{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T15:26:59Z","timestamp":1773761219361,"version":"3.50.1"},"reference-count":19,"publisher":"MDPI AG","issue":"2","license":[{"start":{"date-parts":[[2014,5,23]],"date-time":"2014-05-23T00:00:00Z","timestamp":1400803200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Symmetry"],"abstract":"<jats:p>An innovative classification and back-propagation-network tree (CABPN tree) approach is proposed in this study to estimate the cycle time of a job in a wafer fabrication factory, which is one of the most important tasks in controlling the wafer fabrication factory. The CABPN tree approach is an extension from the traditional classification and regression tree (CART) approach. In CART, the cycle times of jobs of the same branch are estimated with the same value, which is far from accurate. To tackle this problem, the CABPN tree approach replaces the constant estimate with variant estimates. To this end, the cycle times of jobs of the same branch are estimated with a BPN, and may be different. In this way, the estimation accuracy can be improved. In addition, to determine the optimal location of the splitting point on a node, the symmetric partition with incremental re-learning (SP-IR) algorithm is proposed and illustrated with an example. The applicability of the CABPN tree approach is shown with a real case. The experimental results supported its effectiveness over several existing methods.<\/jats:p>","DOI":"10.3390\/sym6020409","type":"journal-article","created":{"date-parts":[[2014,5,23]],"date-time":"2014-05-23T12:46:27Z","timestamp":1400849187000},"page":"409-426","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["The Symmetric-Partitioning and Incremental-Relearning Classification and Back-Propagation-Network Tree Approach for Cycle Time Estimation in Wafer Fabrication"],"prefix":"10.3390","volume":"6","author":[{"given":"Toly","family":"Chen","sequence":"first","affiliation":[{"name":"Department of Industrial Engineering and Systems Management, Feng Chia University,  100 Wenhwa Road, Seatwen, Taichung City 407, Taiwan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2014,5,23]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Inoue, T., Ishii, Y., Igarashi, K., Takagi, H., Muneta, T., and Imaoka, K. (2006, January 25\u201327). Conveyer Belt Model to analyze cycle time conditions in a semiconductor manufacturing line. Tokyo, Japan.","DOI":"10.1109\/ISSM.2006.4493026"},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"156","DOI":"10.1109\/66.136277","article-title":"On the relationship between yield and cycle time in semiconductor wafer fabrication","volume":"5","author":"Wein","year":"1992","journal-title":"IEEE Trans. Semicond. Manuf."},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"902","DOI":"10.1017\/S0305004100036094","article-title":"The single server queue in heavy traffic","volume":"57","author":"Kingman","year":"1961","journal-title":"Math. Proc. Camb. Philos. Soc."},{"key":"ref_4","doi-asserted-by":"crossref","first-page":"202","DOI":"10.1287\/opre.36.2.202","article-title":"Empirical evaluation of a queueing network model for semiconductor wafer fabrication","volume":"36","author":"Chen","year":"1988","journal-title":"Oper. Res."},{"key":"ref_5","doi-asserted-by":"crossref","first-page":"165","DOI":"10.1109\/TSM.2007.895215","article-title":"Due-date assignment for wafer fabrication under demand variate environment","volume":"20","author":"Pearn","year":"2007","journal-title":"IEEE Trans. Semicond. Manuf."},{"key":"ref_6","doi-asserted-by":"crossref","first-page":"838","DOI":"10.1016\/j.cie.2013.09.010","article-title":"An effective fuzzy collaborative forecasting approach for predicting the job cycle time in wafer fabrication","volume":"66","author":"Chen","year":"2013","journal-title":"Comput. Ind. Eng."},{"key":"ref_7","doi-asserted-by":"crossref","first-page":"889","DOI":"10.1080\/00207720902974553","article-title":"A fuzzy-neural knowledge-based system for job completion time prediction and internal due date assignment in a wafer fabrication plant","volume":"40","author":"Chen","year":"2009","journal-title":"Int. J. Syst. Sci."},{"key":"ref_8","doi-asserted-by":"crossref","first-page":"2281","DOI":"10.1007\/s10845-011-0572-y","article-title":"Manufacturing intelligence to forecast and reduce semiconductor cycle time","volume":"23","author":"Chien","year":"2012","journal-title":"J. Intell. Manuf."},{"key":"ref_9","doi-asserted-by":"crossref","first-page":"575","DOI":"10.1007\/s00170-006-0741-x","article-title":"A hybrid look-ahead SOM-FBPN and FIR system for wafer lot output time prediction and achievability evaluation","volume":"35","author":"Chen","year":"2007","journal-title":"Int. J. Adv. Manuf. Technol."},{"key":"ref_10","doi-asserted-by":"crossref","first-page":"211","DOI":"10.1016\/S1568-4946(02)00066-2","article-title":"A fuzzy back propagation network for output time prediction in a wafer fab","volume":"2","author":"Chen","year":"2003","journal-title":"Appl. Soft Comput."},{"key":"ref_11","first-page":"55","article-title":"A neural networks approach for due-date assignment in a wafer fabrication factory","volume":"10","author":"Chang","year":"2003","journal-title":"Int. J. Ind. Eng."},{"key":"ref_12","doi-asserted-by":"crossref","first-page":"55","DOI":"10.1016\/j.aei.2006.10.002","article-title":"An intelligent hybrid system for wafer lot output time prediction","volume":"21","author":"Chen","year":"2007","journal-title":"Adv. Eng. Inform."},{"key":"ref_13","first-page":"740478:1","article-title":"An iterative procedure for optimizing the performance of the fuzzy-neural job cycle time estimation approach in a wafer fabrication factory","volume":"2013","author":"Chen","year":"2013","journal-title":"Math. Probl. Eng."},{"key":"ref_14","doi-asserted-by":"crossref","first-page":"271","DOI":"10.1007\/s11063-006-9027-4","article-title":"A hybrid SOM-BPN approach to lot output time prediction in a wafer fab","volume":"24","author":"Chen","year":"2006","journal-title":"Neural Process. Lett."},{"key":"ref_15","unstructured":"Breiman, I., Friedman, J.H., Olsen, R.A., and Stone, C.J. (1984). Classification and Regression Trees, Wadsworth."},{"key":"ref_16","unstructured":"Steinburg, D., and Colla, P. (1997). Classification and Regression Trees, Salford Systems."},{"key":"ref_17","first-page":"1","article-title":"Bangla user adaptive word Speech recognition: Approaches and comparisons","volume":"3","author":"Firoze","year":"2013","journal-title":"Int. J. Fuzzy Syst. Appl."},{"key":"ref_18","unstructured":"Hecht-Nielson, R. (1987, January 21\u201324). Kolmogorov's mapping neural network existence theorem. San Diego, CA, USA."},{"key":"ref_19","doi-asserted-by":"crossref","first-page":"457","DOI":"10.1029\/93WR01494","article-title":"Optimization of groundwater remediation using artificial neural networks with parallel solute transport modeling","volume":"30","author":"Rogers","year":"1994","journal-title":"Water Resour. Res."}],"container-title":["Symmetry"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/2073-8994\/6\/2\/409\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T21:11:46Z","timestamp":1760217106000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/2073-8994\/6\/2\/409"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,5,23]]},"references-count":19,"journal-issue":{"issue":"2","published-online":{"date-parts":[[2014,6]]}},"alternative-id":["sym6020409"],"URL":"https:\/\/doi.org\/10.3390\/sym6020409","relation":{},"ISSN":["2073-8994"],"issn-type":[{"value":"2073-8994","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,5,23]]}}}