{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,7]],"date-time":"2026-07-07T05:06:30Z","timestamp":1783400790655,"version":"3.54.6"},"reference-count":84,"publisher":"MDPI AG","issue":"1","license":[{"start":{"date-parts":[[2023,1,3]],"date-time":"2023-01-03T00:00:00Z","timestamp":1672704000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>The spread of additive manufacturing techniques in the prototyping and realization of high-frequency applications renewed the interest in the characterization of the electromagnetic properties of both dielectric and conductive materials, as well as the design of new versatile measurement techniques. In this framework, a new configuration of a dielectric-loaded resonator is presented. Its optimization, realization, and use are presented. A measurement repeatability of about one order of magnitude lower than the commonly found values (10\u22123 on the Q-factor and 15\u00d710\u22126 on the resonance frequency, given in terms of the relative standard deviations of repeated measurements) was reached thanks to the design of a closed resonator in which the samples can be loaded without disassembling the whole measurement fixture. The uncertainty levels, the ease of use, and the versatility of the realized system make its use of potential interest in numerous scenarios.<\/jats:p>","DOI":"10.3390\/s23010518","type":"journal-article","created":{"date-parts":[[2023,1,4]],"date-time":"2023-01-04T02:54:55Z","timestamp":1672800895000},"page":"518","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":12,"title":["Design and Test of a New Dielectric-Loaded Resonator for the Accurate Characterization of Conductive and Dielectric Materials"],"prefix":"10.3390","volume":"23","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4459-6147","authenticated-orcid":false,"given":"Andrea","family":"Alimenti","sequence":"first","affiliation":[{"name":"Department of Industrial, Electronic and Mechanical Engineering, Roma Tre University, Via Vito Volterra 62, 00146 Roma, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3420-3864","authenticated-orcid":false,"given":"Kostiantyn","family":"Torokhtii","sequence":"additional","affiliation":[{"name":"Department of Industrial, Electronic and Mechanical Engineering, Roma Tre University, Via Vito Volterra 62, 00146 Roma, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0820-3286","authenticated-orcid":false,"given":"Pablo","family":"Vidal Garc\u00eda","sequence":"additional","affiliation":[{"name":"Department of Industrial, Electronic and Mechanical Engineering, Roma Tre University, Via Vito Volterra 62, 00146 Roma, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4847-1234","authenticated-orcid":false,"given":"Nicola","family":"Pompeo","sequence":"additional","affiliation":[{"name":"Department of Industrial, Electronic and Mechanical Engineering, Roma Tre University, Via Vito Volterra 62, 00146 Roma, Italy"},{"name":"Istituto Nazionale di Fisica Nucleare INFN, Sezione Roma Tre, Via della Vasca Navale 84, 00146 Roma, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8633-4295","authenticated-orcid":false,"given":"Enrico","family":"Silva","sequence":"additional","affiliation":[{"name":"Department of Industrial, Electronic and Mechanical Engineering, Roma Tre University, Via Vito Volterra 62, 00146 Roma, Italy"},{"name":"Istituto Nazionale di Fisica Nucleare INFN, Sezione Roma Tre, Via della Vasca Navale 84, 00146 Roma, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2023,1,3]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"S91","DOI":"10.1088\/0026-1394\/47\/2\/S10","article-title":"Techniques for measuring the microwave dielectric properties of materials","volume":"47","author":"Kaatze","year":"2010","journal-title":"Metrologia"},{"key":"ref_2","doi-asserted-by":"crossref","unstructured":"Chen, L.F., Ong, C., Neo, C., Varadan, V., and Varadan, V.K. 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