{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,13]],"date-time":"2026-05-13T06:32:33Z","timestamp":1778653953573,"version":"3.51.4"},"reference-count":35,"publisher":"MDPI AG","issue":"18","license":[{"start":{"date-parts":[[2023,9,6]],"date-time":"2023-09-06T00:00:00Z","timestamp":1693958400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/100016775","name":"Lublin University of Technology","doi-asserted-by":"publisher","award":["FD-20\/EE-2\/312"],"award-info":[{"award-number":["FD-20\/EE-2\/312"]}],"id":[{"id":"10.13039\/100016775","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>This paper analyzes the light-scattering standards currently used for calibration (verification) and systematic research in photo and spectrophotometry tools. The application specificities in studying the diffuse reflected and transmitted light during biomedical CCD photometry are considered. The advantages of a new class of photometers with non-spherical reflectors as ellipsoids of revolution truncated along the focal planes with the internal mirror surface are presented. The ellipsoid first focal plane is combined with the surface of the under-study media, and the second is optically coupled to the CCD image sensor plane. The principles of zone analysis of spatial distribution reproduced in photometric images on a CCD sensor are substantiated. The illuminance levels of photometric image areas in reflected and transmitted light from the thickness of the standard for the wavelength of laser radiation of 650 nm of different power was experimentally investigated. Polynomial dependences were obtained, and regression coefficients of the illuminance of the external and middle rings in photometric images for the reflected and transmitted light on the laser power were determined.<\/jats:p>","DOI":"10.3390\/s23187700","type":"journal-article","created":{"date-parts":[[2023,9,6]],"date-time":"2023-09-06T10:23:42Z","timestamp":1693995822000},"page":"7700","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":8,"title":["Optical Properties of Light-Scattering Standards for CCD Photometry"],"prefix":"10.3390","volume":"23","author":[{"given":"Denys","family":"Bondariev","sequence":"first","affiliation":[{"name":"Department of Computer-Integrated Technologies of Device Production, National Technical University of Ukraine \u201cIgor Sikorsky Kyiv Polytechnic Institute\u201d, Beresteiskyi Ave., 37, 03056 Kyiv, Ukraine"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Natalia","family":"Bezugla","sequence":"additional","affiliation":[{"name":"Department of Computer-Integrated Technologies of Device Production, National Technical University of Ukraine \u201cIgor Sikorsky Kyiv Polytechnic Institute\u201d, Beresteiskyi Ave., 37, 03056 Kyiv, Ukraine"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9032-9285","authenticated-orcid":false,"given":"Pawe\u0142","family":"Komada","sequence":"additional","affiliation":[{"name":"Department of Electronics and Information Technology, Lublin University of Technology, 38D Nadbystrzycka Street, 20-618 Lublin, Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nataliia","family":"Stelmakh","sequence":"additional","affiliation":[{"name":"Department of Computer-Integrated Technologies of Device Production, National Technical University of Ukraine \u201cIgor Sikorsky Kyiv Polytechnic Institute\u201d, Beresteiskyi Ave., 37, 03056 Kyiv, Ukraine"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0624-0585","authenticated-orcid":false,"given":"Mykhailo","family":"Bezuglyi","sequence":"additional","affiliation":[{"name":"Department of Computer-Integrated Technologies of Device Production, National Technical University of Ukraine \u201cIgor Sikorsky Kyiv Polytechnic Institute\u201d, Beresteiskyi Ave., 37, 03056 Kyiv, Ukraine"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2023,9,6]]},"reference":[{"key":"ref_1","unstructured":"Wang, L.V., and Wu, H. 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