{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,21]],"date-time":"2026-05-21T15:05:34Z","timestamp":1779375934940,"version":"3.53.1"},"reference-count":46,"publisher":"MDPI AG","issue":"12","license":[{"start":{"date-parts":[[2021,6,10]],"date-time":"2021-06-10T00:00:00Z","timestamp":1623283200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>The number of components of a thermographic temperature measurement uncertainty budget and their ultimate contribution depend on the conditions in which the measurement is performed. The acquired data determine the accuracy with which the uncertainty component is estimated. Unfortunately, when some factors have to be taken into account, it is difficult to determine the value of the uncertainty component caused by the occurrence of this factor. In the case of a thermographic temperature measurement, such a factor is the lack of sharpness of the registered thermogram. This problem intensifies when an additional macro lens must be used. Therefore, it is decided to commence research to prepare an uncertainty budget of thermographic measurement with an additional macro lens based on the B method described in EA-4\/02 (European Accreditation publications). As a result, the contribution of factors in the uncertainty budget of thermographic measurement with additional macro lens and the value of expanded uncertainty were obtained.<\/jats:p>","DOI":"10.3390\/s21124013","type":"journal-article","created":{"date-parts":[[2021,6,10]],"date-time":"2021-06-10T21:34:38Z","timestamp":1623360878000},"page":"4013","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":11,"title":["Lack of Thermogram Sharpness as Component of Thermographic Temperature Measurement Uncertainty Budget"],"prefix":"10.3390","volume":"21","author":[{"given":"Krzysztof","family":"Dziarski","sequence":"first","affiliation":[{"name":"Institute of Electric Power Engineering, Poznan University of Technology, Piotrowo 3A, 60-965 Poznan, Poland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9342-7430","authenticated-orcid":false,"given":"Arkadiusz","family":"Hulewicz","sequence":"additional","affiliation":[{"name":"Institute of Electrical Engineering and Industry Electronics, Poznan University of Technology, Piotrowo 3A, 60-965 Poznan, Poland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3021-6024","authenticated-orcid":false,"given":"Grzegorz","family":"Dombek","sequence":"additional","affiliation":[{"name":"Institute of Electric Power Engineering, Poznan University of Technology, Piotrowo 3A, 60-965 Poznan, Poland"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2021,6,10]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Minkina, W., and Klecha, D. 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