{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,29]],"date-time":"2025-10-29T06:27:57Z","timestamp":1761719277682,"version":"build-2065373602"},"reference-count":43,"publisher":"MDPI AG","issue":"5","license":[{"start":{"date-parts":[[2024,2,22]],"date-time":"2024-02-22T00:00:00Z","timestamp":1708560000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61703391"],"award-info":[{"award-number":["61703391"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>To evaluate the lifetime and reliability of long-life, high-reliability products under limited resources, accelerated degradation testing (ADT) technology has been widely applied. Furthermore, the Bayesian evaluation method for ADT can comprehensively utilize historical information and overcome the limitations caused by small sample sizes, garnering significant attention from scholars. However, the traditional ADT Bayesian evaluation method has inherent shortcomings and limitations. Due to the constraints of small samples and an incomplete understanding of degradation mechanisms or accelerated mechanisms, the selected evaluation model may be inaccurate, leading to potentially inaccurate evaluation results. Therefore, describing and quantifying the impact of model uncertainty on evaluation results is a challenging issue that urgently needs resolution in the theoretical research of ADT Bayesian methods. This article addresses the issue of model uncertainty in the ADT Bayesian evaluation process. It analyzes the modeling process of ADT Bayesian and proposes a new model averaging evaluation method for ADT Bayesian based on relative entropy, which, to a certain extent, can resolve the issue of evaluation inaccuracy caused by model selection uncertainty. This study holds certain theoretical and engineering application value for conducting ADT Bayesian evaluation under model uncertainty.<\/jats:p>","DOI":"10.3390\/s24051426","type":"journal-article","created":{"date-parts":[[2024,2,22]],"date-time":"2024-02-22T11:28:47Z","timestamp":1708601327000},"page":"1426","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Bayesian Averaging Evaluation Method of Accelerated Degradation Testing Considering Model Uncertainty Based on Relative Entropy"],"prefix":"10.3390","volume":"24","author":[{"ORCID":"https:\/\/orcid.org\/0009-0004-3817-1435","authenticated-orcid":false,"given":"Tianji","family":"Zou","sequence":"first","affiliation":[{"name":"University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing 100049, China"},{"name":"Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing 100094, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenbo","family":"Wu","sequence":"additional","affiliation":[{"name":"University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing 100049, China"},{"name":"Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing 100094, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4602-8853","authenticated-orcid":false,"given":"Kai","family":"Liu","sequence":"additional","affiliation":[{"name":"University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing 100049, China"},{"name":"Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing 100094, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9755-2714","authenticated-orcid":false,"given":"Ke","family":"Wang","sequence":"additional","affiliation":[{"name":"University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing 100049, China"},{"name":"Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing 100094, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7087-529X","authenticated-orcid":false,"given":"Congmin","family":"Lv","sequence":"additional","affiliation":[{"name":"University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing 100049, China"},{"name":"Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing 100094, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2024,2,22]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"187","DOI":"10.1109\/24.387370","article-title":"Statistical tools for the rapid development and evaluation of high-reliability products","volume":"44","author":"Meeker","year":"1995","journal-title":"IEEE Trans. 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