{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,14]],"date-time":"2026-05-14T03:59:44Z","timestamp":1778731184284,"version":"3.51.4"},"reference-count":25,"publisher":"MDPI AG","issue":"19","license":[{"start":{"date-parts":[[2021,9,27]],"date-time":"2021-09-27T00:00:00Z","timestamp":1632700800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>In this paper, a topology-based stereo matching method for 3D measurement using a single pattern of coded spot-array structured light is proposed. The pattern of spot array is designed with a central reference ring spot, and each spot in the pattern can be uniquely coded with the row and column indexes according to the predefined topological search path. A method using rectangle templates to find the encoded spots in the captured images is proposed in the case where coding spots are missing, and an interpolation method is also proposed for rebuilding the missing spots. Experimental results demonstrate that the proposed technique could exactly and uniquely decode each spot and establish the stereo matching relation successfully, which can be used to obtain three-dimensional (3D) reconstruction with a single-shot method.<\/jats:p>","DOI":"10.3390\/s21196444","type":"journal-article","created":{"date-parts":[[2021,9,27]],"date-time":"2021-09-27T22:16:38Z","timestamp":1632780998000},"page":"6444","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":8,"title":["A Topology-Based Stereo Matching Method for One Shot 3D Measurement Using Coded Spot-Array Structured Light"],"prefix":"10.3390","volume":"21","author":[{"given":"Junhui","family":"Mei","sequence":"first","affiliation":[{"name":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"},{"name":"Shanghai Key Laboratory of Advanced Manufacturing Environment, Shanghai 200240, China"},{"name":"Shanghai AllyNav Technology Corp., Ltd., Shanghai 201700, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiao","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"},{"name":"Shanghai Key Laboratory of Advanced Manufacturing Environment, Shanghai 200240, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhenxin","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"},{"name":"Shanghai Key Laboratory of Advanced Manufacturing Environment, Shanghai 200240, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0164-6471","authenticated-orcid":false,"given":"Xiaobo","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"},{"name":"Shanghai Key Laboratory of Advanced Manufacturing Environment, Shanghai 200240, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Juntong","family":"Xi","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"},{"name":"Shanghai Key Laboratory of Advanced Manufacturing Environment, Shanghai 200240, China"},{"name":"State Key Laboratory of Mechanical System and Vibration, Shanghai 200240, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,9,27]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"107624","DOI":"10.1016\/j.measurement.2020.107624","article-title":"Review of Real-time Three-dimensional Shape Measurement Techniques","volume":"156","author":"Wang","year":"2020","journal-title":"Measurement"},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"2666","DOI":"10.1016\/j.patcog.2010.03.004","article-title":"A state of the art in structured light patterns for surface profilometry","volume":"43","author":"Salvi","year":"2010","journal-title":"Pattern Recognit."},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"1097","DOI":"10.1016\/j.optlaseng.2012.01.007","article-title":"Review of single-shot 3D shape measurement by phase calculation-based fringe projection techniques","volume":"50","author":"Zhang","year":"2012","journal-title":"Opt. 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