{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,3]],"date-time":"2026-03-03T16:46:12Z","timestamp":1772556372915,"version":"3.50.1"},"reference-count":25,"publisher":"MDPI AG","issue":"12","license":[{"start":{"date-parts":[[2024,6,9]],"date-time":"2024-06-09T00:00:00Z","timestamp":1717891200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Samsung Electronics Co., Ltd","award":["IO210209-08405-01"],"award-info":[{"award-number":["IO210209-08405-01"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>A design for a pogo-pin probe card featuring a metallic socket is proposed to eliminate signal leakage and coupling loss in a multi-port environment. The proposed metallic pogo-pin socket includes a metal wall structure between adjacent pogo pins, ensuring complete isolation. This metal wall offers an advantage in removing coupling issues between pogo pins that can occur with typical dielectric pogo-pin sockets. The designed probe card is fabricated as a prototype and verified for its performance. Measurement results using a test through line show that coupled power is minimized, providing a low-loss transmission performance of \u22122.14 dB to an RF chip at 50 GHz, all within a compact size. Although the dielectric spacer used to secure the pogo pins allows for some leakage, it can maintain a low coupling performance of under \u221215 dB in the millimeter-wave band. The prototype probe card can deliver an RF signal to a 5G circuit with a low loss of \u22120.7 dB at 28 GHz and \u22121.9 dB at 39 GHz frequency. The designed probe card is capable of transmitting multiple RF signals to the RF system without signal distortion in a multi-port environment.<\/jats:p>","DOI":"10.3390\/s24123745","type":"journal-article","created":{"date-parts":[[2024,6,10]],"date-time":"2024-06-10T08:59:06Z","timestamp":1718009946000},"page":"3745","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["50 GHz Four-Port Coupling-Reduced Probe Card Utilizing Pogo Pins Housed in Custom Metallic Socket"],"prefix":"10.3390","volume":"24","author":[{"given":"K. M.","family":"Lee","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Korea University, Seoul 02841, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. S.","family":"Kim","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea University, Seoul 02841, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Ahn","sequence":"additional","affiliation":[{"name":"Samsung Electronics Co., Ltd., Suwon 16677, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Park","sequence":"additional","affiliation":[{"name":"Samsung Electronics Co., Ltd., Suwon 16677, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-8624-8978","authenticated-orcid":false,"given":"J.","family":"Myeong","sequence":"additional","affiliation":[{"name":"Samsung Electronics Co., Ltd., Suwon 16677, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Kim","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea University, Seoul 02841, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2024,6,9]]},"reference":[{"key":"ref_1","unstructured":"Lee, S., Kim, S., and Choi, J. 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Proceedings of the 2014 IEEE ISEMC, Raleigh, NC, USA.","DOI":"10.1109\/ISEMC.2014.6898981"}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/24\/12\/3745\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T14:56:03Z","timestamp":1760108163000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/24\/12\/3745"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,9]]},"references-count":25,"journal-issue":{"issue":"12","published-online":{"date-parts":[[2024,6]]}},"alternative-id":["s24123745"],"URL":"https:\/\/doi.org\/10.3390\/s24123745","relation":{},"ISSN":["1424-8220"],"issn-type":[{"value":"1424-8220","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,6,9]]}}}