{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,28]],"date-time":"2025-11-28T12:30:43Z","timestamp":1764333043915,"version":"build-2065373602"},"reference-count":18,"publisher":"MDPI AG","issue":"14","license":[{"start":{"date-parts":[[2021,7,13]],"date-time":"2021-07-13T00:00:00Z","timestamp":1626134400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["NRF-2020M3F3A2A01081777"],"award-info":[{"award-number":["NRF-2020M3F3A2A01081777"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>For a reliable and stable sensor system, it is essential to precisely measure various sensor signals, such as electromagnetic field, pressure, and temperature. The measured analog signal is converted into digital bits through the sensor readout system. However, in extreme radiation environments, such as in space, during flights, and in nuclear fusion reactors, the performance of the analog-to-digital converter (ADC) constituting the sensor readout system can be degraded due to soft errors caused by radiation effects, leading to system malfunction. This paper proposes a soft-error-tolerant successive-approximation-register (SAR) ADC using dual-capacitor sample-and-hold (S\/H) control, which has robust characteristics against total ionizing dose (TID) and single event effects (SEE). The proposed ADC was fabricated using 65-nm CMOS process, and its soft-error-tolerant performance was measured in radiation environments. Additionally, the proposed circuit techniques were verified by utilizing a radiation simulator CAD tool.<\/jats:p>","DOI":"10.3390\/s21144768","type":"journal-article","created":{"date-parts":[[2021,7,13]],"date-time":"2021-07-13T04:26:06Z","timestamp":1626150366000},"page":"4768","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":8,"title":["A Soft-Error-Tolerant SAR ADC with Dual-Capacitor Sample-and-Hold Control for Sensor Systems"],"prefix":"10.3390","volume":"21","author":[{"given":"Duckhoon","family":"Ro","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Korea University, Seoul 02841, Korea"},{"name":"Foundry Business, Samsung Electronics, Hwaseong 18448, Korea"}]},{"given":"Minseong","family":"Um","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea University, Seoul 02841, Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1191-3553","authenticated-orcid":false,"given":"Hyung-Min","family":"Lee","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea University, Seoul 02841, Korea"}]}],"member":"1968","published-online":{"date-parts":[[2021,7,13]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"2314","DOI":"10.1016\/j.fusengdes.2014.03.066","article-title":"Design of a MGy radiation tolerant resolver-to-digital convertor IC for remotely operated maintenance in harsh environments","volume":"89","author":"Leroux","year":"2014","journal-title":"Fusion Eng. Des."},{"key":"ref_2","doi-asserted-by":"crossref","unstructured":"Aal, A., and Polte, T. (2012, January 14\u201318). On component reliability and system reliability for automotive applications. Proceedings of the IEEE International Integrated Reliability, South Lake Tahoe, CA, USA.","DOI":"10.1109\/IIRW.2012.6468947"},{"key":"ref_3","unstructured":"Chatterjee, A., Verma, A., Bhuva, B., Jansen, E.D., and Lin, W.C. (May, January 30). Accelerated stressing and degradation mechanisms for Si-based photo-emitters. Proceedings of the IEEE International Reliability Physics Symposium, Orlando, FL, USA."},{"key":"ref_4","doi-asserted-by":"crossref","first-page":"3103","DOI":"10.1109\/TNS.2006.885952","article-title":"Total-ionizing-dose effects in modern CMOS technologies","volume":"53","author":"Barnaby","year":"2006","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_5","doi-asserted-by":"crossref","first-page":"594","DOI":"10.1109\/23.490903","article-title":"Single-event effects in analog and mixed-signal integrated circuits","volume":"43","author":"Turflinger","year":"1996","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_6","first-page":"3101","article-title":"Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology","volume":"57","author":"Virmontois","year":"2010","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_7","doi-asserted-by":"crossref","first-page":"541","DOI":"10.1109\/LED.2021.3059781","article-title":"All-silicon microdisplay using efficient hot-carrier electroluminescence in standard 0.18\u03bcm CMOS technology","volume":"42","author":"Wu","year":"2021","journal-title":"IEEE Electron. Device Lett."},{"key":"ref_8","doi-asserted-by":"crossref","unstructured":"Ro, D., Min, C., Kang, M., Chang, I.J., and Lee, H.-M. (2020). A Radiation-Hardened SAR ADC with Delay-Based Dual Feedback Flip-Flops for Sensor Readout Systems. Sensors, 20.","DOI":"10.3390\/s20010171"},{"key":"ref_9","doi-asserted-by":"crossref","unstructured":"Gatti, U., Calligaro, C., Pikhay, E., and Roizin, Y. (2014, January 7\u221210). Radiation-hardened techniques for CMOS flash ADC. Proceedings of the IEEE International Conference on Electronics Circuits and Systems (ICECS), Marseille, France.","DOI":"10.1109\/ICECS.2014.7049906"},{"key":"ref_10","doi-asserted-by":"crossref","first-page":"3532","DOI":"10.1109\/TNS.2006.886204","article-title":"Single-Event Sensitivity and Hardening of a Pipelined Analog-to-Digital Converter","volume":"53","author":"Sternberg","year":"2006","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_11","doi-asserted-by":"crossref","first-page":"1942","DOI":"10.1016\/j.fusengdes.2013.02.116","article-title":"17 bit 4.35 mW 1 kHz delta sigma ADC and 256-to-1 multiplexer for remote handling instrumentation equipment","volume":"88","author":"Verbeeck","year":"2013","journal-title":"J. Fusion Energy"},{"key":"ref_12","doi-asserted-by":"crossref","unstructured":"Baker, R.J. (2010). CMOS Circuit Design, Layout, and Simulation, Wiley. [3rd ed.].","DOI":"10.1002\/9780470891179"},{"key":"ref_13","doi-asserted-by":"crossref","first-page":"1850202","DOI":"10.1142\/S021812661850202X","article-title":"A system-level correction SAR ADC with noise-tolerant technique","volume":"27","author":"Xu","year":"2018","journal-title":"J. Circuits, Syst. Comput."},{"key":"ref_14","doi-asserted-by":"crossref","first-page":"583","DOI":"10.1109\/TNS.2003.813129","article-title":"Basic mechanisms and modeling of single-event upset in digital microelectronics","volume":"50","author":"Dodd","year":"2003","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_15","doi-asserted-by":"crossref","unstructured":"Jeong, K., Ro, D., Lee, G., Kang, M., and Lee, H.-M. (2018). A Radiation-Hardened Instrumentation Amplifier for Sensor Readout Integrated Circuits in Nuclear Fusion Applications. Electronics, 7.","DOI":"10.3390\/electronics7120429"},{"key":"ref_16","doi-asserted-by":"crossref","unstructured":"Messenger, G., and Milton, M. (1997). Single Event Phenomena. Single Event Phenomena, Springer.","DOI":"10.1007\/978-1-4615-6043-2"},{"key":"ref_17","doi-asserted-by":"crossref","first-page":"2489","DOI":"10.1109\/TNS.2017.2728180","article-title":"We-Quatro: Radiaiton-hardened SRAM cell with parametric process variation tolerance","volume":"64","author":"Dang","year":"2017","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_18","doi-asserted-by":"crossref","first-page":"419","DOI":"10.3390\/electronics3030419","article-title":"Multicarrier Spread Spectrum Modulation Schemes and Efficient FFT Algorithms for Cognitive Radio Systems","volume":"3","author":"Sundararajan","year":"2014","journal-title":"Electronics"}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/21\/14\/4768\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T06:29:40Z","timestamp":1760164180000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/21\/14\/4768"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,7,13]]},"references-count":18,"journal-issue":{"issue":"14","published-online":{"date-parts":[[2021,7]]}},"alternative-id":["s21144768"],"URL":"https:\/\/doi.org\/10.3390\/s21144768","relation":{},"ISSN":["1424-8220"],"issn-type":[{"type":"electronic","value":"1424-8220"}],"subject":[],"published":{"date-parts":[[2021,7,13]]}}}