{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T13:56:05Z","timestamp":1772805365236,"version":"3.50.1"},"reference-count":22,"publisher":"MDPI AG","issue":"14","license":[{"start":{"date-parts":[[2023,7,15]],"date-time":"2023-07-15T00:00:00Z","timestamp":1689379200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"National Natural Science Foundation of China","award":["52075131"],"award-info":[{"award-number":["52075131"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Ellipse detection has a very wide range of applications in the field of object detection, especially in the geometric size detection of inclined microporous parts. However, due to the processing methods applied to the parts, there are certain defects in the features. The existing ellipse detection methods do not meet the needs of rapid detection due to the problems of false detection and time consumption. This article proposes a method of quickly obtaining defective ellipse parameters based on vision. It mainly uses the approximation principle of circles to repair defective circles, then combines this with morphological processing to obtain effective edge points, and finally uses the least squares method to obtain elliptical parameters. By simulating the computer-generated images, the results demonstrate that the center fitting error of the simulated defect ellipses with major and minor axes of 600 and 400 pixels is less than 1 pixel, the major and minor axis fitting error is less than 3 pixels, and the tilt angle fitting error is less than 0.1\u00b0. Further, experimental verification was conducted on the engine injection hole. The measurement results show that the surface size deviation was less than 0.01 mm and the angle error was less than 0.15\u00b0, which means the parameters of defective ellipses can obtained quickly and effectively. It is thus suitable for engineering applications, and can provide visual guidance for the precise measurement of fiber probes.<\/jats:p>","DOI":"10.3390\/s23146433","type":"journal-article","created":{"date-parts":[[2023,7,17]],"date-time":"2023-07-17T01:06:36Z","timestamp":1689555996000},"page":"6433","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["A Method for Measuring Parameters of Defective Ellipse Based on Vision"],"prefix":"10.3390","volume":"23","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0184-9319","authenticated-orcid":false,"given":"He","family":"Zhang","sequence":"first","affiliation":[{"name":"Center of Ultra-Precision Optoelectronic Instrument, Harbin Institute of Technology, Harbin 150080, China"},{"name":"Key Lab of Ultra-Precision Intelligent Instrumentation, Harbin Institute of Technology, Ministry of Industry and Information Technology, Harbin 150080, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Li","family":"Wang","sequence":"additional","affiliation":[{"name":"Center of Ultra-Precision Optoelectronic Instrument, Harbin Institute of Technology, Harbin 150080, China"},{"name":"Key Lab of Ultra-Precision Intelligent Instrumentation, Harbin Institute of Technology, Ministry of Industry and Information Technology, Harbin 150080, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenya","family":"Liu","sequence":"additional","affiliation":[{"name":"Center of Ultra-Precision Optoelectronic Instrument, Harbin Institute of Technology, Harbin 150080, China"},{"name":"Key Lab of Ultra-Precision Intelligent Instrumentation, Harbin Institute of Technology, Ministry of Industry and Information Technology, Harbin 150080, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiwen","family":"Cui","sequence":"additional","affiliation":[{"name":"Center of Ultra-Precision Optoelectronic Instrument, Harbin Institute of Technology, Harbin 150080, China"},{"name":"Key Lab of Ultra-Precision Intelligent Instrumentation, Harbin Institute of Technology, Ministry of Industry and Information Technology, Harbin 150080, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiubin","family":"Tan","sequence":"additional","affiliation":[{"name":"Center of Ultra-Precision Optoelectronic Instrument, Harbin Institute of Technology, Harbin 150080, China"},{"name":"Key Lab of Ultra-Precision Intelligent Instrumentation, Harbin Institute of Technology, Ministry of Industry and Information Technology, Harbin 150080, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2023,7,15]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"452","DOI":"10.1016\/j.actaastro.2020.08.029","article-title":"Effect of self-excited instability on single liquid swirl injector flow characteristics","volume":"178","author":"Jeong","year":"2021","journal-title":"Acta Astronaut."},{"key":"ref_2","first-page":"67","article-title":"Center Extraction Method of Multiple and Overlapping Faculae Based on Ellipse Fitting","volume":"40","author":"Li","year":"2020","journal-title":"Acta Opt. 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