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The performance and reliability of SSBs are limited by the formation and evolution of lithium dendrites at the interfaces between solid electrodes and solid electrolytes. We propose a new method based on optical coherence tomography (OCT) for in situ characterization of the internal state of solid-state batteries. OCT is a low-loss, high-resolution, non-invasive imaging technique that can provide real-time monitoring of cross-sectional images of internal structures of SSBs. The morphology, growth, and evolution of lithium dendrites at different stages of cycling under various conditions can be visualized and quantified by OCT. Furthermore, we validate and correlate the OCT results with scanning electron microscopy (SEM) and XPS, proving the accuracy and effectiveness of the OCT characterization method. We reveal the interfacial phenomena and challenges in SSBs and demonstrate the feasibility and advantages of OCT as a powerful tool for in situ and operando imaging of battery interfaces. This study provides new insights into the mechanisms and factors that affect SSB performance, safety, and lifetime, and suggests possible solutions for improvement and application in the field of applied energy.<\/jats:p>","DOI":"10.3390\/s24082392","type":"journal-article","created":{"date-parts":[[2024,4,9]],"date-time":"2024-04-09T08:55:12Z","timestamp":1712652912000},"page":"2392","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["A New Method for In-Situ Characterization of Solid-State Batteries Based on Optical Coherence Tomography"],"prefix":"10.3390","volume":"24","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2629-9173","authenticated-orcid":false,"given":"Jinze","family":"Li","sequence":"first","affiliation":[{"name":"School of Optoelectronic Engineering, Xidian University, Xi\u2019an 710126, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tianhong","family":"Ma","sequence":"additional","affiliation":[{"name":"Haishan Industrial Development Corporation, Shijiazhuang 050200, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xin","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Physics, Xidian University, Xi\u2019an 710126, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiawei","family":"Xi","sequence":"additional","affiliation":[{"name":"School of Optoelectronic Engineering, Xidian University, Xi\u2019an 710126, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Li","family":"Deng","sequence":"additional","affiliation":[{"name":"School of Optoelectronic Engineering, Xidian University, Xi\u2019an 710126, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0189-1784","authenticated-orcid":false,"given":"Hao","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Optoelectronic Engineering, Xidian University, Xi\u2019an 710126, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yanxin","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Optoelectronic Engineering, Xidian University, Xi\u2019an 710126, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiang","family":"Li","sequence":"additional","affiliation":[{"name":"School of Optoelectronic Engineering, Xidian University, Xi\u2019an 710126, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2024,4,9]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"11223","DOI":"10.1039\/C9CC04453A","article-title":"Indirect state-of-charge determination of all-solid-state battery cells by X-ray diffraction","volume":"55","author":"Bartsch","year":"2019","journal-title":"Chem. 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