{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,11]],"date-time":"2026-06-11T02:04:31Z","timestamp":1781143471349,"version":"3.54.1"},"reference-count":27,"publisher":"MDPI AG","issue":"13","license":[{"start":{"date-parts":[[2023,6,25]],"date-time":"2023-06-25T00:00:00Z","timestamp":1687651200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>For the last two decades, the CNES optoelectronics detection department and partners have evaluated space environment effects on a large panel of CMOS image sensors (CIS) from a wide range of commercial foundries and device providers. Many environmental tests have been realized in order to provide insights into detection chain degradation in modern CIS for space applications. CIS technology has drastically improved in the last decade, reaching very high performances in terms of quantum efficiency (QE) and spectral selectivity. These improvements are obtained thanks to the introduction of various components in the pixel optical stack, such as microlenses, color filters, and polarizing filters. However, since these parts have been developed only for commercial applications suitable for on-ground environment, it is crucial to evaluate if these technologies can handle space environments for future space imaging missions. There are few results on that robustness in the literature. The objective of this article is to give an overview of CNES and partner experiments from numerous works, showing that the performance gain from the optical stack is greater than the degradation induced by the space environment. Consequently, optical stacks can be used for space missions because they are not the main contributor to the degradation in the detection chain.<\/jats:p>","DOI":"10.3390\/s23135884","type":"journal-article","created":{"date-parts":[[2023,6,26]],"date-time":"2023-06-26T05:28:02Z","timestamp":1687757282000},"page":"5884","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["Evaluation of Microlenses, Color Filters, and Polarizing Filters in CIS for Space Applications"],"prefix":"10.3390","volume":"23","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4359-9909","authenticated-orcid":false,"given":"Cl\u00e9mentine","family":"Durnez","sequence":"first","affiliation":[{"name":"Centre National D\u2019Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"C\u00e9dric","family":"Virmontois","sequence":"additional","affiliation":[{"name":"Centre National D\u2019Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Pierre","family":"Panuel","sequence":"additional","affiliation":[{"name":"Centre National D\u2019Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Aubin","family":"Antonsanti","sequence":"additional","affiliation":[{"name":"Centre National D\u2019Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France"},{"name":"Department of Electronics, Optronics and Signal Processing (DEOS), Institut Sup\u00e9rieur de l\u2019A\u00e9ronautique et de l\u2019Espace (ISAE-SUPAERO), 10 Avenue Edouard Belin, 31400 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Vincent","family":"Goiffon","sequence":"additional","affiliation":[{"name":"Department of Electronics, Optronics and Signal Processing (DEOS), Institut Sup\u00e9rieur de l\u2019A\u00e9ronautique et de l\u2019Espace (ISAE-SUPAERO), 10 Avenue Edouard Belin, 31400 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Magali","family":"Estribeau","sequence":"additional","affiliation":[{"name":"Department of Electronics, Optronics and Signal Processing (DEOS), Institut Sup\u00e9rieur de l\u2019A\u00e9ronautique et de l\u2019Espace (ISAE-SUPAERO), 10 Avenue Edouard Belin, 31400 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Olivier","family":"Saint-P\u00e9","sequence":"additional","affiliation":[{"name":"Airbus Defence and Space, 31 Rue des Cosmonautes, 31400 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Val\u00e9rian","family":"Lalucaa","sequence":"additional","affiliation":[{"name":"Centre National D\u2019Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Erick","family":"Berdin","sequence":"additional","affiliation":[{"name":"Airbus Defence and Space, 31 Rue des Cosmonautes, 31400 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Franck","family":"Larnaudie","sequence":"additional","affiliation":[{"name":"Airbus Defence and Space, 31 Rue des Cosmonautes, 31400 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jean-Marc","family":"Belloir","sequence":"additional","affiliation":[{"name":"Centre National D\u2019Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Catalin","family":"Codreanu","sequence":"additional","affiliation":[{"name":"Centre National D\u2019Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ludovic","family":"Chavanne","sequence":"additional","affiliation":[{"name":"Centre National D\u2019Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2023,6,25]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"2784","DOI":"10.1002\/jemt.23818","article-title":"Microlenses arrays: Fabrication, materials, and applications","volume":"84","author":"Cai","year":"2021","journal-title":"Microsc. Res. Tech."},{"key":"ref_2","unstructured":"Guerrero, D.J., DiMenna, W., Flaim, T.D., Mercado, R., and Sun, S. (2003). Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV, SPIE."},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"1692","DOI":"10.1109\/JSEN.2010.2095003","article-title":"Integrated Polarization Analyzing CMOS Image Sensor for Material Classification","volume":"11","author":"Sarkar","year":"2011","journal-title":"IEEE Sens. J."},{"key":"ref_4","doi-asserted-by":"crossref","first-page":"47","DOI":"10.1007\/s11214-021-00807-w","article-title":"The SuperCam Instrument Suite on the Mars 2020 Rover: Science Objectives and Mast-Unit Description","volume":"217","author":"Maurice","year":"2021","journal-title":"Space Sci. Rev."},{"key":"ref_5","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1007\/s11214-020-00765-9","article-title":"The Mars 2020 Engineering Cameras and Microphone on the Perseverance Rover: A Next-Generation Imaging System for Mars Exploration","volume":"216","author":"Maki","year":"2020","journal-title":"Space Sci. Rev."},{"key":"ref_6","doi-asserted-by":"crossref","first-page":"104","DOI":"10.1109\/TNS.2018.2885822","article-title":"Dose and Single-Event Effects on a Color CMOS Camera for Space Exploration","volume":"66","author":"Virmontois","year":"2019","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_7","unstructured":"Ulamec, S., Michel, P., Grott, M., B\u00f6ttger, U., H\u00fcbers, H.W., Murdoch, N., Pierre, V., Kaaekn, \u00d6., J\u00f6rg, K., and Konrad, W. (2019, January 21\u201325). A Rover for the Jaxa Mmx Mission to Phobos. Proceedings of the 70th International Astronautical Congress, IAC, Washington, DC, USA. IAC-19-A3.4.B8."},{"key":"ref_8","doi-asserted-by":"crossref","unstructured":"Yokoyama, T., Tsutsui, M., Suzuki, M., Nishi, Y., Mizuno, I., and Lahav, A. (2018). Development of Low Parasitic Light Sensitivity and Low Dark Current 2.8 \u03bcm Global Shutter Pixel. Sensors, 18.","DOI":"10.3390\/s18020349"},{"key":"ref_9","doi-asserted-by":"crossref","first-page":"3636","DOI":"10.1364\/AO.383454","article-title":"Microlens testing on back-illuminated image sensors for space applications","volume":"59","author":"Zanella","year":"2020","journal-title":"Appl. Opt."},{"key":"ref_10","doi-asserted-by":"crossref","unstructured":"Teranishi, N., Watanabe, H., Ueda, T., and Sengoku, N. (2012, January 10\u201313). Evolution of optical structure in image sensors. Proceedings of the 2012 International Electron Devices Meeting, San Francisco, CA, USA.","DOI":"10.1109\/IEDM.2012.6479092"},{"key":"ref_11","unstructured":"Bayer, B.E. (1975). Color Imaging Array. (US3971065A)."},{"key":"ref_12","unstructured":"Zapryanov, G., and Nikolova, I. (2023, March 02). Comparative Study of Demosaicing Algorithms for Bayer and Pseudo-Random Bayer Color Filter Arrays. Available online: https:\/\/www.researchgate.net\/profile\/Georgi-Zapryanov\/publication\/256696331_Comparative_Study_of_Demosaicing_Algorithms_for_Bayer_and_Pseudo-Random_Bayer_Color_Filter_Array\/links\/00b49523a0052a4f0c000000\/Comparative-Study-of-Demosaicing-Algorithms-for-Bayer-and-Pseudo-Random-Bayer-Color-Filter-Array.pdf."},{"key":"ref_13","unstructured":"(2023, January 21\u201325). 3.0Mm-pixels and 1.5 pm-pixels combined CMOS Image Sensor for Viewing and Sensing Applications with 106dB Dynamic Range, High-Sensitivity, LED-Flicker Mitigation and Motion Blur-less. Proceedings of the 2023 International Image Sensor Workshop (IISW), Scotland, UK."},{"key":"ref_14","unstructured":"Geelen, B., Blanch, C., Gonzalez, P., Tack, N., and Lambrechts, A. (2015). Advanced Fabrication Technologies for Micro\/Nano Optics and Photonics VIII, SPIE."},{"key":"ref_15","doi-asserted-by":"crossref","unstructured":"Tisserand, S. (2019, January 24\u201326). Custom Bayer Filter Multispectral Imaging: Emerging Integrated Technology. Proceedings of the 2019 10th Workshop on Hyperspectral Imaging and Signal Processing: Evolution in Remote Sensing (WHISPERS), Amsterdam, The Netherland.","DOI":"10.1109\/WHISPERS.2019.8921288"},{"key":"ref_16","unstructured":"(2023, May 04). Accurate Estimation of Conversion Gain and Quantum Efficiency in CMOS Imagers. Available online: https:\/\/www.spiedigitallibrary.org\/conference-proceedings-of-spie\/5017\/0000\/Accurate-estimation-of-conversion-gain-and-quantum-efficiency-in-CMOS\/10.1117\/12.483900.full."},{"key":"ref_17","doi-asserted-by":"crossref","first-page":"6","DOI":"10.1109\/MCD.2005.1438751","article-title":"CMOS image sensors","volume":"21","author":"Eltoukhy","year":"2005","journal-title":"IEEE Circuits Devices Mag."},{"key":"ref_18","unstructured":"Doyle, D. (2023, March 02). Radiation Hardness of Optical Materials, 3rd Europa Jupiter System Mission Instrument Workshop, ESA ESTEC January 2010. Available online: https:\/\/sci.esa.int\/documents\/34530\/36042\/1567257330700-EJSM3IW_09_Radiation-Hardness-of-Optical-Materials_Doyle.pdf."},{"key":"ref_19","unstructured":"(2023, February 10). Study of the Surface Modification of the PMMA by UV-Radiation|Elsevier Enhanced Reader. Available online: https:\/\/reader.elsevier.com\/reader\/sd\/pii\/S1877705809000575?token=768301A37FFFC91692CDCF190B958D6359C6EAEB1FB7C90AF13BB356F417037D0362715793E2BA9FEDDC8046E0774EB9&originRegion=eu-west-1&originCreation=20230210082244."},{"key":"ref_20","first-page":"392","article-title":"The degradation of solid polymethylmethacrylate by ionizing radiation","volume":"223","author":"Alexander","year":"1997","journal-title":"Proc. R. Soc. London. Ser. A Math. Phys. Sci."},{"key":"ref_21","doi-asserted-by":"crossref","first-page":"101","DOI":"10.1109\/TNS.2017.2765481","article-title":"Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling","volume":"65","author":"Goiffon","year":"2018","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_22","doi-asserted-by":"crossref","first-page":"45","DOI":"10.1109\/TNS.2016.2636566","article-title":"Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments","volume":"64","author":"Goiffon","year":"2017","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_23","doi-asserted-by":"crossref","first-page":"2594","DOI":"10.1109\/TED.2009.2030623","article-title":"Overview of Ionizing Radiation Effects in Image Sensors Fabricated in a Deep-Submicrometer CMOS Imaging Technology","volume":"56","author":"Goiffon","year":"2009","journal-title":"IEEE Trans. Electron. Devices"},{"key":"ref_24","doi-asserted-by":"crossref","first-page":"C37","DOI":"10.1364\/AO.437391","article-title":"Calibration of a polarization image sensor and investigation of influencing factors","volume":"61","author":"Lane","year":"2022","journal-title":"Appl. Opt."},{"key":"ref_25","unstructured":"Rebhan, D., Rosenberger, M., and Notni, G. (2019). Photonics and Education in Measurement Science, SPIE."},{"key":"ref_26","unstructured":"Goiffon, V., Allanche, T., Muller, C., Girard, S., Paillet, P., Mac\u00e9, J.R., Osmond, M., Burnichon, P., Plumeri, S., and Baudu, J.-P. (2018, January 22\u201324). CAMRAD: Development of a Multi-Megagray Radiation Hard CMOS Camera for Dismantling Operations. Proceedings of the Dismantling Challenges: Industrial Reality, Prospects and Feedback Experience (DEM 2018), Avignon, France."},{"key":"ref_27","doi-asserted-by":"crossref","first-page":"1835","DOI":"10.1109\/TNS.2020.3003333","article-title":"A Radiation-Hardened CMOS Image Sensor with Pixels Exhibiting a Negligibly Small Dark-Level Increase During Ionizing Radiation","volume":"67","author":"Watanabe","year":"2020","journal-title":"IEEE Trans. Nucl. Sci."}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/23\/13\/5884\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T20:00:23Z","timestamp":1760126423000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/23\/13\/5884"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6,25]]},"references-count":27,"journal-issue":{"issue":"13","published-online":{"date-parts":[[2023,7]]}},"alternative-id":["s23135884"],"URL":"https:\/\/doi.org\/10.3390\/s23135884","relation":{},"ISSN":["1424-8220"],"issn-type":[{"value":"1424-8220","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,6,25]]}}}