{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,7]],"date-time":"2026-07-07T00:56:08Z","timestamp":1783385768919,"version":"3.54.6"},"reference-count":30,"publisher":"MDPI AG","issue":"16","license":[{"start":{"date-parts":[[2024,8,14]],"date-time":"2024-08-14T00:00:00Z","timestamp":1723593600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>The best method to prevent error due to inhomogeneity is to use a new thermocouple design\u2014the thermocouple with controlled temperature field (TCTF). It uses the auxiliary furnace to control the temperature field along its legs. Such a design allows setting and maintaining the temperature field along the thermocouple (TC) legs for the sensor. Error due to inhomogeneity of TCs cannot appear in a stable temperature field. However, the auxiliary furnace and TCs, to control the temperature field, have errors, so the temperature field along the main TC is maintained with some error. This leads to residual error due to acquired inhomogeneity of the TCTF. We constructed the mathematical models to fit the experimental data of error due to drift for the type K TC. The authors used the constructed models to study error due to inhomogeneity of the TCTF and the conventional type K TC under considerable changes in temperature field. The main results of modelling are as follows: (i) if the changes in temperature field exceed 7 \u00b0C, error due to inhomogeneity of the TCTF is lesser than that of the conventional TC; (ii) the maximum error due to inhomogeneity of the conventional type K TC is 10.75 \u00b0C; (iii) the maximum error due to inhomogeneity of the TCTF is below 0.2 \u00b0C.<\/jats:p>","DOI":"10.3390\/s24165256","type":"journal-article","created":{"date-parts":[[2024,8,14]],"date-time":"2024-08-14T09:20:51Z","timestamp":1723627251000},"page":"5256","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Simulating Error Due to Acquired Thermoelectric Inhomogeneity"],"prefix":"10.3390","volume":"24","author":[{"given":"Zida","family":"Li","sequence":"first","affiliation":[{"name":"Detroit Green Technology Institute, Hubei University of Technology, Wuhan 430068, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jingliang","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Computer Science, Hubei University of Technology, Wuhan 430068, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2024,8,14]]},"reference":[{"key":"ref_1","unstructured":"Birch, J. 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