{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T08:37:59Z","timestamp":1773736679787,"version":"3.50.1"},"reference-count":40,"publisher":"MDPI AG","issue":"1","license":[{"start":{"date-parts":[[2022,12,23]],"date-time":"2022-12-23T00:00:00Z","timestamp":1671753600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>The root mean square surface roughness Rq of metals is detrimental in several microwave applications. Rq characterization methods are thus largely used and of great interest. In this work, a new dielectric loaded resonator (DR) design is proposed to evaluate the surface resistance variations of samples with different Rq. The new design is thought to make the measurement accuracy, usually strongly affected by the measurement repeatability, suitable for this study. We analyze the measurement method\u2019s sensitivity and accuracy in order to assess the possibility of using this new DR design for highly accurate surface resistance measurements sensitive to Rq variations.<\/jats:p>","DOI":"10.3390\/s23010139","type":"journal-article","created":{"date-parts":[[2022,12,27]],"date-time":"2022-12-27T02:53:11Z","timestamp":1672109591000},"page":"139","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":7,"title":["Proposal: Apparatus for Sensing the Effect of Surface Roughness on the Surface Resistance of Metals"],"prefix":"10.3390","volume":"23","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3420-3864","authenticated-orcid":false,"given":"Kostiantyn","family":"Torokhtii","sequence":"first","affiliation":[{"name":"Department of Industrial, Electronic and Mechanical Engineering, Roma Tre University, Via Vito Volterra 62, 00146 Roma, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4459-6147","authenticated-orcid":false,"given":"Andrea","family":"Alimenti","sequence":"additional","affiliation":[{"name":"Department of Industrial, Electronic and Mechanical Engineering, Roma Tre University, Via Vito Volterra 62, 00146 Roma, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0820-3286","authenticated-orcid":false,"given":"Pablo","family":"Vidal Garc\u00eda","sequence":"additional","affiliation":[{"name":"Department of Industrial, Electronic and Mechanical Engineering, Roma Tre University, Via Vito Volterra 62, 00146 Roma, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4847-1234","authenticated-orcid":false,"given":"Nicola","family":"Pompeo","sequence":"additional","affiliation":[{"name":"Department of Industrial, Electronic and Mechanical Engineering, Roma Tre University, Via Vito Volterra 62, 00146 Roma, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8633-4295","authenticated-orcid":false,"given":"Enrico","family":"Silva","sequence":"additional","affiliation":[{"name":"Department of Industrial, Electronic and Mechanical Engineering, Roma Tre University, Via Vito Volterra 62, 00146 Roma, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2022,12,23]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"14428","DOI":"10.1021\/jp8047423","article-title":"Influence of Electrode Roughness on Cyclic Voltammetry","volume":"112","author":"Menshykau","year":"2008","journal-title":"J. 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