{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,23]],"date-time":"2026-07-23T00:16:31Z","timestamp":1784765791044,"version":"3.55.0"},"reference-count":16,"publisher":"MDPI AG","issue":"15","license":[{"start":{"date-parts":[[2025,8,5]],"date-time":"2025-08-05T00:00:00Z","timestamp":1754352000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62274069"],"award-info":[{"award-number":["62274069"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Materials"],"abstract":"<jats:p>Direct copper-plated ceramic (DPC) substrates have emerged as a favored solution for power device packaging due to their unique technical advantages. AuSn, characterized by its high hermeticity and environmental adaptability, represents the optimal sealing technology for DPC substrates. Through the application of vacuum sintering techniques and adjustment of peak temperatures (325 \u00b0C, 340 \u00b0C, and 355 \u00b0C), the morphology and composition of interfacial compounds were systematically investigated, along with an analysis of their formation mechanisms. A gradient aging experiment was designed (125 \u00b0C\/150 \u00b0C\/175 \u00b0C \u00d7 oxygen\/argon dual atmosphere \u00d7 600 h) to elucidate the synergistic effects of environmental temperature and atmosphere on the growth of intermetallic compounds (IMCs). The results indicate that the primary reaction in the sealing weld seam involves Ni interacting with Au-Sn to form (Ni, Au)3Sn2 and Au5Sn. However, upon completion of the sealing process, this reaction remains incomplete, leading to a coexistence state of (Ni, Au)3Sn2, Au5Sn, and AuSn. Additionally, Ni diffuses into the weld seam center via dendritic fracture and locally forms secondary phases such as \u03b4(Ni) and \u03b6\u2019(Ni). These findings suggest that the weld seam interface exhibits a complex, irregular, and asymmetric microstructure comprising multiple coexisting compounds. It was determined that Tpeak = 325 \u00b0C to 340 \u00b0C represents the ideal welding temperature range, where the weld seam morphology, width, and Ni diffusion degree achieve optimal states, ensuring excellent device hermeticity. Aging studies further demonstrate that IMC growth remains within controllable limits. These findings address critical gaps in the understanding of the microstructural evolution and interface characteristics of asymmetric welded joints formed by multi-material systems.<\/jats:p>","DOI":"10.3390\/ma18153678","type":"journal-article","created":{"date-parts":[[2025,8,5]],"date-time":"2025-08-05T15:56:16Z","timestamp":1754409376000},"page":"3678","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Research on the Influence Mechanism of Thermal Load on the Au-Sn Sealing Weld State on Three-Dimensional DPC Substrates"],"prefix":"10.3390","volume":"18","author":[{"given":"Heran","family":"Zhao","sequence":"first","affiliation":[{"name":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China"},{"name":"The 47th Institute of China Electronics Technology Group Corporation, Shenyang 110135, China"},{"name":"Liaoning Key Laboratory of Flexible Electronic Micro-Nano Integrated System, Shenyang 110135, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lihua","family":"Cao","sequence":"additional","affiliation":[{"name":"Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"ShiZhao","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronic Science and Technology, Hainan University, Haikou 570228, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"He","family":"Zhang","sequence":"additional","affiliation":[{"name":"The 13th Institute of China Electronics Technology Group Corporation, Shijiazhuang 050051, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mingxiang","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2025,8,5]]},"reference":[{"key":"ref_1","first-page":"257","article-title":"Research Status and New Progress of Ceramic Substrate","volume":"46","author":"Lu","year":"2021","journal-title":"Semicond. 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Standard for Test Methods for Mechanical Properties on Ordinary Concrete (Standard No. GB\/T 50081-2019)."}],"container-title":["Materials"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/1996-1944\/18\/15\/3678\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,9]],"date-time":"2025-10-09T18:23:51Z","timestamp":1760034231000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/1996-1944\/18\/15\/3678"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,8,5]]},"references-count":16,"journal-issue":{"issue":"15","published-online":{"date-parts":[[2025,8]]}},"alternative-id":["ma18153678"],"URL":"https:\/\/doi.org\/10.3390\/ma18153678","relation":{},"ISSN":["1996-1944"],"issn-type":[{"value":"1996-1944","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,8,5]]}}}