{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,29]],"date-time":"2026-03-29T18:09:12Z","timestamp":1774807752156,"version":"3.50.1"},"reference-count":40,"publisher":"MDPI AG","issue":"9","license":[{"start":{"date-parts":[[2022,4,20]],"date-time":"2022-04-20T00:00:00Z","timestamp":1650412800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Deputyship for Research and Innovation-Ministry of 268 Education, Kingdom of Saudi Arabia","award":["NU\/IFC\/ENT\/01\/004"],"award-info":[{"award-number":["NU\/IFC\/ENT\/01\/004"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Cyber-threats are becoming a big concern due to the potential severe consequences of such threats is false data injection (FDI) attacks where the measures data is manipulated such that the detection is unfeasible using traditional approaches. This work focuses on detecting FDIs for phasor measurement units where compromising one unit is sufficient for launching such attacks. In the proposed approach, moving averages and correlation are used along with machine learning algorithms to detect such attacks. The proposed approach is tested and validated using the IEEE 14-bus and the IEEE 30-bus test systems. The proposed performance was sufficient for detecting the location and attack instances under different scenarios and circumstances.<\/jats:p>","DOI":"10.3390\/s22093146","type":"journal-article","created":{"date-parts":[[2022,4,21]],"date-time":"2022-04-21T03:46:11Z","timestamp":1650512771000},"page":"3146","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":14,"title":["False Data Injection Detection for Phasor Measurement Units"],"prefix":"10.3390","volume":"22","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4653-190X","authenticated-orcid":false,"given":"Saleh","family":"Almasabi","sequence":"first","affiliation":[{"name":"Electrical Engineering Department, College of Engineering, Najran University, Najran 11001, Saudi Arabia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9579-9115","authenticated-orcid":false,"given":"Turki","family":"Alsuwian","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, College of Engineering, Najran University, Najran 11001, Saudi Arabia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6421-9245","authenticated-orcid":false,"given":"Muhammad","family":"Awais","sequence":"additional","affiliation":[{"name":"Department of Computer Science, Edge Hill University, Ormskirk L39 4QP, UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4161-6875","authenticated-orcid":false,"given":"Muhammad","family":"Irfan","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, College of Engineering, Najran University, Najran 11001, Saudi Arabia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6828-3874","authenticated-orcid":false,"given":"Mohammed","family":"Jalalah","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, College of Engineering, Najran University, Najran 11001, Saudi Arabia"},{"name":"Promising Centre for Sensors and Electronic Devices (PCSED), Advanced Materials and Nano-Research Centre, Najran University, P.O. Box 1988, Najran 11001, Saudi Arabia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9359-2436","authenticated-orcid":false,"given":"Belqasem","family":"Aljafari","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, College of Engineering, Najran University, Najran 11001, Saudi Arabia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7776-7099","authenticated-orcid":false,"given":"Farid A.","family":"Harraz","sequence":"additional","affiliation":[{"name":"Promising Centre for Sensors and Electronic Devices (PCSED), Advanced Materials and Nano-Research Centre, Najran University, P.O. Box 1988, Najran 11001, Saudi Arabia"},{"name":"Nanomaterials and Nanotechnology Department, Central Metallurgical Research and Development Institute (CMRDI), P.O. Box 87 Helwan, Cairo 11421, Egypt"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2022,4,20]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"3317","DOI":"10.1109\/TPWRS.2016.2631891","article-title":"The 2015 Ukraine Blackout: Implications for False Data Injection Attacks","volume":"32","author":"Liang","year":"2017","journal-title":"IEEE Trans. Power Syst."},{"key":"ref_2","doi-asserted-by":"crossref","unstructured":"Yuan, P., Zhang, Q., Zhang, T., Chi, C., Zhang, X., Li, P., and Gong, X. (2019, January 22\u201324). Analysis and Enlightenment of the Blackouts in Argentina and New York. Proceedings of the 2019 Chinese Automation Congress (CAC), Hangzhou, China.","DOI":"10.1109\/CAC48633.2019.8997461"},{"key":"ref_3","doi-asserted-by":"crossref","unstructured":"Abur, A., and Exposito, A.G. (2004). 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