{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T22:55:33Z","timestamp":1761519333586,"version":"build-2065373602"},"reference-count":30,"publisher":"MDPI AG","issue":"17","license":[{"start":{"date-parts":[[2021,9,5]],"date-time":"2021-09-05T00:00:00Z","timestamp":1630800000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/100014132","name":"European Metrology Programme for Innovation and Research","doi-asserted-by":"publisher","award":["17IND05MicroProbes"],"award-info":[{"award-number":["17IND05MicroProbes"]}],"id":[{"id":"10.13039\/100014132","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Long slender piezoresistive silicon microprobes are a new type of sensor for measurement of surface roughness. Their advantage is the ability to measure at speeds of up to 15 mm\/s, which is much faster than conventional stylus probes. The drawbacks are their small measurement range and tendency to break easily when deflected by more than the allowed range of 1 mm. In this article, previously developed microprobes were tested in the laboratory to evaluate their metrological properties, then tested under industrial conditions. There are several industrial measurement applications in which microprobes are useful. Measurement of the roughness of paper machine rolls was selected for testing in this study. The integration of a microprobe into an existing roll measurement device is presented together with the measurement results. The results are promising, indicating that measurements using a microprobe can give useful data on the grinding process.<\/jats:p>","DOI":"10.3390\/s21175955","type":"journal-article","created":{"date-parts":[[2021,9,6]],"date-time":"2021-09-06T13:18:26Z","timestamp":1630934306000},"page":"5955","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":15,"title":["In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes"],"prefix":"10.3390","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5394-736X","authenticated-orcid":false,"given":"Linus","family":"Teir","sequence":"first","affiliation":[{"name":"VTT Technical Research Centre of Finland Ltd., National Metrology Institute VTT MIKES, 02150 Espoo, Finland"}]},{"given":"Tuomas","family":"Lindstedt","sequence":"additional","affiliation":[{"name":"RollResearch International Ltd., 02630 Espoo, Finland"}]},{"given":"Thomas","family":"Widmaier","sequence":"additional","affiliation":[{"name":"RollResearch International Ltd., 02630 Espoo, Finland"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8519-0656","authenticated-orcid":false,"given":"Bj\u00f6rn","family":"Hemming","sequence":"additional","affiliation":[{"name":"VTT Technical Research Centre of Finland Ltd., National Metrology Institute VTT MIKES, 02150 Espoo, Finland"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4293-4982","authenticated-orcid":false,"given":"Uwe","family":"Brand","sequence":"additional","affiliation":[{"name":"PTB, Physikalisch-Technische Bundesanstalt, 38116 Braunschweig, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1027-9968","authenticated-orcid":false,"given":"Michael","family":"Fahrbach","sequence":"additional","affiliation":[{"name":"Laboratory for Emerging Nanometrology (LENA), Institut f\u00fcr Halbleitertechnik (IHT), Technische Universit\u00e4t Braunschweig, 38106 Braunschweig, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5801-813X","authenticated-orcid":false,"given":"Erwin","family":"Peiner","sequence":"additional","affiliation":[{"name":"Laboratory for Emerging Nanometrology (LENA), Institut f\u00fcr Halbleitertechnik (IHT), Technische Universit\u00e4t Braunschweig, 38106 Braunschweig, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6991-7082","authenticated-orcid":false,"given":"Antti","family":"Lassila","sequence":"additional","affiliation":[{"name":"VTT Technical Research Centre of Finland Ltd., National Metrology Institute VTT MIKES, 02150 Espoo, Finland"}]}],"member":"1968","published-online":{"date-parts":[[2021,9,5]]},"reference":[{"key":"ref_1","unstructured":"Whitehouse, D.J. 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