{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T01:01:17Z","timestamp":1760144477644,"version":"build-2065373602"},"reference-count":19,"publisher":"MDPI AG","issue":"9","license":[{"start":{"date-parts":[[2024,4,26]],"date-time":"2024-04-26T00:00:00Z","timestamp":1714089600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Institute of Micromechanics and Photonics at the Warsaw University of Technology"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Grating (moir\u00e9) interferometry is one of the well-known methods for full-field in-plane displacement and strain measurement. There are many design solutions for grating interferometers, including systems with a microinterferometric waveguide head. This article proposes a modification to the conventional waveguide interferometer head, enabling the implementation of a polarization fringe phase shift for automatic fringe pattern analysis. This article presents both the theoretical considerations associated with the proposed solution and its experimental verification, along with the concept of in-plane displacement\/strain sensing using the described head.<\/jats:p>","DOI":"10.3390\/s24092774","type":"journal-article","created":{"date-parts":[[2024,4,26]],"date-time":"2024-04-26T09:26:02Z","timestamp":1714123562000},"page":"2774","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Grating (Moir\u00e9) Microinterferometric Displacement\/Strain Sensor with Polarization Phase Shift"],"prefix":"10.3390","volume":"24","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1390-1708","authenticated-orcid":false,"given":"Leszek","family":"Sa\u0142but","sequence":"first","affiliation":[{"name":"Warsaw University of Technology, 00-661 Warsaw, Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5491-6290","authenticated-orcid":false,"given":"Dariusz","family":"\u0141ukaszewski","sequence":"additional","affiliation":[{"name":"Warsaw University of Technology, 00-661 Warsaw, Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-0673-7751","authenticated-orcid":false,"given":"Aleksandra","family":"Piekarska","sequence":"additional","affiliation":[{"name":"Warsaw University of Technology, 00-661 Warsaw, Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2024,4,26]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"281","DOI":"10.1007\/BF02325143","article-title":"A historical review of moire interferometry","volume":"34","author":"Walker","year":"1994","journal-title":"Exp. 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Ed."},{"key":"ref_6","doi-asserted-by":"crossref","first-page":"273","DOI":"10.1016\/j.optlaseng.2018.03.032","article-title":"Deciphering dentin tissue biomechanics using digital moir\u00e9 interferometry: A narrative review","volume":"107","author":"Li","year":"2018","journal-title":"Opt. Lasers Eng."},{"key":"ref_7","doi-asserted-by":"crossref","unstructured":"Walker, C.A. (2004). Handbook of Moire Measurement, IOP Publishing Ltd.","DOI":"10.1887\/0750305223"},{"key":"ref_8","doi-asserted-by":"crossref","unstructured":"Post, D., Han, B., and Ifju, P. (1994). High Sensitivity Moire, Springer.","DOI":"10.1007\/978-1-4612-4334-2"},{"key":"ref_9","doi-asserted-by":"crossref","unstructured":"Sa\u0142but, L., and \u0141uczak, S. (2021). Concept of an In-Plane Displacement Sensor Based on Grating Interferometry with a Stepwise Change of Sensitivity. 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Des."},{"key":"ref_14","doi-asserted-by":"crossref","unstructured":"Millerd, J., Brock, N., Hayes, J., North-Morris, M., Kimbrough, B., and Wyant, J. (2004, January 2\u20136). Pixelated Phase-Mask Dynamic Interferometer. Proceedings of the Optical Science and Technology, the SPIE 49th Annual Meeting, Denver, CO, USA.","DOI":"10.1117\/12.560807"},{"key":"ref_15","doi-asserted-by":"crossref","first-page":"53","DOI":"10.1088\/0963-9659\/7\/1\/009","article-title":"Polarization-shifting method for step interferometry","volume":"7","author":"Frins","year":"1998","journal-title":"Pure Appl. Opt."},{"key":"ref_16","unstructured":"(2024, March 26). Phoenix 5.0 MP Polarization Camera (Sony IMX250MZR\/MYR). Available online: https:\/\/thinklucid.com\/."},{"key":"ref_17","doi-asserted-by":"crossref","unstructured":"Fujiwara, H. (2007). Spectroscopic Ellipsometry: Principles and Applications, John Wiley & Sons Inc.","DOI":"10.1002\/9780470060193"},{"key":"ref_18","unstructured":"Nomura, H., Takahashi, M., and Kyoh, S. (March, January 27). Physical conversion of Stokes parameters, which are multiplied by a general Mueller matrix, into Jones vectors applicable to the lithographic calculation. Proceedings of the SPIE Advanced Lithography, San Jose, CA, USA."},{"key":"ref_19","doi-asserted-by":"crossref","first-page":"156","DOI":"10.1088\/0022-3727\/23\/2\/005","article-title":"The polarisation characteristics of plane gratings","volume":"23","author":"Liang","year":"1990","journal-title":"J. Phys. D Appl. Phys."}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/24\/9\/2774\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T14:34:04Z","timestamp":1760106844000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/24\/9\/2774"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,26]]},"references-count":19,"journal-issue":{"issue":"9","published-online":{"date-parts":[[2024,5]]}},"alternative-id":["s24092774"],"URL":"https:\/\/doi.org\/10.3390\/s24092774","relation":{},"ISSN":["1424-8220"],"issn-type":[{"type":"electronic","value":"1424-8220"}],"subject":[],"published":{"date-parts":[[2024,4,26]]}}}