{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T19:06:40Z","timestamp":1785006400545,"version":"3.55.0"},"reference-count":31,"publisher":"MDPI AG","issue":"11","license":[{"start":{"date-parts":[[2024,5,22]],"date-time":"2024-05-22T00:00:00Z","timestamp":1716336000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Sichuan Science and Technology Program","award":["2023ZYD0132"],"award-info":[{"award-number":["2023ZYD0132"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Scanning ion conductance microscopy (SICM) enables the non-invasive three-dimensional imaging of live cells and other structures in physiological environments. However, when imaging complex samples, SICM faces challenges such as having a low temporal resolution during slow scanning and a reduced signal-to-noise ratio during fast scanning, making it difficult to simultaneously improve both temporal and spatial resolution. To address these issues, this paper proposes an algorithm for enhancing image resolution under high-speed scanning. Firstly, scanning images are preprocessed using a median filtering algorithm to remove the salt-and-pepper noise generated during high-speed scanning. Next, the Canny edge detection algorithm is employed to extract the edges of the image targets. To avoid blurring the edges, the new edge-directed interpolation (NEDI) algorithm is then used to fill the edges, while non-edge areas are filled using bilinear interpolation, thereby enhancing the image resolution. Finally, the peak signal-to-noise ratio (PSNR) and structural similarity index (SSIM) are used to analyze the imaging of articular chondrocytes. The results show that under a scanning speed of 480 nm\/ms, the proposed algorithm improves the temporal resolution of imaging by 60% compared to traditional 2\u00d7 resolution imaging, increases the peak signal-to-noise ratio of the scanning images by 7 dB, and achieves a structural similarity of 0.97. Therefore, the proposed algorithm effectively removes noise during high-speed scanning and improves the SICM scanning imaging resolution, thereby avoiding the reduction in temporal resolution when scanning larger resolution samples and effectively enhancing the performance of SICM scanning imaging.<\/jats:p>","DOI":"10.3390\/s24113291","type":"journal-article","created":{"date-parts":[[2024,5,22]],"date-time":"2024-05-22T07:56:11Z","timestamp":1716364571000},"page":"3291","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["Research on an SICM Scanning Image Resolution Enhancement Algorithm"],"prefix":"10.3390","volume":"24","author":[{"given":"Zhenhua","family":"Quan","sequence":"first","affiliation":[{"name":"School of Information Engineering, Southwest University of Science and Technology, Mianyang 621010, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shilin","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Information Engineering, Southwest University of Science and Technology, Mianyang 621010, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaobo","family":"Liao","sequence":"additional","affiliation":[{"name":"School of Information Engineering, Southwest University of Science and Technology, Mianyang 621010, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bin","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Information Engineering, Southwest University of Science and Technology, Mianyang 621010, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Liang","family":"Luo","sequence":"additional","affiliation":[{"name":"School of Information Engineering, Southwest University of Science and Technology, Mianyang 621010, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2024,5,22]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"2","DOI":"10.3901\/JME.2008.11.002","article-title":"Research Progress of Micro-nano Manufacturing in China","volume":"44","author":"Wang","year":"2008","journal-title":"J. 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