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Imaging"],"abstract":"<jats:p>Computational imaging shifts part of the aberration correction from optical hardware to algorithms, offering a viable path toward compact, simplified systems. However, overexposed regions\u2014often caused by phenomena such as water-body reflections\u2014can readily induce severe ringing artifacts in reconstructed images. To address this problem, we propose a Ringing-perceptive Cooperative Reconstruction Network (RPCR-Net). This network integrates a learned Wiener filter and a field-of-view shared kernel prediction network (FOV-KPN) for feature extraction and innovatively incorporates a combined regularization mechanism that leverages a Local Maximum Gradient Prior and a multi-scale ringing measurement model within its loss function to suppress artifacts while preserving details. Validated on a constructed overexposed image dataset, RPCR-Net improves the Peak Signal-to-Noise Ratio (PSNR) from 29.08 dB to 37.06 dB and the Structural Similarity Index Measure (SSIM) from 0.8795 to 0.9549. Experiments on real-world scenes further confirm its capability to suppress ringing artifacts while maintaining visual quality. The proposed method can generate high-quality images such as image reconstruction and robustness improvement in optical systems.<\/jats:p>","DOI":"10.3390\/jimaging12090403","type":"journal-article","created":{"date-parts":[[2026,8,26]],"date-time":"2026-08-26T15:04:32Z","timestamp":1787756672000},"page":"403","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["A Deep Reconstruction Framework with Ringing Artifact Suppression for Overexposed Remote Sensing Image Restoration"],"prefix":"10.3390","volume":"12","author":[{"given":"Dinghao","family":"Yang","sequence":"first","affiliation":[{"name":"Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China"},{"name":"MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China"},{"name":"Shanghai Frontiers Science Center of Digital Optics, Shanghai 200092, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yujie","family":"Xing","sequence":"additional","affiliation":[{"name":"Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China"},{"name":"MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China"},{"name":"Shanghai Frontiers Science Center of Digital Optics, Shanghai 200092, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hongmei","family":"Li","sequence":"additional","affiliation":[{"name":"Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China"},{"name":"MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China"},{"name":"Shanghai Frontiers Science Center of Digital Optics, Shanghai 200092, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-5962-7193","authenticated-orcid":false,"given":"Xuquan","family":"Wang","sequence":"additional","affiliation":[{"name":"Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China"},{"name":"MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China"},{"name":"Shanghai Frontiers Science Center of Digital Optics, Shanghai 200092, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiong","family":"Dun","sequence":"additional","affiliation":[{"name":"Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China"},{"name":"MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China"},{"name":"Shanghai Frontiers Science Center of Digital Optics, Shanghai 200092, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2026,8,26]]},"reference":[{"key":"ref_1","first-page":"1611001","article-title":"Advances in Wide-Field High-Resolution Imaging Systems (Invited)","volume":"2","author":"Li","year":"2025","journal-title":"Acta Opt. 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