{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T06:23:55Z","timestamp":1777530235945,"version":"3.51.4"},"reference-count":41,"publisher":"MDPI AG","issue":"13","license":[{"start":{"date-parts":[[2024,6,26]],"date-time":"2024-06-26T00:00:00Z","timestamp":1719360000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100009105","name":"Ministry of Internal Affairs and Communications","doi-asserted-by":"publisher","award":["JPMI10001"],"award-info":[{"award-number":["JPMI10001"]}],"id":[{"id":"10.13039\/501100009105","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>In this study, we developed and demonstrated a millimeter-wave electric field imaging system using an electro-optic crystal and a highly sensitive polarization measurement technique using a polarization image sensor, which was fabricated using a 0.35-\u00b5m standard CMOS process. The polarization image sensor was equipped with differential amplifiers that amplified the difference between the 0\u00b0 and 90\u00b0 pixels. With the amplifier, the signal-to-noise ratio at low incident light levels was improved. Also, an optical modulator and a semiconductor optical amplifier were used to generate an optical local oscillator (LO) signal with a high modulation accuracy and sufficient optical intensity. By combining the amplified LO signal and a highly sensitive polarization imaging system, we successfully performed millimeter-wave electric field imaging with a spatial resolution of 30\u00d760 \u00b5m at a rate of 1 FPS, corresponding to 2400 pixels\/s.<\/jats:p>","DOI":"10.3390\/s24134138","type":"journal-article","created":{"date-parts":[[2024,6,26]],"date-time":"2024-06-26T09:29:33Z","timestamp":1719394173000},"page":"4138","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["Millimeter-Wave Band Electro-Optical Imaging System Using Polarization CMOS Image Sensor and Amplified Optical Local Oscillator Source"],"prefix":"10.3390","volume":"24","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3496-919X","authenticated-orcid":false,"given":"Ryoma","family":"Okada","sequence":"first","affiliation":[{"name":"Division of Materials Science, Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5, Takayama, Ikoma 630-0192, Nara, Japan"},{"name":"Radio Research Institute, National Institute of Information and Communications Technology, 4-2-1, Nukui-Kitamach, Koganei 184-8795, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-0343-3055","authenticated-orcid":false,"given":"Maya","family":"Mizuno","sequence":"additional","affiliation":[{"name":"Radio Research Institute, National Institute of Information and Communications Technology, 4-2-1, Nukui-Kitamach, Koganei 184-8795, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8259-7861","authenticated-orcid":false,"given":"Tomoaki","family":"Nagaoka","sequence":"additional","affiliation":[{"name":"Radio Research Institute, National Institute of Information and Communications Technology, 4-2-1, Nukui-Kitamach, Koganei 184-8795, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7689-1186","authenticated-orcid":false,"given":"Hironari","family":"Takehara","sequence":"additional","affiliation":[{"name":"Division of Materials Science, Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5, Takayama, Ikoma 630-0192, Nara, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7155-9018","authenticated-orcid":false,"given":"Makito","family":"Haruta","sequence":"additional","affiliation":[{"name":"Department of Opto-Electronic System Engineering, Chitose Institute of Science and Technology, 758-65, Bibi, Chitose 066-8655, Hokkaido, Japan"},{"name":"Institute for Research Initiatives, Nara Institute of Science and Technology, 8916-5, Takayama, Ikoma 630-0192, Nara, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5669-154X","authenticated-orcid":false,"given":"Hiroyuki","family":"Tashiro","sequence":"additional","affiliation":[{"name":"Division of Materials Science, Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5, Takayama, Ikoma 630-0192, Nara, Japan"},{"name":"Department of Health Sciences, Faculty of Medical Sciences, Kyushu University, 3-1-1, Maidashi, Higashi-ku 812-8582, Fukuoka, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8194-9020","authenticated-orcid":false,"given":"Jun","family":"Ohta","sequence":"additional","affiliation":[{"name":"Institute for Research Initiatives, Nara Institute of Science and Technology, 8916-5, Takayama, Ikoma 630-0192, Nara, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5718-3958","authenticated-orcid":false,"given":"Kiyotaka","family":"Sasagawa","sequence":"additional","affiliation":[{"name":"Division of Materials Science, Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5, Takayama, Ikoma 630-0192, Nara, Japan"},{"name":"Radio Research Institute, National Institute of Information and Communications Technology, 4-2-1, Nukui-Kitamach, Koganei 184-8795, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2024,6,26]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"446","DOI":"10.1109\/TAP.1973.1140518","article-title":"Measurement of near fields of antennas and scatterers","volume":"21","author":"Dyson","year":"1973","journal-title":"IEEE Trans. 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