{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,12]],"date-time":"2026-03-12T00:08:33Z","timestamp":1773274113071,"version":"3.50.1"},"reference-count":32,"publisher":"MDPI AG","issue":"13","license":[{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Spanish Ministry of Economy and Competitiveness","award":["PID2022-137680OB-C31"],"award-info":[{"award-number":["PID2022-137680OB-C31"]}]},{"name":"Spanish Ministry of Economy and Competitiveness","award":["PID2022-137680OB-C32"],"award-info":[{"award-number":["PID2022-137680OB-C32"]}]},{"name":"Spanish Ministry of Economy and Competitiveness","award":["PRECEDER\u2013CEI-5-RNM138"],"award-info":[{"award-number":["PRECEDER\u2013CEI-5-RNM138"]}]},{"name":"Junta de Andalucia and FEDER Founds","award":["PID2022-137680OB-C31"],"award-info":[{"award-number":["PID2022-137680OB-C31"]}]},{"name":"Junta de Andalucia and FEDER Founds","award":["PID2022-137680OB-C32"],"award-info":[{"award-number":["PID2022-137680OB-C32"]}]},{"name":"Junta de Andalucia and FEDER Founds","award":["PRECEDER\u2013CEI-5-RNM138"],"award-info":[{"award-number":["PRECEDER\u2013CEI-5-RNM138"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>This paper presents an innovative technique, Advanced Predictor of Electrical Parameters, based on machine learning methods to predict the degradation of electronic components under the effects of radiation. The term degradation refers to the way in which electrical parameters of the electronic components vary with the irradiation dose. This method consists of two sequential steps defined as \u2018recognition of degradation patterns in the database\u2019 and \u2018degradation prediction of new samples without any kind of irradiation\u2019. The technique can be used under two different approaches called \u2018pure data driven\u2019 and \u2018model based\u2019. In this paper, the use of Advanced Predictor of Electrical Parameters is shown for bipolar transistors, but the methodology is sufficiently general to be applied to any other component.<\/jats:p>","DOI":"10.3390\/s24134276","type":"journal-article","created":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T10:14:46Z","timestamp":1719828886000},"page":"4276","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["A Machine Learning Approach to Predict Radiation Effects in Microelectronic Components"],"prefix":"10.3390","volume":"24","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4260-9212","authenticated-orcid":false,"given":"Fernando","family":"Morilla","sequence":"first","affiliation":[{"name":"Departamento de Inform\u00e1tica y Autom\u00e1tica, UNED, Juan del Rosal 16, 28040 Madrid, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1622-3984","authenticated-orcid":false,"given":"Jes\u00fas","family":"Vega","sequence":"additional","affiliation":[{"name":"Laboratorio Nacional de Fusi\u00f3n, CIEMAT, Complutense 40, 28040 Madrid, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7652-5338","authenticated-orcid":false,"given":"Sebasti\u00e1n","family":"Dormido-Canto","sequence":"additional","affiliation":[{"name":"Departamento de Inform\u00e1tica y Autom\u00e1tica, UNED, Juan del Rosal 16, 28040 Madrid, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2326-6173","authenticated-orcid":false,"given":"Amor","family":"Romero-Maestre","sequence":"additional","affiliation":[{"name":"Centro Nacional de Aceleradores, Universidad de Sevilla, CSIC, JA, Avda. 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