{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T01:19:23Z","timestamp":1760145563282,"version":"build-2065373602"},"reference-count":8,"publisher":"MDPI AG","issue":"16","license":[{"start":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T00:00:00Z","timestamp":1722902400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>As astronauts stay in the China Space Station for a long time during the operation phase, how to ensure the long-term safety of the scientific experimental rack (SER) in the field of space application is a problem that needs to be solved urgently. Each SER in the field of space station applications is a complex system that faces risks from different hazards. At present, there is no generalized monitoring and diagnosis system for the common risks faced by the SER. In this paper, a generalized safety fault diagnosis system is proposed to ensure the long-term safe and stable work of SERs in orbit, considering the actual risks faced by the SER. With the design of a generalized main control board, a measurement and control board, and an SSPC (solid-state power controller) board, the software and hardware cooperate to realize the acquisition of various physical quantities, data processing, power supply and distribution management, and other functions. Combined with relevant fault detection algorithms, the real-time detection and diagnosis of the relevant risks, abnormality warnings, and fault disposal operations are realized, which can effectively ensure the safety of the payloads in the field of space application, astronauts, and the space-station system.<\/jats:p>","DOI":"10.3390\/s24165102","type":"journal-article","created":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T15:24:16Z","timestamp":1722957856000},"page":"5102","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Design and Implementation of a Generalized Safety Fault Diagnosis System for China Space Station Scientific Experimental Rack"],"prefix":"10.3390","volume":"24","author":[{"given":"Yifeng","family":"Wang","sequence":"first","affiliation":[{"name":"Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing 100094, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-3817-1435","authenticated-orcid":false,"given":"Tianji","family":"Zou","sequence":"additional","affiliation":[{"name":"Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing 100094, China"},{"name":"University of Chinese Academy of Sciences, Beijing 100049, China"}]},{"given":"Lin","family":"Guo","sequence":"additional","affiliation":[{"name":"Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing 100094, China"}]},{"given":"Chenchen","family":"Zhang","sequence":"additional","affiliation":[{"name":"Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing 100094, China"}]},{"given":"Lu","family":"Zhang","sequence":"additional","affiliation":[{"name":"Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing 100094, China"},{"name":"University of Chinese Academy of Sciences, Beijing 100049, China"}]}],"member":"1968","published-online":{"date-parts":[[2024,8,6]]},"reference":[{"key":"ref_1","first-page":"1","article-title":"Chinese Space Station Project Overall Vision","volume":"19","author":"Zhou","year":"2013","journal-title":"Manned Spacefl."},{"key":"ref_2","first-page":"35","article-title":"System-level safety assurance technology and application for space station mission manned spacecraft","volume":"32","author":"Haifeng","year":"2023","journal-title":"Spacecr. 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Control"},{"key":"ref_7","first-page":"148","article-title":"Design of small intelligent distributor based on multi-channel SSPC","volume":"50","author":"Xutao","year":"2021","journal-title":"Electromech. Eng. Technol."},{"key":"ref_8","first-page":"77","article-title":"1-Wire bus digital temperature sensor DS18B20 principle and application","volume":"21","author":"Gang","year":"2005","journal-title":"Mod. Electron. Technol."}],"container-title":["Sensors"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1424-8220\/24\/16\/5102\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T15:31:05Z","timestamp":1760110265000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1424-8220\/24\/16\/5102"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,8,6]]},"references-count":8,"journal-issue":{"issue":"16","published-online":{"date-parts":[[2024,8]]}},"alternative-id":["s24165102"],"URL":"https:\/\/doi.org\/10.3390\/s24165102","relation":{},"ISSN":["1424-8220"],"issn-type":[{"type":"electronic","value":"1424-8220"}],"subject":[],"published":{"date-parts":[[2024,8,6]]}}}