{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T02:19:42Z","timestamp":1760235582228,"version":"build-2065373602"},"reference-count":32,"publisher":"MDPI AG","issue":"18","license":[{"start":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T00:00:00Z","timestamp":1631232000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Variation in the ambient temperature deteriorates the accuracy of a resolver. In this paper, a temperature-compensation technique is introduced to improve resolver accuracy. The ambient temperature causes deviations in the resolver signal; therefore, the disturbed signal is investigated through the change in current in the primary winding of the resolver. For the proposed technique, the primary winding of the resolver is driven by a class-AB output stage of an operational amplifier (opamp), where the primary winding current forms part of the supply current of the opamp. The opamp supply-current sensing technique is used to extract the primary winding current. The error of the resolver signal due to temperature variations is directly evaluated from the supply current of the opamp. Therefore, the proposed technique does not require a temperature-sensitive device. Using the proposed technique, the error of the resolver signal when the ambient temperature increases to 70 \u00b0C can be minimized from 1.463% without temperature compensation to 0.017% with temperature compensation. The performance of the proposed technique is discussed in detail and is confirmed by experimental implementation using commercial devices. The results show that the proposed circuit can compensate for wide variations in ambient temperature.<\/jats:p>","DOI":"10.3390\/s21186069","type":"journal-article","created":{"date-parts":[[2021,9,12]],"date-time":"2021-09-12T21:48:01Z","timestamp":1631483281000},"page":"6069","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["A Temperature-Compensation Technique for Improving Resolver Accuracy"],"prefix":"10.3390","volume":"21","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0234-3475","authenticated-orcid":false,"given":"Wandee","family":"Petchmaneelumka","sequence":"first","affiliation":[{"name":"School of Engineering, King Mongkut\u2019s Institute of Technology Ladkrabang, Ladkrabang, Bangkok 10520, Thailand"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4708-4665","authenticated-orcid":false,"given":"Vanchai","family":"Riewruja","sequence":"additional","affiliation":[{"name":"School of Engineering, King Mongkut\u2019s Institute of Technology Ladkrabang, Ladkrabang, Bangkok 10520, Thailand"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kanoknuch","family":"Songsuwankit","sequence":"additional","affiliation":[{"name":"School of Engineering, King Mongkut\u2019s Institute of Technology Ladkrabang, Ladkrabang, Bangkok 10520, Thailand"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Apinai","family":"Rerkratn","sequence":"additional","affiliation":[{"name":"School of Engineering, King Mongkut\u2019s Institute of Technology Ladkrabang, Ladkrabang, Bangkok 10520, Thailand"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,9,10]]},"reference":[{"key":"ref_1","unstructured":"Pallas-Areny, R., and Webster, J.G. 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