{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T20:12:45Z","timestamp":1772050365377,"version":"3.50.1"},"reference-count":27,"publisher":"MDPI AG","issue":"16","license":[{"start":{"date-parts":[[2021,8,20]],"date-time":"2021-08-20T00:00:00Z","timestamp":1629417600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>High temperature reverse-bias (HTRB), High temperature gate-bias (HTGB) tests and electrical DC characterization were performed on planar-SiC power MOSFETs which survived to accelerated neutron irradiation tests carried out at ChipIr-ISIS (Didcot, UK) facility, with terrestrial neutrons. The neutron test campaigns on the SiC power MOSFETs (manufactered by ST) were conducted on the same wafer lot devices by STMicroelectronics and Airbus, with different neutron tester systems. HTGB and HTRB tests, which characterise gate-oxide integrity and junction robustness, show no difference between the non irradiated devices and those which survived to the neutron irradiation tests, with neutron fluence up to 2\u00d7 1011 (n\/cm2). Electrical characterization performed pre and post-irradiation on different part number of power devices (Si, SiC MOSFETs and IGBTs) which survived to neutron irradiation tests does not show alteration of the data-sheet electrical parameters due to neutron interaction with the device.<\/jats:p>","DOI":"10.3390\/s21165627","type":"journal-article","created":{"date-parts":[[2021,8,22]],"date-time":"2021-08-22T22:59:27Z","timestamp":1629673167000},"page":"5627","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":11,"title":["Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests"],"prefix":"10.3390","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2787-0877","authenticated-orcid":false,"given":"Fabio","family":"Principato","sequence":"first","affiliation":[{"name":"Department of Physics and Chemistry\u2014Emilio Segr\u00e8 (DiFC), Palermo University, Viale Delle Scienze, Ed. 18, 90128 Palermo, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Giuseppe","family":"Allegra","sequence":"additional","affiliation":[{"name":"STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Corrado","family":"Cappello","sequence":"additional","affiliation":[{"name":"STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Olivier","family":"Crepel","sequence":"additional","affiliation":[{"name":"Central Airbus R&T, LDC Airbus SAS, Oliver Crepel E177, 14 rue Gabriel Clerc, CEDEX, 31707 Blagnac, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nicola","family":"Nicosia","sequence":"additional","affiliation":[{"name":"STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Salvatore","family":"D\u2032Arrigo","sequence":"additional","affiliation":[{"name":"STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vincenzo","family":"Cantarella","sequence":"additional","affiliation":[{"name":"STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alessandro","family":"Di Mauro","sequence":"additional","affiliation":[{"name":"STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Leonardo","family":"Abbene","sequence":"additional","affiliation":[{"name":"Department of Physics and Chemistry\u2014Emilio Segr\u00e8 (DiFC), Palermo University, Viale Delle Scienze, Ed. 18, 90128 Palermo, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marcello","family":"Mirabello","sequence":"additional","affiliation":[{"name":"Department of Physics and Chemistry\u2014Emilio Segr\u00e8 (DiFC), Palermo University, Viale Delle Scienze, Ed. 18, 90128 Palermo, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Francesco","family":"Pintacuda","sequence":"additional","affiliation":[{"name":"STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,8,20]]},"reference":[{"key":"ref_1","unstructured":"Davidson, C., Blackmore, E., and Hess, J. 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