{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,16]],"date-time":"2026-05-16T03:58:41Z","timestamp":1778903921444,"version":"3.51.4"},"reference-count":33,"publisher":"MDPI AG","issue":"17","license":[{"start":{"date-parts":[[2023,8,22]],"date-time":"2023-08-22T00:00:00Z","timestamp":1692662400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Deutsche Forschungsgemeinschaft","award":["EXC-2070\u2014390732324\u2014PhenoRob"],"award-info":[{"award-number":["EXC-2070\u2014390732324\u2014PhenoRob"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Electromagnetic induction (EMI) systems are used for mapping the soil\u2019s electrical conductivity in near-surface applications. EMI measurements are commonly affected by time-varying external environmental factors, with temperature fluctuations being a big contributing factor. This makes it challenging to obtain stable and reliable data from EMI measurements. To mitigate these temperature drift effects, it is customary to perform a temperature drift calibration of the instrument in a temperature-controlled environment. This involves recording the apparent electrical conductivity (ECa) values at specific temperatures to obtain a look-up table that can subsequently be used for static ECa drift correction. However, static drift correction does not account for the delayed thermal variations of the system components, which affects the accuracy of drift correction. Here, a drift correction approach is presented that accounts for delayed thermal variations of EMI system components using two low-pass filters (LPF). Scenarios with uniform and non-uniform temperature distributions in the measurement device are both considered. The approach is developed using a total of 15 measurements with a custom-made EMI device in a wide range of temperature conditions ranging from 10 \u00b0C to 50 \u00b0C. The EMI device is equipped with eight temperature sensors spread across the device that simultaneously measure the internal ambient temperature during measurements. To parameterize the proposed correction approach, a global optimization algorithm called Shuffled Complex Evolution (SCE-UA) was used for efficient estimation of the calibration parameters. Using the presented drift model to perform corrections for each individual measurement resulted in a root mean square error (RMSE) of &lt;1 mSm\u22121 for all 15 measurements. This shows that the drift model can properly describe the drift of the measurement device. Performing a drift correction simultaneously for all datasets resulted in a RMSE &lt;1.2 mSm\u22121, which is considerably lower than the RMSE values of up to 4.5 mSm\u22121 obtained when using only a single LPF to perform drift corrections. This shows that the presented drift correction method based on two LPFs is more appropriate and effective for mitigating temperature drift effects.<\/jats:p>","DOI":"10.3390\/s23177322","type":"journal-article","created":{"date-parts":[[2023,8,22]],"date-time":"2023-08-22T09:10:56Z","timestamp":1692695456000},"page":"7322","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["Low-Pass Filters for a Temperature Drift Correction Method for Electromagnetic Induction Systems"],"prefix":"10.3390","volume":"23","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5868-4466","authenticated-orcid":false,"given":"Martial","family":"Tazifor Tchantcho","sequence":"first","affiliation":[{"name":"Central Institute of Engineering, Electronics and Analytics (ZEA-2), Forschungszentrum Juelich GmbH, 52428 Juelich, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1517-6597","authenticated-orcid":false,"given":"Egon","family":"Zimmermann","sequence":"additional","affiliation":[{"name":"Central Institute of Engineering, Electronics and Analytics (ZEA-2), Forschungszentrum Juelich GmbH, 52428 Juelich, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1327-0945","authenticated-orcid":false,"given":"Johan Alexander","family":"Huisman","sequence":"additional","affiliation":[{"name":"Institute of Bio- and Geosciences Agrosphere (IBG-3), Forschungszentrum Juelich GmbH, 52428 Juelich, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9278-4583","authenticated-orcid":false,"given":"Markus","family":"Dick","sequence":"additional","affiliation":[{"name":"Central Institute of Engineering, Electronics and Analytics (ZEA-2), Forschungszentrum Juelich GmbH, 52428 Juelich, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1587-8516","authenticated-orcid":false,"given":"Achim","family":"Mester","sequence":"additional","affiliation":[{"name":"Central Institute of Engineering, Electronics and Analytics (ZEA-2), Forschungszentrum Juelich GmbH, 52428 Juelich, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0682-7941","authenticated-orcid":false,"given":"Stefan","family":"van Waasen","sequence":"additional","affiliation":[{"name":"Central Institute of Engineering, Electronics and Analytics (ZEA-2), Forschungszentrum Juelich GmbH, 52428 Juelich, Germany"},{"name":"Faculty of Engineering, Communication Systems, University of Duisburg-Essen, 47057 Duisburg, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2023,8,22]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Heil, K., and Schmidhalter, U. 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