{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,7]],"date-time":"2026-07-07T13:13:54Z","timestamp":1783430034626,"version":"3.54.6"},"reference-count":34,"publisher":"MDPI AG","issue":"6","license":[{"start":{"date-parts":[[2026,6,21]],"date-time":"2026-06-21T00:00:00Z","timestamp":1782000000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Micromachines"],"abstract":"<jats:p>This study investigates the reliability of power-terminal solder joints in intelligent power modules (IPMs) subjected to thermal cycling, random vibration, and packaging\/assembly-induced deformation. Fifty IPMs were tested under temperature cycling from \u221255 \u00b0C to 125 \u00b0C and random vibration from 20 to 2000 Hz, and the experimental observations were combined with finite element simulations of thermal, vibration, and deformation loads. The modules survived 200 temperature cycles in the free state, whereas functional abnormalities occurred after board-level assembly and subsequent environmental loading. Simulation results showed that random vibration produced limited solder-layer stress because the first structural mode was above the excitation range, while packaging and PCB deformation markedly increased the initial stress of the power-terminal solder joints. When local deformation reached approximately 0.5 mm, the calculated solder-pad stress reached or exceeded the shear-strength risk range, consistent with the failure tendency observed in highly deformed modules. Weibull analysis further indicated a fatigue-dominated failure process with an increasing failure rate. These findings suggest that deformation control, package stiffness improvement, and assembly flatness management are critical for improving the reliability of IPM power-terminal solder joints.<\/jats:p>","DOI":"10.3390\/mi17060749","type":"journal-article","created":{"date-parts":[[2026,7,7]],"date-time":"2026-07-07T12:06:43Z","timestamp":1783426003000},"page":"749","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Reliability Analysis and Optimization of Power Terminal Solder Joints in PPS-Packaged IPMs"],"prefix":"10.3390","volume":"17","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-0693-6008","authenticated-orcid":false,"given":"Jun","family":"Xu","sequence":"first","affiliation":[{"name":"School of Software Engineering, Xi\u2019an Jiaotong University, Xi\u2019an 710049, China"},{"name":"Xi\u2019an Microelectronics Technology Institute, Xi\u2019an 710065, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4936-0061","authenticated-orcid":false,"given":"Bin","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Software Engineering, Xi\u2019an Jiaotong University, Xi\u2019an 710049, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"1968","published-online":{"date-parts":[[2026,6,21]]},"reference":[{"key":"ref_1","unstructured":"(2020). 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