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6142109KF201905"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Micromachines"],"abstract":"<jats:p>Scanning tunneling microscopy (STM) can image material surfaces with atomic resolution, making it a useful tool in the areas of physics and materials. Many materials are synthesized at micron size, especially few-layer materials. Limited by their complex structure, very few STMs are capable of directly positioning and imaging a micron-sized sample with atomic resolution. Traditional STMs are designed to study the material behavior induced by temperature variation, while the physical properties induced by magnetic fields are rarely studied. In this paper, we present the design and construction of an atomic-resolution STM that can operate in a 9 T high magnetic field. More importantly, the homebuilt STM is capable of imaging micron-sized samples. The performance of the STM is demonstrated by high-quality atomic images obtained on a graphite surface, with low drift rates in the X\u2013Y plane and Z direction. The atomic-resolution image obtained on a 32-\u03bcm graphite flake illustrates the new STM\u2019s ability of positioning and imaging micron-sized samples. Finally, we present atomic resolution images at a magnetic field range from 0 T to 9 T. The above advantages make our STM a promising tool for investigating the quantum hall effect of micron-sized layered materials.<\/jats:p>","DOI":"10.3390\/mi14020287","type":"journal-article","created":{"date-parts":[[2023,1,25]],"date-time":"2023-01-25T03:21:54Z","timestamp":1674616914000},"page":"287","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["Atomic-Resolution Imaging of Micron-Sized Samples Realized by High Magnetic Field Scanning Tunneling Microscopy"],"prefix":"10.3390","volume":"14","author":[{"given":"Weixuan","family":"Li","sequence":"first","affiliation":[{"name":"College of Metrology and Measurement Engineering, China Jiliang University (CJLU), Hangzhou 310018, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jihao","family":"Wang","sequence":"additional","affiliation":[{"name":"Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"High Magnetic Field Laboratory of Anhui Province, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jing","family":"Zhang","sequence":"additional","affiliation":[{"name":"Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"High Magnetic Field Laboratory of Anhui Province, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wenjie","family":"Meng","sequence":"additional","affiliation":[{"name":"Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"High Magnetic Field Laboratory of Anhui Province, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Caihong","family":"Xie","sequence":"additional","affiliation":[{"name":"Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"High Magnetic Field Laboratory of Anhui Province, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6314-5598","authenticated-orcid":false,"given":"Yubin","family":"Hou","sequence":"additional","affiliation":[{"name":"Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"High Magnetic Field Laboratory of Anhui Province, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhigang","family":"Xia","sequence":"additional","affiliation":[{"name":"College of Metrology and Measurement Engineering, China Jiliang University (CJLU), Hangzhou 310018, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Qingyou","family":"Lu","sequence":"additional","affiliation":[{"name":"Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"High Magnetic Field Laboratory of Anhui Province, Chinese Academy of Sciences, Hefei 230031, China"},{"name":"Anhui Laboratory of Advanced Photon Science and Technology, University of Science and Technology of China, Hefei 230026, China"},{"name":"Hefei Science Center, Chinese Academy of Sciences, Hefei 230031, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2023,1,22]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"615","DOI":"10.1103\/RevModPhys.59.615","article-title":"Scanning tunneling microscopy\u2014From birth to adolescence","volume":"59","author":"Binnig","year":"1987","journal-title":"Rev. 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