{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T02:13:14Z","timestamp":1760148794205,"version":"build-2065373602"},"reference-count":24,"publisher":"MDPI AG","issue":"12","license":[{"start":{"date-parts":[[2023,6,8]],"date-time":"2023-06-08T00:00:00Z","timestamp":1686182400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/100004358","name":"Samsung Electronics Co., Ltd.","doi-asserted-by":"publisher","award":["IO210209-08405-01"],"award-info":[{"award-number":["IO210209-08405-01"]}],"id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>A design for a millimeter wave RF probe card that removes resonance is proposed. The designed probe card optimizes the position of the ground surface and the signal pogo pins to resolve the resonance and signal loss issues that occur when connecting a dielectric socket and a PCB. At millimeter wave frequencies, the height of the dielectric socket and pogo pin matches the length of half a wavelength, allowing the socket to act as a resonator. When the leakage signal from the PCB line is coupled to the 2.9 mm high socket with pogo pins, resonance at a frequency of 28 GHz is generated. The probe card uses the ground plane as a shielding structure to minimize this resonance and radiation loss. The importance of the signal pin location is verified via measurements in order to address the discontinuity caused by field polarity switching. A probe card fabricated using the proposed technique exhibits an insertion loss performance of \u22128 dB up to 50 GHz and eliminates resonance. A signal with an insertion loss of \u22123.1 dB can be transmitted to a system-on-chip in a practical chip test.<\/jats:p>","DOI":"10.3390\/s23125420","type":"journal-article","created":{"date-parts":[[2023,6,8]],"date-time":"2023-06-08T02:02:28Z","timestamp":1686189748000},"page":"5420","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["Low-Loss Pogo Pin Probe Card with a Coupling Isolation Structure up to 50 GHz"],"prefix":"10.3390","volume":"23","author":[{"given":"K. M.","family":"Lee","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Korea University, Seoul 02841, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Ahn","sequence":"additional","affiliation":[{"name":"Samsung Electronics Co., Ltd., Suwon 16677, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Park","sequence":"additional","affiliation":[{"name":"Samsung Electronics Co., Ltd., Suwon 16677, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Kim","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea University, Seoul 02841, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2023,6,8]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"46","DOI":"10.1109\/MMM.2013.2280241","article-title":"RF Probe Technology: History and Selected Topics","volume":"14","author":"Rumiantsev","year":"2013","journal-title":"IEEE Microw. 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