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Therefore, it is essential to analyze and suppress the noises in the key analog circuits, which are the main noise sources. This study presents an optimized front-end readout circuit and noise suppression methods. First, the noise analysis of the front-end readout circuit is carried out with theoretical derivation to clarify the main noise contributors. To suppress the output noise, an improved readout circuit based on the T-resistor networks is proposed, and the corresponding noise equation is derived in detail. In addition, the noise analysis of the critical circuits of the detection and control system, such as the inverting amplifiers, the first-order low-pass filters, and the first-order high-pass filters, is carried out, and the noise suppression strategy with the optimization of the resistances and is proposed. Taking the inverting amplifier as an example, the theoretical derivation is verified by measuring and comparing the output noises of different resistance schemes. In addition, the output noises of the gyroscope before and after circuit optimization are measured. Experimental results demonstrate that the output noise with the circuit optimization is reduced from 60 \u03bcV\/Hz1\/2 to 30 \u03bcV\/Hz1\/2 and the bias instability is reduced from 3.8 deg\/h to 1.38 deg\/h. In addition, the ARW is significantly improved from 0.035 deg\/h1\/2 to 0.018 deg\/h1\/2, which indicates that the proposed noise analysis and suppression methods are effective and feasible.<\/jats:p>","DOI":"10.3390\/s24196283","type":"journal-article","created":{"date-parts":[[2024,9,30]],"date-time":"2024-09-30T07:19:37Z","timestamp":1727680777000},"page":"6283","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["Noise Analysis and Suppression Methods for the Front-End Readout Circuit of a Microelectromechanical Systems Gyroscope"],"prefix":"10.3390","volume":"24","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0826-3596","authenticated-orcid":false,"given":"Chunhua","family":"He","sequence":"first","affiliation":[{"name":"School of Computer, Guangdong University of Technology, Guangzhou 510006, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8234-4816","authenticated-orcid":false,"given":"Yingyu","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Computer, Guangdong University of Technology, Guangzhou 510006, China"},{"name":"Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou 511370, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaoman","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Computer, Guangdong University of Technology, Guangzhou 510006, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0832-2218","authenticated-orcid":false,"given":"Heng","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Computer, Guangdong University of Technology, Guangzhou 510006, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lianglun","family":"Cheng","sequence":"additional","affiliation":[{"name":"School of Computer, Guangdong University of Technology, Guangzhou 510006, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Guizhen","family":"Yan","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Science and Technology on Micro\/Nano Fabrication, Institute of Microelectronics, Peking University, Beijing 100871, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qinwen","family":"Huang","sequence":"additional","affiliation":[{"name":"Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou 511370, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2024,9,28]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Samatas, G.G., and Pachidis, T.P. 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