{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T00:56:17Z","timestamp":1760230577179,"version":"build-2065373602"},"reference-count":28,"publisher":"MDPI AG","issue":"15","license":[{"start":{"date-parts":[[2022,7,31]],"date-time":"2022-07-31T00:00:00Z","timestamp":1659225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Natural Science Foundation of the Jiangsu Higher Education Institutions of China","award":["21KJB510012","jit-b-201907","jit-fhxm-2007","202213573086Y"],"award-info":[{"award-number":["21KJB510012","jit-b-201907","jit-fhxm-2007","202213573086Y"]}]},{"name":"Scientific Research Foundation for the High-Level Talents of Jinling Institute of Technology","award":["21KJB510012","jit-b-201907","jit-fhxm-2007","202213573086Y"],"award-info":[{"award-number":["21KJB510012","jit-b-201907","jit-fhxm-2007","202213573086Y"]}]},{"name":"Scientific Research Incubation Foundation of Jinling Institute of Technology","award":["21KJB510012","jit-b-201907","jit-fhxm-2007","202213573086Y"],"award-info":[{"award-number":["21KJB510012","jit-b-201907","jit-fhxm-2007","202213573086Y"]}]},{"name":"Practice Innovation Training Program Projects for Jiangsu College Students","award":["21KJB510012","jit-b-201907","jit-fhxm-2007","202213573086Y"],"award-info":[{"award-number":["21KJB510012","jit-b-201907","jit-fhxm-2007","202213573086Y"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Vertical Hall sensors (VHSs), compatible with complementary metal oxide semiconductor (CMOS) technology, are used to detect magnetic fields in the plane of the sensor. In previous studies, their performance was limited by a large offset. This paper reports on a novel CMOS seven-contact VHS (7CVHS), which is formed by adding two additional contacts to a traditional five-contact VHS (5CVHS) to alleviate the offset. The offset voltage and offset magnetic field of the 7CVHS are reduced by 90.20% and 88.31% of those of the 5CVHS, respectively, with a 16.16% current-related sensitivity loss. Moreover, the size and positions of the contacts are optimized in standard GLOBALFOUNDRIES 0.18 \u03bcm BCDliteTM technology by scanning parameters using FEM simulations. The simulation data are analyzed in groups to study the influence of the size and contact positions on the current-related sensitivity, offset voltage, and offset magnetic field.<\/jats:p>","DOI":"10.3390\/s22155734","type":"journal-article","created":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T23:49:27Z","timestamp":1659397767000},"page":"5734","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["A New Design of a CMOS Vertical Hall Sensor with a Low Offset"],"prefix":"10.3390","volume":"22","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2282-1574","authenticated-orcid":false,"given":"Fei","family":"Lyu","sequence":"first","affiliation":[{"name":"School of Electronics and Information Engineering, Jinling Institute of Technology, Nanjing 211169, China"}]},{"given":"Shuo","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Jinling Institute of Technology, Nanjing 211169, China"}]},{"given":"Chaoran","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Jinling Institute of Technology, Nanjing 211169, China"}]},{"given":"Xingcheng","family":"Liang","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Jinling Institute of Technology, Nanjing 211169, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2886-2281","authenticated-orcid":false,"given":"Pengzhan","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Jinling Institute of Technology, Nanjing 211169, China"},{"name":"School of Electronic Science and Engineering, Nanjing University, Nanjing 210023, China"}]},{"given":"Yuxuan","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Engineering, Nanjing University, Nanjing 210023, China"}]},{"given":"Hongbing","family":"Pan","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Engineering, Nanjing University, Nanjing 210023, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5561-4435","authenticated-orcid":false,"given":"Yu","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronics Engineering, Nanjing Xiaozhuang University, Nanjing 211171, China"}]}],"member":"1968","published-online":{"date-parts":[[2022,7,31]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"1470","DOI":"10.1109\/TIM.2018.2795248","article-title":"A Broadband, on-chip sensor based on hall effect for current measurements in smart power circuits","volume":"67","author":"Crescentini","year":"2018","journal-title":"IEEE Trans. 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