{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,14]],"date-time":"2026-03-14T08:22:36Z","timestamp":1773476556463,"version":"3.50.1"},"reference-count":26,"publisher":"MDPI AG","issue":"9","license":[{"start":{"date-parts":[[2023,4,29]],"date-time":"2023-04-29T00:00:00Z","timestamp":1682726400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003565","name":"Ministry of Land, Infrastructure and Transport","doi-asserted-by":"publisher","award":["RS-2022-00142883"],"award-info":[{"award-number":["RS-2022-00142883"]}],"id":[{"id":"10.13039\/501100003565","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Visiting Scholar Research Funding Program from Koreatech University","award":["RS-2022-00142883"],"award-info":[{"award-number":["RS-2022-00142883"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>This paper proposes a novel, degradation-sensitive, adaptive SST controller for cascode GaN-FETs. Unlike in traditional transformers, a semiconductor switch\u2019s degradation and failure can compromise its robustness and integrity. It is vital to continuously monitor a switch\u2019s health condition to adapt it to mission-critical applications. The current state-of-the-art degradation monitoring methods for power electronics systems are computationally intensive, have limited capacity to accurately identify the severity of degradation, and can be challenging to implement in real time. These methods primarily focus on conducting accelerated life testing (ALT) of individual switches and are not typically implemented for online monitoring. The proposed controller uses accelerated life testing (ALT)-based switch degradation mapping for degradation severity assessment. This controller intelligently derates the SST to (1) ensure robust operation over the SST\u2019s lifetime and (2) achieve the optimal degradation-sensitive function. Additionally, a fast behavioral switch loss model for cascode GaN-FETs is used. This proposed fast model estimates the loss accurately without proprietary switch parasitic information. Finally, the proposed method is experimentally validated using a 5 kW cascode GaN-FET-based SST platform.<\/jats:p>","DOI":"10.3390\/s23094395","type":"journal-article","created":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T12:12:11Z","timestamp":1682943131000},"page":"4395","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":7,"title":["A Fast Loss Model for Cascode GaN-FETs and Real-Time Degradation-Sensitive Control of Solid-State Transformers"],"prefix":"10.3390","volume":"23","author":[{"given":"Moinul Shahidul","family":"Haque","sequence":"first","affiliation":[{"name":"Nexteer Automotive Corp., Saginaw, MI 48601, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Md","family":"Moniruzzaman","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Mississippi State University, Starkville, MS 39762, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Seungdeog","family":"Choi","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Mississippi State University, Starkville, MS 39762, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2890-906X","authenticated-orcid":false,"given":"Sangshin","family":"Kwak","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 06974, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2009-9004","authenticated-orcid":false,"given":"Ahmed H.","family":"Okilly","sequence":"additional","affiliation":[{"name":"Electrical & Electronics and Communication Engineering Department, Koreatech University, Cheonan 31253, Republic of Korea"},{"name":"Electrical Engineering Department, Faculty of Engineering, Assiut University, Assiut 71516, Egypt"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1186-3739","authenticated-orcid":false,"given":"Jeihoon","family":"Baek","sequence":"additional","affiliation":[{"name":"Electrical & Electronics and Communication Engineering Department, Koreatech University, Cheonan 31253, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2023,4,29]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1002\/2050-7038.12996","article-title":"Solid-state transformers: An overview of the concept, topology, and its applications in the smart grid","volume":"31","author":"Shadfar","year":"2021","journal-title":"Int. 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