{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T00:55:15Z","timestamp":1760144115452,"version":"build-2065373602"},"reference-count":18,"publisher":"MDPI AG","issue":"7","license":[{"start":{"date-parts":[[2024,3,24]],"date-time":"2024-03-24T00:00:00Z","timestamp":1711238400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Shandong Province Science and Technology SMEs Innovation Capability Enhancement Project","award":["2023TATSGC051","2023TATSGC014"],"award-info":[{"award-number":["2023TATSGC051","2023TATSGC014"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Fringe projection profilometry (FPP), with benefits such as high precision and a large depth of field, is a popular 3D optical measurement method widely used in precision reconstruction scenarios. However, the pixel brightness at reflective edges does not satisfy the conditions of the ideal pixel-wise phase-shifting model due to the influence of scene texture and system defocus, resulting in severe phase errors. To address this problem, we theoretically analyze the non-pixel-wise phase propagation model for texture edges and propose a reprojection strategy based on scene texture modulation. The strategy first obtains the reprojection weight mask by projecting typical FPP patterns and calculating the scene texture reflection ratio, then reprojects stripe patterns modulated by the weight mask to eliminate texture edge effects, and finally fuses coarse and refined phase maps to generate an accurate phase map. We validated the proposed method on various texture scenes, including a smooth plane, depth surface, and curved surface. Experimental results show that the root mean square error (RMSE) of the phase at the texture edge decreased by 53.32%, proving the effectiveness of the reprojection strategy in eliminating depth errors at texture edges.<\/jats:p>","DOI":"10.3390\/s24072075","type":"journal-article","created":{"date-parts":[[2024,3,25]],"date-time":"2024-03-25T12:32:36Z","timestamp":1711369956000},"page":"2075","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Phase Error Reduction for a Structured-Light 3D System Based on a Texture-Modulated Reprojection Method"],"prefix":"10.3390","volume":"24","author":[{"given":"Chenbo","family":"Shi","sequence":"first","affiliation":[{"name":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai\u2019an 271019, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zheng","family":"Qin","sequence":"additional","affiliation":[{"name":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai\u2019an 271019, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaowei","family":"Hu","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Tsinghua University, Beijing 100084, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2083-2704","authenticated-orcid":false,"given":"Changsheng","family":"Zhu","sequence":"additional","affiliation":[{"name":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai\u2019an 271019, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuanzheng","family":"Mo","sequence":"additional","affiliation":[{"name":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai\u2019an 271019, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zelong","family":"Li","sequence":"additional","affiliation":[{"name":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai\u2019an 271019, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shaojia","family":"Yan","sequence":"additional","affiliation":[{"name":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai\u2019an 271019, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yue","family":"Yu","sequence":"additional","affiliation":[{"name":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai\u2019an 271019, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiangteng","family":"Zang","sequence":"additional","affiliation":[{"name":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai\u2019an 271019, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-3865-963X","authenticated-orcid":false,"given":"Chun","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai\u2019an 271019, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2024,3,24]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Liberadzki, P., Adamczyk, M., Witkowski, M., and Sitnik, R. 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Lasers Eng."}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/24\/7\/2075\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T14:17:54Z","timestamp":1760105874000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/24\/7\/2075"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3,24]]},"references-count":18,"journal-issue":{"issue":"7","published-online":{"date-parts":[[2024,4]]}},"alternative-id":["s24072075"],"URL":"https:\/\/doi.org\/10.3390\/s24072075","relation":{},"ISSN":["1424-8220"],"issn-type":[{"type":"electronic","value":"1424-8220"}],"subject":[],"published":{"date-parts":[[2024,3,24]]}}}