{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,19]],"date-time":"2026-02-19T02:20:18Z","timestamp":1771467618496,"version":"3.50.1"},"reference-count":55,"publisher":"MDPI AG","issue":"17","license":[{"start":{"date-parts":[[2021,8,30]],"date-time":"2021-08-30T00:00:00Z","timestamp":1630281600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>The rapid growth in the industrial sector has required the development of more productive and reliable machinery, and therefore, leads to complex systems. In this regard, the automatic detection of unknown events in machinery represents a greater challenge, since uncharacterized catastrophic faults can occur. However, the existing methods for anomaly detection present limitations when dealing with highly complex industrial systems. For that purpose, a novel fault diagnosis methodology is developed to face the anomaly detection. An unsupervised anomaly detection framework named deep-autoencoder-compact-clustering one-class support-vector machine (DAECC-OC-SVM) is presented, which aims to incorporate the advantages of automatically learnt representation by deep neural network to improved anomaly detection performance. The method combines the training of a deep-autoencoder with clustering compact model and a one-class support-vector-machine function-based outlier detection method. The addressed methodology is applied on a public rolling bearing faults experimental test bench and on multi-fault experimental test bench. The results show that the proposed methodology it is able to accurately to detect unknown defects, outperforming other state-of-the-art methods.<\/jats:p>","DOI":"10.3390\/s21175830","type":"journal-article","created":{"date-parts":[[2021,8,31]],"date-time":"2021-08-31T22:58:15Z","timestamp":1630450695000},"page":"5830","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":17,"title":["Deep-Compact-Clustering Based Anomaly Detection Applied to Electromechanical Industrial Systems"],"prefix":"10.3390","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5841-0561","authenticated-orcid":false,"given":"Francisco","family":"Arellano-Espitia","sequence":"first","affiliation":[{"name":"MCIA Department of Electronic Engineering, Technical University of Catalonia (UPC), 08034 Barcelona, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9282-838X","authenticated-orcid":false,"given":"Miguel","family":"Delgado-Prieto","sequence":"additional","affiliation":[{"name":"MCIA Department of Electronic Engineering, Technical University of Catalonia (UPC), 08034 Barcelona, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8436-0972","authenticated-orcid":false,"given":"Artvin-Darien","family":"Gonzalez-Abreu","sequence":"additional","affiliation":[{"name":"HSPdigital CA-Mecatronica Engineering Faculty, Autonomous University of Queretaro, San Juan del Rio 76806, Mexico"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9026-6694","authenticated-orcid":false,"given":"Juan Jose","family":"Saucedo-Dorantes","sequence":"additional","affiliation":[{"name":"HSPdigital CA-Mecatronica Engineering Faculty, Autonomous University of Queretaro, San Juan del Rio 76806, Mexico"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0868-2918","authenticated-orcid":false,"given":"Roque Alfredo","family":"Osornio-Rios","sequence":"additional","affiliation":[{"name":"HSPdigital CA-Mecatronica Engineering Faculty, Autonomous University of Queretaro, San Juan del Rio 76806, Mexico"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,8,30]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"5299","DOI":"10.1109\/TII.2019.2895132","article-title":"Data-Driven Approaches for Diagnosis of Incipient Faults in DC Motors","volume":"15","author":"Munikoti","year":"2019","journal-title":"IEEE Trans. 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