{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,23]],"date-time":"2025-10-23T21:05:47Z","timestamp":1761253547705,"version":"build-2065373602"},"reference-count":18,"publisher":"MDPI AG","issue":"9","license":[{"start":{"date-parts":[[2021,4,28]],"date-time":"2021-04-28T00:00:00Z","timestamp":1619568000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>To reduce the electromagnetic wave interference caused by cavity resonance or electromagnetic wave leakage, herein, an optical transparent radar absorbing structure (RAS) was designed using transparent conductive oxides (TCOs) with a high optical transmittance and electrical conductivity, and a procedure was proposed for detecting possible defects in the fabrication and operation and for assessing the influence of the defects on the electromagnetic performance. To detect locally occurring defects in planar and three-dimensional absorbing structures, a measurement system based on an open-ended near-field antenna capable of producing small beam spots at a close distance was constructed. Moreover, the reflection characteristics of the transparent RAS were derived from a simplified multiple reflection equation, and the derived results were compared with the analysis results of an equivalent circuit model to predict the surface resistance of the TCO coating layer, based on which the presence of defects could be confirmed. By using the experimental results, the predicted surface resistance results of the coating layer and the results measured using a non-contact sheet resistance meter were compared and were found to correspond, thereby confirming the effectiveness of the proposed defect detection method.<\/jats:p>","DOI":"10.3390\/s21093076","type":"journal-article","created":{"date-parts":[[2021,4,28]],"date-time":"2021-04-28T22:29:07Z","timestamp":1619648947000},"page":"3076","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["Design of an Optical Transparent Absorber and Defect Diagnostics Analysis Based on Near-Field Measurement"],"prefix":"10.3390","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3974-4766","authenticated-orcid":false,"given":"In-Gon","family":"Lee","sequence":"first","affiliation":[{"name":"Information and Communication Engineering Department, Kongju National University, Cheonan 31080, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Young-Joon","family":"Yoon","sequence":"additional","affiliation":[{"name":"Korea Institute of Ceramic Engineering &amp; Technology, Jinju 52851, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9066-5134","authenticated-orcid":false,"given":"Kwang-Sik","family":"Choi","sequence":"additional","affiliation":[{"name":"Korea Aerospace Industries, Sacheon 52529, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1875-5420","authenticated-orcid":false,"given":"Ic-Pyo","family":"Hong","sequence":"additional","affiliation":[{"name":"Information and Communication Engineering Department, Kongju National University, Cheonan 31080, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,4,28]]},"reference":[{"key":"ref_1","unstructured":"Saville, P. 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