corporation, Av. del Bosque 1001, El Baj\u00edo, Zapopan 45017, Mexico"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3073-2870","authenticated-orcid":false,"given":"Federico","family":"Sandoval Ibarra","sequence":"additional","affiliation":[{"name":"CINVESTAV-IPN Unidad Guadalajara, Av. del Bosque 1145, El Baj\u00edo, Zapopan 45017, Mexico"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0327-8046","authenticated-orcid":false,"given":"Ricardo","family":"Casas Carrillo","sequence":"additional","affiliation":[{"name":"Intel Corporation, Av. del Bosque 1001, El Baj\u00edo, Zapopan 45017, Mexico"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,4,12]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"46","DOI":"10.1109\/MMM.2015.2429513","article-title":"A Snapshot in Time: The Future in Filters for Cell Phones","volume":"16","author":"Ruby","year":"2015","journal-title":"IEEE Microw. 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