{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T00:46:58Z","timestamp":1760143618850,"version":"build-2065373602"},"reference-count":25,"publisher":"MDPI AG","issue":"4","license":[{"start":{"date-parts":[[2024,2,6]],"date-time":"2024-02-06T00:00:00Z","timestamp":1707177600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100004837","name":"Spanish Ministry of Science and Innovation","doi-asserted-by":"publisher","award":["PID2022-142281OA-I00","EMC21_00364","P18-FR-2721","FEDER-UCA18-107380","AST22_00001","IRTP06_UCA"],"award-info":[{"award-number":["PID2022-142281OA-I00","EMC21_00364","P18-FR-2721","FEDER-UCA18-107380","AST22_00001","IRTP06_UCA"]}],"id":[{"id":"10.13039\/501100004837","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Department of Economy, Knowledge, Business and University of the Regional Government of Andalusia","award":["PID2022-142281OA-I00","EMC21_00364","P18-FR-2721","FEDER-UCA18-107380","AST22_00001","IRTP06_UCA"],"award-info":[{"award-number":["PID2022-142281OA-I00","EMC21_00364","P18-FR-2721","FEDER-UCA18-107380","AST22_00001","IRTP06_UCA"]}]},{"name":"Spanish Ministry of Science and Innovation, the Department of Economy, Knowledge, Business and University of the Regional Government of Andalusia, and the European Union (next generation EU)","award":["PID2022-142281OA-I00","EMC21_00364","P18-FR-2721","FEDER-UCA18-107380","AST22_00001","IRTP06_UCA"],"award-info":[{"award-number":["PID2022-142281OA-I00","EMC21_00364","P18-FR-2721","FEDER-UCA18-107380","AST22_00001","IRTP06_UCA"]}]},{"name":"University of C\u00e1diz","award":["PID2022-142281OA-I00","EMC21_00364","P18-FR-2721","FEDER-UCA18-107380","AST22_00001","IRTP06_UCA"],"award-info":[{"award-number":["PID2022-142281OA-I00","EMC21_00364","P18-FR-2721","FEDER-UCA18-107380","AST22_00001","IRTP06_UCA"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>In the pursuit of enhancing the technological maturity of innovative magnetic sensing techniques, opportunities presented by in-orbit platforms (IOD\/IOV experiments) provide a means to evaluate their in-flight capabilities. The Magnetic Experiments for the Laser Interferometer Space Antenna (MELISA) represent a set of in-flight demonstrators designed to characterize the low-frequency noise performance of a magnetic measurement system within a challenging space environment. In Low Earth Orbit (LEO) satellites, electronic circuits are exposed to high levels of radiation coming from energetic particles trapped by the Earth\u2019s magnetic field, solar flares, and galactic cosmic rays. A significant effect is the accidental bit-flipping in memory registers. This work presents an analysis of memory data redundancy resources using auxiliary second flash memory and exposes recovery options to retain critical data utilizing a duplicated data structure. A new and lightweight technique, CCM (Cross-Checking and Mirroring), is proposed to verify the proper performance of these techniques. Four alternative algorithms included in the original version of the MELISA software (Version v0.0) are presented. All the versions have been validated and evaluated according to various merit indicators. The evaluations showed similar performances for the proposed techniques, and they are valid for situations in which the flash memory suffers from more than one bit-flip. The overhead due to the introduction of additional instructions to the main code is negligible, even in the target experiment based on an 8-bit microcontroller.<\/jats:p>","DOI":"10.3390\/s24041065","type":"journal-article","created":{"date-parts":[[2024,2,6]],"date-time":"2024-02-06T12:38:24Z","timestamp":1707223104000},"page":"1065","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["A Lightweight Method for Detecting and Correcting Errors in Low-Frequency Measurements for In-Orbit Demonstrators"],"prefix":"10.3390","volume":"24","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9620-116X","authenticated-orcid":false,"given":"Mar\u00eda-\u00c1ngeles","family":"Cifredo-Chac\u00f3n","sequence":"first","affiliation":[{"name":"Electronic and Electromagnetic Design Group, Escuela Superior de Ingenier\u00eda, University of C\u00e1diz, Avda. de la Universidad, 10, E-11519 Puerto Real, C\u00e1diz, Spain"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3765-6498","authenticated-orcid":false,"given":"Jos\u00e9-Mar\u00eda","family":"Guerrero-Rodr\u00edguez","sequence":"additional","affiliation":[{"name":"Electronic and Electromagnetic Design Group, Escuela Superior de Ingenier\u00eda, University of C\u00e1diz, Avda. de la Universidad, 10, E-11519 Puerto Real, C\u00e1diz, Spain"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3746-9673","authenticated-orcid":false,"given":"Ignacio","family":"Mateos","sequence":"additional","affiliation":[{"name":"Electronic and Electromagnetic Design Group, Escuela Superior de Ingenier\u00eda, University of C\u00e1diz, Avda. de la Universidad, 10, E-11519 Puerto Real, C\u00e1diz, Spain"}]}],"member":"1968","published-online":{"date-parts":[[2024,2,6]]},"reference":[{"key":"ref_1","unstructured":"Amaro-Seoane, P. (2017). Laser Interferometer Space Antenna. arXiv."},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"165003","DOI":"10.1088\/0264-9381\/32\/16\/165003","article-title":"Interpolation of the magnetic field at the test masses in eLISA","volume":"32","author":"Mateos","year":"2015","journal-title":"Class. Quantum Gravity"},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"57","DOI":"10.1016\/j.sna.2015.09.021","article-title":"Low-frequency noise characterization of a magnetic field monitoring system using an anisotropic magnetoresistance","volume":"235","author":"Mateos","year":"2015","journal-title":"Sens. Actuators A Phys."},{"key":"ref_4","doi-asserted-by":"crossref","first-page":"311","DOI":"10.1016\/j.sna.2018.02.040","article-title":"Design of a CubeSat payload to test a magnetic measurement system for space-borne gravitational wave detectors","volume":"273","author":"Mateos","year":"2018","journal-title":"Sens. Actuators A Phys."},{"key":"ref_5","unstructured":"Mateos, I., Mar\u00eda-Moreno, C., Pacheco-Ramos, G., Quir\u00f3s-Oloz\u00e1bal, A., Guerrero-Rodr\u00edguez, J., Cifredo-Chac\u00f3n, M., del Sol, I., Cobos-S\u00e1nchez, C., V\u00edlchez-Membrilla, J., and Rivas, F. (2023). Highlights of Spanish Astrophysics XI, Proceedings of the XV Scientific Meeting of the Spanish Astronomical Society, La Laguna, Spain, 4\u20139 September 2022, Sociedad Espa\u00f1ola de Astronomia."},{"key":"ref_6","doi-asserted-by":"crossref","unstructured":"Maestro, J., and Reviriego, P. (2008, January 8\u201313). Study of the Effects of MBUs on the Reliability of a 150 nm SRAM Device. Proceedings of the 45th Annual Conference on Design Automation\u2014DAC\u201908, Anaheim, CA, USA.","DOI":"10.1145\/1391469.1391704"},{"key":"ref_7","doi-asserted-by":"crossref","first-page":"2433","DOI":"10.1109\/TNS.2005.860675","article-title":"Investigation of multi-bit upsets in a 150 nm technology SRAM device","volume":"52","author":"Radaelli","year":"2005","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_8","doi-asserted-by":"crossref","first-page":"332","DOI":"10.1109\/TNS.2016.2615719","article-title":"Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets in a NAND Flash Memory","volume":"64","author":"Chen","year":"2016","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_9","doi-asserted-by":"crossref","first-page":"390","DOI":"10.1109\/TNS.2021.3124484","article-title":"Total Ionizing Dose Effects on Long-Term Data Retention Characteristics of Commercial 3-D NAND Memories","volume":"69","author":"Buddhanoy","year":"2022","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_10","doi-asserted-by":"crossref","unstructured":"Neubauer, A., Freudenberger, J., and K\u00fchn, V. (2007). Coding Theory: Algorithms, Architectures and Applications, John Wiley & Sons.","DOI":"10.1002\/9780470519837"},{"key":"ref_11","doi-asserted-by":"crossref","first-page":"560","DOI":"10.1007\/s13198-017-0584-x","article-title":"Reliable flight computer for sounding rocket with dual redundancy: Design and implementation based on COTS parts","volume":"8","author":"Kahe","year":"2017","journal-title":"Int. J. Syst. Assur. Eng. Manag."},{"key":"ref_12","doi-asserted-by":"crossref","first-page":"17","DOI":"10.30699\/ijrrs.1.17","article-title":"Triple-Triple Redundant Reliable Onboard Computer Based on Multicore Microcontrollers","volume":"1","author":"Kahe","year":"2018","journal-title":"Int. J. Reliab. Risk Saf. Theory Appl."},{"key":"ref_13","unstructured":"Xilinx, A. (2022, December 18). Triple Modular Redundancy (TMR) v1.0 LogiCORE IP Product Guide (PG268). Available online: https:\/\/docs.xilinx.com\/r\/en-US\/pg268-tmr\/Feature-Summary."},{"key":"ref_14","unstructured":"LaMeres, B., Harkness, S., Handley, M., Moholt, P., Julien, C., Kaise, T., Klumpar, D., Mashburn, K., Springer, L., and Crum, G. (2015, January 10). RadSat\u2014Radiation Tolerant SmallSat Computer System. Proceedings of the AIAA\/USU Conference on Small Satellites, Logan, UT, USA."},{"key":"ref_15","doi-asserted-by":"crossref","first-page":"124","DOI":"10.1147\/rd.282.0124","article-title":"Error-correcting codes for semiconductor memory applications: A state-of-the-art review","volume":"58","author":"Chen","year":"1984","journal-title":"IBJ J. Res. Dev."},{"key":"ref_16","doi-asserted-by":"crossref","unstructured":"Fujiwara, E. (2006). Code Design for Dependable Systems: Theory and Practical Application, Wiley-Interscience.","DOI":"10.1002\/0471792748"},{"key":"ref_17","doi-asserted-by":"crossref","unstructured":"Castro, H.D. (2016, January 26\u201329). A correction code for multiple cells upsets in memory devices for space applications. Proceedings of the 14th IEEE International New Circuits and Systems Conference, Vancouver, BC, Canada.","DOI":"10.1109\/NEWCAS.2016.7604783"},{"key":"ref_18","doi-asserted-by":"crossref","first-page":"698","DOI":"10.1109\/TDMR.2017.2750718","article-title":"SEFI pro-tection for Nanosat 16-bit Chip On-Board Computer Memories","volume":"17","author":"Tabero","year":"2017","journal-title":"IEEE Trans. Device Mater. Reliab."},{"key":"ref_19","doi-asserted-by":"crossref","first-page":"147","DOI":"10.1002\/j.1538-7305.1950.tb00463.x","article-title":"Error detecting and error correcting codes","volume":"29","author":"Hamming","year":"1950","journal-title":"Bell Syst. Tech. J."},{"key":"ref_20","doi-asserted-by":"crossref","unstructured":"Argyrides, C., Zarandi, H., and Pradhan, D. (2007, January 26\u201328). Matrix Codes: Multiple Bit Upsets Tolerant Method for SRAM Memories. Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, Rome, Italy.","DOI":"10.1109\/DFT.2007.29"},{"key":"ref_21","doi-asserted-by":"crossref","unstructured":"Silva, F., Muniz, A., Silveira, J., and Marcon, C. (2020, January 24\u201328). An Adaptive Implementation of the Column Line Code (CLC) ECC. Proceedings of the 33rd Symposium on Integrated Circuits and Systems Design (SBCCI), Campinas, Brazil.","DOI":"10.1109\/SBCCI50935.2020.9189901"},{"key":"ref_22","doi-asserted-by":"crossref","first-page":"214","DOI":"10.1016\/j.microrel.2018.07.060","article-title":"An efficient EDAC approach for handling multiple bit upsets in memory array","volume":"88\u201390","author":"Goerl","year":"2018","journal-title":"Microelectron. Reliab."},{"key":"ref_23","doi-asserted-by":"crossref","unstructured":"Saiz-Adalid, L. (2013, January 24\u201327). Flexible Unequal Error Control Codes with Selectable Error Detection and Correction Levels. Proceedings of the 32th International Conference on Computer Safety, Reliability and Security (SAFECOMP), Toulouse, France.","DOI":"10.1007\/978-3-642-40793-2_17"},{"key":"ref_24","doi-asserted-by":"crossref","first-page":"2132","DOI":"10.1109\/TVLSI.2018.2837220","article-title":"Improving Error Correction Codes for Multiple-Cell Upsets in Space Applications","volume":"26","year":"2018","journal-title":"IEEE Trans. Very Large Scale Integr. (VLSI) Syst."},{"key":"ref_25","unstructured":"(2024, January 02). The Error Correcting Codes (ECC) Page. Available online: https:\/\/eccpage.com."}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/24\/4\/1065\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T13:56:04Z","timestamp":1760104564000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/24\/4\/1065"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,2,6]]},"references-count":25,"journal-issue":{"issue":"4","published-online":{"date-parts":[[2024,2]]}},"alternative-id":["s24041065"],"URL":"https:\/\/doi.org\/10.3390\/s24041065","relation":{},"ISSN":["1424-8220"],"issn-type":[{"type":"electronic","value":"1424-8220"}],"subject":[],"published":{"date-parts":[[2024,2,6]]}}}