{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T01:36:28Z","timestamp":1760060188865,"version":"build-2065373602"},"reference-count":19,"publisher":"MDPI AG","issue":"8","license":[{"start":{"date-parts":[[2025,8,11]],"date-time":"2025-08-11T00:00:00Z","timestamp":1754870400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Symmetry"],"abstract":"<jats:p>Following the success of the first edition of our Special Issue \u201cElectron Diffraction and Structural Imaging\u201d, we present Volume II, featuring new and innovative contributions that further expand the scope and depth of this rapidly evolving field [...]<\/jats:p>","DOI":"10.3390\/sym17081287","type":"journal-article","created":{"date-parts":[[2025,8,11]],"date-time":"2025-08-11T08:10:32Z","timestamp":1754899832000},"page":"1287","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Special Issue: Electron Diffraction and Structural Imaging\u2014Volume II"],"prefix":"10.3390","volume":"17","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6110-6322","authenticated-orcid":false,"given":"Partha Pratim","family":"Das","sequence":"first","affiliation":[{"name":"NanoMEGAS SPRL, Rue \u00c8mile Claus 49 bte 9, 1050 Brussels, Belgium"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5529-6468","authenticated-orcid":false,"given":"Arturo","family":"Ponce-Pedraza","sequence":"additional","affiliation":[{"name":"Department of Physics and Astronomy, The University of Texas at San Antonio, San Antonio, TX 78249, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9543-9064","authenticated-orcid":false,"given":"Enrico","family":"Mugnaioli","sequence":"additional","affiliation":[{"name":"Department of Earth Sciences, University of Pisa, Via S. Maria, 53-56126 Pisa, Italy"}]},{"given":"Stavros","family":"Nicolopoulos","sequence":"additional","affiliation":[{"name":"NanoMEGAS SPRL, Rue \u00c8mile Claus 49 bte 9, 1050 Brussels, Belgium"}]}],"member":"1968","published-online":{"date-parts":[[2025,8,11]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"768","DOI":"10.1038\/33823","article-title":"Electron microscopy image enhanced","volume":"392","author":"Haider","year":"1998","journal-title":"Nature"},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"24","DOI":"10.1038\/nmeth.3694","article-title":"The development of cryo-EM into a mainstream structural biology technique","volume":"13","author":"Nogales","year":"2016","journal-title":"Nat. Methods"},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"271","DOI":"10.1016\/0304-3991(94)90039-6","article-title":"Double conical beam-rocking system for measurement of integrated electron diffraction intensities","volume":"53","author":"Vincent","year":"1994","journal-title":"Ultramicroscopy"},{"key":"ref_4","doi-asserted-by":"crossref","first-page":"563","DOI":"10.1017\/S1431927619000497","article-title":"Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond","volume":"25","author":"Ophus","year":"2019","journal-title":"Microsc. Microanal."},{"key":"ref_5","doi-asserted-by":"crossref","first-page":"1315","DOI":"10.1021\/acscentsci.9b00394","article-title":"3D Electron Diffraction: The Nanocrystallography Revolution","volume":"5","author":"Gemmi","year":"2019","journal-title":"ACS Cent. Sci."},{"key":"ref_6","doi-asserted-by":"crossref","first-page":"86","DOI":"10.1016\/j.ultramic.2016.08.007","article-title":"Current status and future directions for in situ transmission electron microscopy","volume":"170","author":"Taheri","year":"2016","journal-title":"Ultramicroscopy"},{"key":"ref_7","doi-asserted-by":"crossref","first-page":"23","DOI":"10.1111\/jmi.12065","article-title":"Orientation and phase mapping in the transmission electron microscope using precession-assisted diffraction spot recognition: State-of-the-art results","volume":"252","author":"Viladot","year":"2013","journal-title":"J. Microsc."},{"key":"ref_8","doi-asserted-by":"crossref","first-page":"20599","DOI":"10.1021\/acsnano.5c01764","article-title":"3D Electron Diffraction on Nanoparticles: Minimal Size and Associated Dynamical Effects","volume":"19","author":"Rebecchi","year":"2025","journal-title":"ACS Nano"},{"key":"ref_9","doi-asserted-by":"crossref","first-page":"102784","DOI":"10.1016\/j.nantod.2025.102784","article-title":"In Situ Nanometer-Resolution Strain and Orientation Mapping for Gas-Solid Reactions via Precession-Assisted Four-Dimensional Scanning Transmission Electron Microscopy","volume":"64","author":"Sun","year":"2025","journal-title":"Nano Today"},{"key":"ref_10","doi-asserted-by":"crossref","first-page":"3993","DOI":"10.1021\/acs.chemmater.5c00108","article-title":"Effect of a Two-Step Temperature-Swing Synthesis on Coarse-Grained LiNiO2 Secondary Particles Characterized by Scanning Transmission Electron Microscopy","volume":"37","author":"Demuth","year":"2025","journal-title":"Chem. Mater."},{"key":"ref_11","doi-asserted-by":"crossref","unstructured":"Andrusenko, I., Hitchen, J., Mugnaioli, E., Potticary, J., Hall, S.R., and Gemmi, M. (2022). Two New Organic Co-Crystals Based on Acetamidophenol Molecules. Symmetry, 14.","DOI":"10.3390\/sym14030431"},{"key":"ref_12","doi-asserted-by":"crossref","unstructured":"Hernandez-Robles, A., Romeu, D., and Ponce, A. (2022). On the Mechanism Controlling the Relative Orientation of Graphene Bi-Layers. Symmetry, 14.","DOI":"10.3390\/sym14040719"},{"key":"ref_13","doi-asserted-by":"crossref","unstructured":"Jandl, C., Steinfeld, G., Li, K., Pang, P.K.C., Choi, C.L., Wang, C., Simoncic, P., and Williams, I.D. (2023). Absolute Structure Determination of Chiral Zinc Tartrate MOFs by 3D Electron Diffraction. Symmetry, 15.","DOI":"10.3390\/sym15050983"},{"key":"ref_14","doi-asserted-by":"crossref","unstructured":"Chou, Y.-J., Borisenko, K.B., Das, P.P., Nicolopoulos, S., Gemmi, M., and Kirkland, A.I. (2023). Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films\u2014Implications for Structural Studies. Symmetry, 15.","DOI":"10.3390\/sym15071291"},{"key":"ref_15","doi-asserted-by":"crossref","unstructured":"Passuti, S., Varignon, J., David, A., and Boullay, P. (2023). Scanning Precession Electron Tomography (SPET) for Structural Analysis of Thin Films along Their Thickness. Symmetry, 15.","DOI":"10.3390\/sym15071459"},{"key":"ref_16","doi-asserted-by":"crossref","unstructured":"Truong, K.-N., Ito, S., Wojciechowski, J.M., G\u00f6b, C.R., Sch\u00fcrmann, C.J., Yamano, A., Del Campo, M., Okunishi, E., Aoyama, Y., and Mihira, T. (2023). Making the Most of 3D Electron Diffraction: Best Practices to Handle a New Tool. Symmetry, 15.","DOI":"10.3390\/sym15081555"},{"key":"ref_17","doi-asserted-by":"crossref","unstructured":"Snopi\u0144ski, P., and Matus, K. (2023). Characterisation of Microstructure and Special Grain Boundaries in LPBF AlSi10Mg Alloy Subjected to the KoBo Extrusion Process. Symmetry, 15.","DOI":"10.3390\/sym15091634"},{"key":"ref_18","doi-asserted-by":"crossref","unstructured":"Gallegos-Moncayo, K., Jean, J., Folastre, N., Jamali, A., and Demorti\u00e8re, A. (2024). Investigating Cathode Electrolyte Interphase Formation in NMC 811 Primary Particles through Advanced 4D-STEM ACOM Analysis. Symmetry, 16.","DOI":"10.3390\/sym16030301"},{"key":"ref_19","doi-asserted-by":"crossref","unstructured":"\u00d6rs, T., Deroche, I., Chatelard, C., Dodin, M., Martinez-Franco, R., Tuel, A., and Paillaud, J.-L. (2024). Determination of Na+ Cation Locations in Nanozeolite ECR-1 Using a 3D ED Method. Symmetry, 16.","DOI":"10.3390\/sym16040477"}],"container-title":["Symmetry"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/2073-8994\/17\/8\/1287\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,9]],"date-time":"2025-10-09T18:27:52Z","timestamp":1760034472000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/2073-8994\/17\/8\/1287"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,8,11]]},"references-count":19,"journal-issue":{"issue":"8","published-online":{"date-parts":[[2025,8]]}},"alternative-id":["sym17081287"],"URL":"https:\/\/doi.org\/10.3390\/sym17081287","relation":{},"ISSN":["2073-8994"],"issn-type":[{"type":"electronic","value":"2073-8994"}],"subject":[],"published":{"date-parts":[[2025,8,11]]}}}