{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,25]],"date-time":"2026-03-25T02:50:04Z","timestamp":1774407004968,"version":"3.50.1"},"reference-count":36,"publisher":"MDPI AG","issue":"24","license":[{"start":{"date-parts":[[2023,12,10]],"date-time":"2023-12-10T00:00:00Z","timestamp":1702166400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Innovation Center of Nuclear Power Technology for National Defense Industry","award":["HDLCXZX-2022-ZH-014"],"award-info":[{"award-number":["HDLCXZX-2022-ZH-014"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Structured light illumination is widely applied for surface defect detection due to its advantages in terms of speed, precision, and non-contact capabilities. However, the high reflectivity of metal surfaces often results in the loss of point clouds, thus reducing the measurement accuracy. In this paper, we propose a novel quaternary categorization strategy to address the high-reflectivity issue. Firstly, we classify the pixels into four types according to the phase map characteristics. Secondly, we apply tailored optimization and reconstruction strategies to each type of pixel. Finally, we fuse point clouds from multi-type pixels to accomplish precise measurements of high-reflectivity surfaces. Experimental results show that our strategy effectively reduces the high-reflectivity error when measuring metal surfaces and exhibits stronger robustness against noise compared to the conventional method.<\/jats:p>","DOI":"10.3390\/s23249740","type":"journal-article","created":{"date-parts":[[2023,12,11]],"date-time":"2023-12-11T14:12:51Z","timestamp":1702303971000},"page":"9740","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Quaternary Categorization Strategy for Reconstructing High-Reflectivity Surface in Structured Light Illumination"],"prefix":"10.3390","volume":"23","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2661-3852","authenticated-orcid":false,"given":"Bin","family":"Xu","sequence":"first","affiliation":[{"name":"School of Mechanical Engineering, Sichuan University, Chengdu 610065, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-0970-0831","authenticated-orcid":false,"given":"Shangcheng","family":"Qu","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Sichuan University, Chengdu 610065, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5732-8400","authenticated-orcid":false,"given":"Jinhua","family":"Li","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Sichuan University, Chengdu 610065, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhiyong","family":"Deng","sequence":"additional","affiliation":[{"name":"Nuclear Fuel and Material Institute, Nuclear Power Institute of China, Chengdu 610213, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hongyu","family":"Li","sequence":"additional","affiliation":[{"name":"Nuclear Fuel and Material Institute, Nuclear Power Institute of China, Chengdu 610213, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8274-8658","authenticated-orcid":false,"given":"Bo","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Sichuan University, Chengdu 610065, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Geyou","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Information and Communication Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6433-6529","authenticated-orcid":false,"given":"Kai","family":"Liu","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu 610065, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2023,12,10]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1007\/s41871-023-00217-2","article-title":"On the Three Paradigms of Manufacturing Advancement","volume":"6","author":"Fang","year":"2023","journal-title":"Nanomanuf. 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