{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,19]],"date-time":"2026-01-19T15:08:53Z","timestamp":1768835333712,"version":"3.49.0"},"reference-count":36,"publisher":"MDPI AG","issue":"4","license":[{"start":{"date-parts":[[2021,2,5]],"date-time":"2021-02-05T00:00:00Z","timestamp":1612483200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Collaborative Research in Engineering, Science and Technology (CREST)","award":["P14C1-17\/001"],"award-info":[{"award-number":["P14C1-17\/001"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Materials"],"abstract":"<jats:p>The evolution of internal compressive stress from the intermetallic compound (IMC) Cu6Sn5 growth is commonly acknowledged as the key inducement initiating the nucleation and growth of tin (Sn) whisker. This study investigates the effect of Sn-0.7Cu-0.05Ni on the nucleation and growth of Sn whisker under continuous mechanical stress induced. The Sn-0.7Cu-0.05Ni solder joint has a noticeable effect of suppression by diminishing the susceptibility of nucleation and growth of Sn whisker. By using a synchrotron micro X-ray fluorescence (\u00b5-XRF) spectroscopy, it was found that a small amount of Ni alters the microstructure of Cu6Sn5 to form a (Cu,Ni)6Sn5 intermetallic layer. The morphology structure of the (Cu,Ni)6Sn5 interfacial intermetallic layer and Sn whisker growth were investigated by scanning electron microscope (SEM) in secondary and backscattered electron imaging mode, which showed that there is a strong correlation between the formation of Sn whisker and the composition of solder alloy. The thickness of the (Cu,Ni)6Sn5 IMC interfacial layer was relatively thinner and more refined, with a continuous fine scallop-shaped IMC interfacial layer, and consequently enhanced a greater incubation period for the nucleation and growth of the Sn whisker. These verification outcomes proposes a scientifically foundation to mitigate Sn whisker growth in lead-free solder joint.<\/jats:p>","DOI":"10.3390\/ma14040738","type":"journal-article","created":{"date-parts":[[2021,2,5]],"date-time":"2021-02-05T03:34:02Z","timestamp":1612496042000},"page":"738","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["Effect of Ni on the Suppression of Sn Whisker Formation in Sn-0.7Cu Solder Joint"],"prefix":"10.3390","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5102-8511","authenticated-orcid":false,"given":"Aimi Noorliyana","family":"Hashim","sequence":"first","affiliation":[{"name":"Centre of Excellence Geopolymer and Green Technology, Universiti Malaysia Perlis (UniMAP), Taman Muhibah, Jejawi, Arau, Perlis 02600, Malaysia"},{"name":"Faculty of Chemical Engineering Technology, Universiti Malaysia Perlis (UniMAP), Taman Muhibah, Jejawi, Arau, Perlis 02600, Malaysia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohd Arif Anuar Mohd","family":"Salleh","sequence":"additional","affiliation":[{"name":"Centre of Excellence Geopolymer and Green Technology, Universiti Malaysia Perlis (UniMAP), Taman Muhibah, Jejawi, Arau, Perlis 02600, Malaysia"},{"name":"Faculty of Chemical Engineering Technology, Universiti Malaysia Perlis (UniMAP), Taman Muhibah, Jejawi, Arau, Perlis 02600, Malaysia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9292-749X","authenticated-orcid":false,"given":"Andrei Victor","family":"Sandu","sequence":"additional","affiliation":[{"name":"Centre of Excellence Geopolymer and Green Technology, Universiti Malaysia Perlis (UniMAP), Taman Muhibah, Jejawi, Arau, Perlis 02600, Malaysia"},{"name":"Faculty of Materials Science and Engineering, Gheorghe Asachi Technical University, D. Mangeron 41, 700050 Iasi, Romania"},{"name":"Romanian Inventors Forum, Str. Sf. P. Movila 3, L11, 700089 Iasi, Romania"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Muhammad Mahyiddin","family":"Ramli","sequence":"additional","affiliation":[{"name":"School of Microelectronic Engineering, Pauh Putra Campus, University Malaysia Perlis (UniMAP), Arau, Perlis 02600, Malaysia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Khor Chu","family":"Yee","sequence":"additional","affiliation":[{"name":"Faculty of Engineering Technology (FETech), Universiti Malaysia Perlis (UniMAP), Level 1, Block S2, UniCITI Alam Campus, Sungai Chuchuh, Padang Besar, Perlis 02100, Malaysia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Noor Zaimah","family":"Mohd Mokhtar","sequence":"additional","affiliation":[{"name":"Centre of Excellence Geopolymer and Green Technology, Universiti Malaysia Perlis (UniMAP), Taman Muhibah, Jejawi, Arau, Perlis 02600, Malaysia"},{"name":"Faculty of Chemical Engineering Technology, Universiti Malaysia Perlis (UniMAP), Taman Muhibah, Jejawi, Arau, Perlis 02600, Malaysia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jitrin","family":"Chaiprapa","sequence":"additional","affiliation":[{"name":"Synchrotron Light Research Institute (SLRI), 111 University Avenue, Muang District, Nakhon Ratchasima 30000, Thailand"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"1968","published-online":{"date-parts":[[2021,2,5]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"350","DOI":"10.1016\/j.tsf.2005.09.088","article-title":"Behavior of tin whisker formation and growth on lead-free solder finish","volume":"504","author":"Kim","year":"2006","journal-title":"Thin Solid Film."},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"1737","DOI":"10.1016\/j.microrel.2008.04.013","article-title":"Effects of continuously applied stress on tin whisker growth","volume":"48","author":"Lin","year":"2008","journal-title":"Microelectron. 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