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LSP increased the surface roughness from 0.25 \u00b1 0.05 \u03bcm to 0.6 \u00b1 0.1 \u03bcm, raised Vickers hardness by 12\u201316%, and introduced compressive residual stresses of 400\u2013950 MPa. Microstructural analysis indicated that LSP promoted \u03b2-phase formation and grain refinement in SM alloys, while reducing the \u03b1\u2032-phase fraction in AM alloys. Electrochemical testing revealed that all LSP-treated specimens exhibited active\u2013passive transitions, unlike the stable passive response of unpeened samples. The corrosion rate (icorr) decreased from approximately 5 \u00d7 10\u22126 to 1 \u00d7 10\u22126 A\u00b7cm\u22122 after LSP. During 24 h potentiostatic polarization at 1.3 VSCE, the passive current density stabilized at 10\u22128\u201310\u22127 A\u00b7cm\u22122, with LSP AM specimens exhibiting values approximately twice those of their unpeened counterparts. Mott\u2013Schottky analysis confirmed that the donor density (ND) in the SM alloy changed negligibly after LSP, indicating a stable passive alloy. In contrast, the ND for the AM alloy increased from 1 \u00d7 1019 to 3 \u00d7 1019 cm\u22123, suggesting an oxygen-vacancy-rich, less stable passive film. Overall, LSP reduces the corrosion rate primarily through the introduction of compressive residual stress but may impair the long-term passive-film stability of AM Ti\u20136Al\u20134V owing to defect generation. In contrast, the SM alloy maintains passive-film stability under identical treatment conditions.<\/jats:p>","DOI":"10.3390\/ma19071432","type":"journal-article","created":{"date-parts":[[2026,4,6]],"date-time":"2026-04-06T01:12:33Z","timestamp":1775437953000},"page":"1432","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Effect of Laser Shock Peening on the Passivation Behavior of Subtractively and Additively Manufactured Ti\u20136Al\u20134V Alloys in pH 2 Buffer Solution"],"prefix":"10.3390","volume":"19","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4697-4252","authenticated-orcid":false,"given":"JuHee","family":"Lee","sequence":"first","affiliation":[{"name":"Department of Advanced Materials Engineering, Chosun University, 309 Pilmundaero, Dong-gu, Gwangju 61452, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6190-6592","authenticated-orcid":false,"given":"Jan","family":"Kaufman","sequence":"additional","affiliation":[{"name":"HiLASE Centre, Institute of Physics of the Czech Academy of Sciences, Za Radnic\u00ed 828, 252 41 Doln\u00ed B\u0159e\u017eany, Czech Republic"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8813-8298","authenticated-orcid":false,"given":"Martin","family":"Divok\u00fd","sequence":"additional","affiliation":[{"name":"HiLASE Centre, Institute of Physics of the Czech Academy of Sciences, Za Radnic\u00ed 828, 252 41 Doln\u00ed B\u0159e\u017eany, Czech Republic"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9567-2875","authenticated-orcid":false,"given":"Tom\u00e1\u0161","family":"Mocek","sequence":"additional","affiliation":[{"name":"HiLASE Centre, Institute of Physics of the Czech Academy of Sciences, Za Radnic\u00ed 828, 252 41 Doln\u00ed B\u0159e\u017eany, Czech Republic"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jan","family":"Brajer","sequence":"additional","affiliation":[{"name":"HiLASE Centre, Institute of Physics of the Czech Academy of Sciences, Za Radnic\u00ed 828, 252 41 Doln\u00ed B\u0159e\u017eany, Czech Republic"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3565-4958","authenticated-orcid":false,"given":"HeeJin","family":"Jang","sequence":"additional","affiliation":[{"name":"Department of Advanced Materials Engineering, Chosun University, 309 Pilmundaero, Dong-gu, Gwangju 61452, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2026,4,3]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Madigana, C.S., Vaddula, A., Yerramsetti, S.D., and Buddaraju, K.M. 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