{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T02:00:07Z","timestamp":1760148007597,"version":"build-2065373602"},"reference-count":36,"publisher":"MDPI AG","issue":"6","license":[{"start":{"date-parts":[[2023,3,20]],"date-time":"2023-03-20T00:00:00Z","timestamp":1679270400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Agency for Defense development (ADD), Korea"},{"name":"Research Grant of Kwangwoon University"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>In recent times, due to the high operating frequency and low operating voltage of modern electronic devices, intended electromagnetic interference (IEMI) has been the cause of increasing damage. In particular, targets with precision electronics such as aircrafts or missiles have shown that a high-power microwave (HPM) may cause malfunction or partial destruction of the GPS or the avionic control system. Analysis of the effects of IEMI requires electromagnetic numerical analyses. However, there are limitations to conventional numerical techniques, such as the finite element method, method of moment, or finite difference time domain method, due to the complexity and large electrical length of a real target system. In this paper, we proposed a new cylindrical mode matching (CMM) technique to analyze IEMI of the generic missile (GENEC) model, which is a hollow metal cylinder with multiple apertures. Using the CMM, we can quickly analyze the effect of the IEMI inside the GENEC model from 1.7 to 2.5 GHz. The results were compared with those of the measurements and, for verification, with the FEKO, a commercial software program developed by Altair Engineering, and showed good agreement. In this paper, the electro-optic (EO) probe was used to measure the electric field inside the GENEC model.<\/jats:p>","DOI":"10.3390\/s23063278","type":"journal-article","created":{"date-parts":[[2023,3,21]],"date-time":"2023-03-21T02:36:22Z","timestamp":1679366182000},"page":"3278","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Analysis of Intentional Electromagnetic Interference on GENEC Model Using Cylindrical Mode Matching"],"prefix":"10.3390","volume":"23","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5260-9094","authenticated-orcid":false,"given":"Wonjune","family":"Kang","sequence":"first","affiliation":[{"name":"Department of Electronics Convergence Engineering, Kwangwoon University, Seoul 01897, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0492-5831","authenticated-orcid":false,"given":"No-Weon","family":"Kang","sequence":"additional","affiliation":[{"name":"Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon 34113, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Woosang","family":"Lee","sequence":"additional","affiliation":[{"name":"Agency for Defense Development, Daejeon 34186, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Changyul","family":"Cheon","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, University of Seoul, Seoul 02504, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Young-Seek","family":"Chung","sequence":"additional","affiliation":[{"name":"Department of Electronics Convergence Engineering, Kwangwoon University, Seoul 01897, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2023,3,20]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"314","DOI":"10.1109\/TEMC.2004.831899","article-title":"Introduction to the special issue on high-power electromagnetics (HPEM) and intentional electromagnetic interference (IEMI)","volume":"46","author":"Radasky","year":"2004","journal-title":"IEEE Trans. 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