{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,12]],"date-time":"2025-10-12T04:39:43Z","timestamp":1760243983863,"version":"build-2065373602"},"reference-count":28,"publisher":"MDPI AG","issue":"4","license":[{"start":{"date-parts":[[2009,4,24]],"date-time":"2009-04-24T00:00:00Z","timestamp":1240531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"<jats:p>In this paper the uncertainty of a robust photometer circuit (RPC) was estimated. Here, the RPC was considered as a measurement system, having input quantities that were inexactly known, and output quantities that consequently were also inexactly known. Input quantities represent information obtained from calibration certificates, specifications of manufacturers, and tabulated data. Output quantities describe the transfer function of the electrical part of the photodiode. Input quantities were the electronic components of the RPC, the parameters of the model of the photodiode and its sensitivity at 670 nm. The output quantities were the coefficients of both numerator and denominator of the closed-loop transfer function of the RPC. As an example, the gain and phase shift of the RPC versus frequency was evaluated from the transfer function, with their uncertainties and correlation coefficient. Results confirm the robustness of photodiode design.<\/jats:p>","DOI":"10.3390\/s90403149","type":"journal-article","created":{"date-parts":[[2009,4,24]],"date-time":"2009-04-24T09:35:29Z","timestamp":1240565729000},"page":"3149-3160","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["Measurement Uncertainty Estimation of a Robust Photometer Circuit"],"prefix":"10.3390","volume":"9","author":[{"given":"Wilmar","family":"Hernandez","sequence":"first","affiliation":[{"name":"Department of Circuits and Systems in the EUIT de Telecomunicaci\u00f3n at the Universidad Polit\u00e9cnica de Madrid (UPM), Campus Sur UPM, Ctra. Valencia km 7, Madrid 28031, Spain"}]},{"given":"Jes\u00fas","family":"De Vicente","sequence":"additional","affiliation":[{"name":"Department of Applied Physics in the ETSI Industriales at the Universidad Polit\u00e9cnica de Madrid, Calle Jos\u00e9 Gutierrez Abascal 2, Madrid 28006, Spain"}]}],"member":"1968","published-online":{"date-parts":[[2009,4,24]]},"reference":[{"key":"ref_1","unstructured":"Adams, T.M. (2002). G104-A2LA Guide for estimation of measurement uncertainty in testing, American Association for Laboratory Accreditation."},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"612","DOI":"10.1166\/sl.2007.232","article-title":"Photometer circuit based on positive and negative feedback compensations","volume":"5","author":"Hernandez","year":"2007","journal-title":"Sens. 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