{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T15:50:39Z","timestamp":1772121039449,"version":"3.50.1"},"reference-count":24,"publisher":"MDPI AG","issue":"13","license":[{"start":{"date-parts":[[2024,7,2]],"date-time":"2024-07-02T00:00:00Z","timestamp":1719878400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Fundamental Research Funds for the Central Universities","award":["2023JBZY041"],"award-info":[{"award-number":["2023JBZY041"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>Capacitors are crucial components in power electronic converters, responsible for harmonic elimination, energy buffering, and voltage stabilization. However, they are also the most susceptible to damage due to their operational environment. Accurate temperature estimation of capacitors is essential for monitoring their condition and ensuring the reliability of the converter system. This paper presents a novel method for estimating the core temperature of capacitors using a long short-term memory (LSTM) algorithm. The approach incorporates a continued training mechanism to adapt to variable load conditions in converters. Experimental results demonstrate the proposed method\u2019s high accuracy and robustness, making it suitable for real-time capacitor temperature monitoring in practical applications.<\/jats:p>","DOI":"10.3390\/s24134304","type":"journal-article","created":{"date-parts":[[2024,7,2]],"date-time":"2024-07-02T09:01:39Z","timestamp":1719910899000},"page":"4304","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Converter Capacitor Temperature Estimation Based on Continued Training LSTM under Variable Load Conditions"],"prefix":"10.3390","volume":"24","author":[{"ORCID":"https:\/\/orcid.org\/0009-0004-6656-9360","authenticated-orcid":false,"given":"Xiaoteng","family":"Dai","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Beijing Jiaotong University, Beijing 100044, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yiqiang","family":"Chen","sequence":"additional","affiliation":[{"name":"China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou 510610, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9259-8270","authenticated-orcid":false,"given":"Jie","family":"Chen","sequence":"additional","affiliation":[{"name":"China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou 510610, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ruichang","family":"Qiu","sequence":"additional","affiliation":[{"name":"China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou 510610, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2024,7,2]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Dang, H.-L., and Kwak, S. 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